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DOI: 10.1039/C5AN90033F (Correction) Analyst, 2015, 140, 3290-3290

Correction: Testing and validating electroanalytical simulations

Enno Kätelhön and Richard G. Compton *
Department of Chemistry, Physical and Theoretical Chemistry Laboratory, University of Oxford, South Parks Road, Oxford, OX1 3QZ, UK. E-mail: richard.compton@chem.ox.ac.uk; Tel: +44 (0)1865275957

Received 26th March 2015 , Accepted 26th March 2015

First published on 31st March 2015

Abstract

Correction for ‘Testing and validating electroanalytical simulations’ by Enno Kätelhön and Richard G. Compton, Analyst, 2015, DOI: 10.1039/c4an02276a.

In eqn (15), we provide an expression for the voltammetric peak separation in a voltammogram recorded under Nernstian conditions and a 1[thin space (1/6-em)]:[thin space (1/6-em)]1 stoichiometry at a microdisk electrode:
 
image file: c5an90033f-t13.tif(15)
Following this equation it should say “…in the limit of fast scan rates, σ[thin space (1/6-em)]→[thin space (1/6-em)]∞, or in the large-electrode limit. In the σ[thin space (1/6-em)]→[thin space (1/6-em)]0 limit the voltammetric peaks disappear and ΔEpp is no longer helpful.”.

The Royal Society of Chemistry apologises for these errors and any consequent inconvenience to authors and readers.

This journal is © The Royal Society of Chemistry 2015
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