Issue 8, 2021

A wafer-scale synthesis of monolayer MoS2 and their field-effect transistors toward practical applications

Abstract

Molybdenum disulfide (MoS2) has attracted considerable research interest as a promising candidate for downscaling integrated electronics due to the special two-dimensional structure and unique physicochemical properties. However, it is still challenging to achieve large-area MoS2 monolayers with desired material quality and electrical properties to fulfill the requirement for practical applications. Recently, a variety of investigations have focused on wafer-scale monolayer MoS2 synthesis with high-quality. The 2D MoS2 field-effect transistor (MoS2-FET) array with different configurations utilizes the high-quality MoS2 film as channels and exhibits favorable performance. In this review, we illustrated the latest research advances in wafer-scale monolayer MoS2 synthesis by different methods, including Au-assisted exfoliation, CVD, thin film sulfurization, MOCVD, ALD, VLS method, and the thermolysis of thiosalts. Then, an overview of MoS2-FET developments was provided based on large-area MoS2 film with different device configurations and performances. The different applications of MoS2-FET in logic circuits, basic memory devices, and integrated photodetectors were also summarized. Lastly, we considered the perspective and challenges based on wafer-scale monolayer MoS2 synthesis and MoS2-FET for developing practical applications in next-generation integrated electronics and flexible optoelectronics.

Graphical abstract: A wafer-scale synthesis of monolayer MoS2 and their field-effect transistors toward practical applications

Article information

Article type
Review Article
Submitted
14 déc. 2020
Accepted
17 févr. 2021
First published
23 févr. 2021
This article is Open Access
Creative Commons BY-NC license

Nanoscale Adv., 2021,3, 2117-2138

A wafer-scale synthesis of monolayer MoS2 and their field-effect transistors toward practical applications

Y. Liu and F. Gu, Nanoscale Adv., 2021, 3, 2117 DOI: 10.1039/D0NA01043J

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