Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

Lei Yu; Mingyang Zhang; Haijian Chen; Bohuai Xiao; Shuai Chang

doi:10.1039/D2NR06074D

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Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique†

Lei Yu,

‡*^ab Mingyang Zhang,‡^ab Haijian Chen,^ab Bohuai Xiao^ab and Shuai Chang

*^ab

Author affiliations

* Corresponding authors

^a The State Key Laboratory of Refractories and Metallurgy, Wuhan University of Science and Technology, Wuhan, Hubei 430081, China
E-mail: schang23@wust.edu.cn, yuleiest@163.com

^b The Institute of Advanced Materials and Nanotechnology, Wuhan University of Science and Technology, Wuhan, Hubei 430081, China

Abstract

A hybrid technique combining atomic force microscopy and the fixed-junction technique is developed to simultaneously probe the electrical and mechanical characteristics of a single-molecule junction.

This article is part of the themed collection: Nanoscale 2023 Emerging Investigators

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Article information

DOI: https://doi.org/10.1039/D2NR06074D
Article type: Communication
Submitted: 31 oct. 2022
Accepted: 28 déc. 2022
First published: 12 janv. 2023

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Nanoscale, 2023,15, 4277-4281

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Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

L. Yu, M. Zhang, H. Chen, B. Xiao and S. Chang, Nanoscale, 2023, 15, 4277 DOI: 10.1039/D2NR06074D

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Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique†

Abstract

Supplementary files

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Measurements of single-molecule electromechanical properties based on atomic force microscopy fixed-junction technique

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