Issue 3, 2024

An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline

Abstract

Multimodal imaging and spectroscopy like concurrent scanning transmission X-ray microscopy (STXM) and X-ray fluorescence (XRF) are highly desirable as they allow retrieving complementary information. This paper reports on the design, development, integration and field testing of a novel in situ atomic force microscopy (AFM) instrument for operation under high vacuum in a synchrotron soft X-ray microscopy STXM–XRF end-station. A combination of μXRF and AFM is demonstrated for the first time in the soft X-ray regime, with an outlook for the full XRF–STXM–AFM combination.

Graphical abstract: An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline

Article information

Article type
Communication
Submitted
07 Aug 2023
Accepted
23 Nov 2023
First published
23 Nov 2023
This article is Open Access
Creative Commons BY-NC license

Analyst, 2024,149, 700-706

An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline

A. Hafner, L. Costa, G. Kourousias, V. Bonanni, M. Žižić, A. Stolfa, B. Bazi, L. Vincze and A. Gianoncelli, Analyst, 2024, 149, 700 DOI: 10.1039/D3AN01358H

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