Issue 21, 2025
From the journal:

Analyst

Correction: An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline

Aljoša Hafner,a   Luca Costa,b   George Kourousias,a   Valentina Bonanni,a   Milan Žižić,a   Andrea Stolfa,a   Benjamin Bazi,c   Laszlo Vinczec  and  Alessandra Gianoncelli*a  

* Corresponding authors

a Elettra Sincrotrone Trieste, SS 14 km 163, 5 in Area Science Park, 34149 Basovizza, Trieste, Italy
E-mail: alessandra.gianoncelli@elettra.eu

b Centre de Biochimie Structurale, CNRS UMR 5048 - UM - INSERM U 1054, 29 rue de Navacelles 34090 Montpellier, France

c Department of Chemistry, Ghent University, Krijgslaan 281, B-9000 Ghent, Belgium

Abstract

Correction for ‘An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline’ by Aljoša Hafner et al., Analyst, 2024, 149, 700–706, https://doi.org/10.1039/D3AN01358H.

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Article information

DOI
https://doi.org/10.1039/D5AN90066B
Article type
Correction
Submitted
16 Jul 2025
Accepted
16 Jul 2025
First published
10 Oct 2025
This article is Open Access
Creative Commons BY license

Analyst, 2025,150, 4905-4906

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Correction: An innovative in situ AFM system for a soft X-ray spectromicroscopy synchrotron beamline

A. Hafner, L. Costa, G. Kourousias, V. Bonanni, M. Žižić, A. Stolfa, B. Bazi, L. Vincze and A. Gianoncelli, Analyst, 2025, 150, 4905 DOI: 10.1039/D5AN90066B

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