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Issue 2, 2012
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High resolution quantitative piezoresponse force microscopy of BiFeO3 nanofibers with dramatically enhanced sensitivity

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Abstract

Piezoresponse force microscopy (PFM) has emerged as the tool of choice for characterizing piezoelectricity and ferroelectricity of low-dimensional nanostructures, yet quantitative analysis of such low-dimensional ferroelectrics is extremely challenging. In this communication, we report a dual frequency resonance tracking technique to probe nanocrystalline BiFeO3 nanofibers with substantially enhanced piezoresponse sensitivity, while simultaneously determining its piezoelectric coefficient quantitatively and correlating quality factor mappings with dissipative domain switching processes. This technique can be applied to probe the piezoelectricity and ferroelectricity of a wide range of low-dimensional nanostructures or materials with extremely small piezoelectric effects.

Graphical abstract: High resolution quantitative piezoresponse force microscopy of BiFeO3 nanofibers with dramatically enhanced sensitivity

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Article information


Submitted
14 Aug 2011
Accepted
26 Oct 2011
First published
21 Nov 2011

Nanoscale, 2012,4, 408-413
Article type
Communication

High resolution quantitative piezoresponse force microscopy of BiFeO3 nanofibers with dramatically enhanced sensitivity

S. Xie, A. Gannepalli, Q. N. Chen, Y. Liu, Y. Zhou, R. Proksch and J. Li, Nanoscale, 2012, 4, 408
DOI: 10.1039/C1NR11099C

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