Doped amorphous silicananoparticles as enhancing agents for surface-assisted time-of-flight mass spectrometry
Abstract
This article examines the use of doped amorphous
* Corresponding authors
a
School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore
E-mail:
alim@ntu.edu.sg
Fax: +65 6790 9081
Tel: +65 6513 8071
b Nanofrontier Pte Ltd, 50 Nanyang Drive, Research TechnoPlaza, Singapore
c Roar Particles plc, Netpark Incubator, Sedgefield, County Durham, UK
This article examines the use of doped amorphous
A. Y. Lim, F. Gu, Z. Ma, J. Ma and F. Rowell, Analyst, 2011, 136, 2775 DOI: 10.1039/C1AN15172J
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