Issue 23, 1984

The unusual structure of tungsten-doped electrochemically-grown alumina films detected by MeV ion scattering

Abstract

MeV Ion scatting has revealed a surprising periodic incorporation of residue in anodically-grown alumina films which may provide important ramification of the properties of these films.

Article information

Article type
Paper

J. Chem. Soc., Chem. Commun., 1984, 1560-1561

The unusual structure of tungsten-doped electrochemically-grown alumina films detected by MeV ion scattering

D. L. Cocke, S. M. Kormali, C. V. B. Leit, O. J. Murphy, E. A. Schweikert, P. Filpus-Luyckx, C. A. Polansky and D. E. Halverson, J. Chem. Soc., Chem. Commun., 1984, 1560 DOI: 10.1039/C39840001560

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