Open Access Article
A. G. Darwish
*a,
Mohamed I. Faroukb,
Mostafa I. Abdelglilc and
H. A. Abo-Mosallam*d
aDepartment of Microwave Physics and Dielectrics, Physics Research Institute, National Research Centre, 33 El-Buhouth St, Dokki, Cairo 12622, Egypt
bCollege of Engineering, Deanship of Scientific Research, Imam Mohammad Ibn Saud Islamic University (IMSIU), Riyadh 11432, Saudi Arabia
cColleges of Medical Technical, Al-Farahidi University, Baghdad 00964, Iraq
dGlass Research Department, National Research Centre, 33 El-Buhouth St, Dokki, Cairo 12622, Egypt. E-mail: abomosallamnrc@gmail.com; ha.ebrahim@nrc.sci.eg
First published on 7th April 2026
Glasses with the composition of (60 − X)CdO–XBi2O3–40SiO2 (X = 0, 7.5, 15, and 30 mol%) were synthesized by melt-quenching. Their physical properties and FTIR spectra confirmed that the network strength weakened with the increase in CdO substitution by Bi2O3. The incorporation of Bi2O3 disrupts Si–O–Si bonds, forming non-bridging oxygen atoms that increase the molar volume and reduce the packing density. Dielectric spectra (0.1 Hz–10 MHz and 30–150 °C) showed increased permittivity and dielectric loss with Bi2O3 addition, strong frequency/temperature dependence, and thermally activated mid-frequency relaxations. The AC conductivity increased with the frequency: gradually (0.1–10 Hz), moderately (10 Hz–100 kHz), and sharply (1–10 MHz). The permittivity ranges are 18–27 (X = 0), 17–45 (X = 7.5), 17–55 (X = 15), and 24–65 (X = 30), with maxima at 0.1 Hz and over a temperature range of 30–150 °C. Doped samples exhibited conductivity shoulders coinciding with loss peaks. Mechanical moduli and microhardness decreased with Bi2O3 addition, confirming network softening. These glasses combined high dielectric performance and thermal stability, with potential for reprocessing, making them suitable for power-electronics components used in applications such as electric mobility, solar inverters, and wind-turbine converters.
Glasses are mostly synthesized by a melt-quenching method. Oxide glasses are classified according to their network-forming oxides, with silicate, borate, and phosphate systems being the most widely studied. Silicon oxide (SiO2) is a primary glass former that builds the main network structure, providing good chemical and thermal resistance.9,10 Silicate-based glasses stand out among all vitreous materials due to their remarkable capacitive and energy-storage capabilities, particularly in capacitor applications.11,12 Silicate glasses make good base materials because they are mechanically stable and transparent but have low permittivity. Adding CdO introduces heavy polarizable ions that raise permittivity, but the resulting network remains relatively rigid, which constrains dipolar relaxation. The addition of various elements to the glass network, such as transition-metal oxides (TMs) and heavy metals (HMOs), improves the properties and stability of the glass. Among the many appealing qualities of cadmium oxide (CdO) are its high molecular weight and density, strong polarizability and transparency, as well as high thermal stability. When CdO is added to glass networks, amorphous materials are created that can be used in a variety of applications, including in solar panels and batteries.13,14 CdO functions as a network intermediate in these systems, contributing to electronic polarizability while also introducing non-bridging oxygens (NBOs) that enhance ionic polarizability and mobility. The electronic contribution improves the optical absorption and dielectric response, which are advantageous for photovoltaic applications, whereas NBO-facilitated ionic transport supports charge conduction in energy storage systems. Additionally, Cd2+ incorporation can introduce localized defect states within the glass network, influencing conductivity without requiring band-like transport as in crystalline materials. Cadmium oxide (CdO) acts as an intermediate in the glass network; it may take part in the glass network's building formers (CdO4 units) and/or act as a modifier of the glass structure (CdO6 units). The role of CdO in the glass network depends on its concentration and the overall glass composition.15,16 Furthermore, the presence of cadmium in the glass network enhances the physical, chemical, and optical properties of the synthesized glass.15,16 Because of their many superior physical and optical qualities, glasses containing heavy metal oxides (HMOs) such as Bi2O3 are ideal for cutting-edge applications in devices like fiber optics, fiber lasers, oscillators, and amplifiers.17,18 Additionally, bismuth silicate glasses are becoming more and more popular in a variety of optical and electrical applications.18 Bismuth structural behavior in non-crystalline materials is complicated since it differs from the usual purpose of glass making. The incorporation of Bi3+ions into the glass network introduces BiO3 pyramidal structural units and [BiO5/BiO6] polyhedral units, facilitated by the high polarizability and large ionic radius of bismuth.19 Glass-based dielectrics are important for power electronics because they can operate at high temperatures where many polymers fail. Glass materials can be recycled and re-melted, which supports long-term sustainability goals in electronics manufacturing. Heavy metal-containing glasses are still investigated because they offer strong dielectric performance that is useful for demanding applications, even though environmental concerns require future mitigation or substitution.
Glass and ceramic materials were among the first to be used in commercial electronic applications, particularly in low-dielectric components. The non-crystalline substances with a great concentration of alkalis and heavy metal ions are members of the fast ionic conductivity (FIC) family of materials.20 Thus, it is important to investigate ionic mobility in glass structures and to explore novel glass materials for use as potential electrode and electrolyte materials. The dielectric properties of glass materials are reflected in the movement of ions in the glass structure, ion hopping from low-energy to high-energy sites, and electron hopping between ions of multivalent elements.21,22 The dielectric characteristics of bismuth-containing glass and impedance spectroscopy revealed that a dipolar relaxation effect caused by an increase in the concentration of Bi2O3 in the host glass causes a consistent drop in the frequency-dependent conductivity of these glasses.23 A lot of work has been done to understand the electrical and structural properties of Bi2O3-based glasses. Many studies investigated the impact of Bi2O3 addition as a glass former or modifier on the dielectric behavior and polarization mechanisms.23–26 Bi2O3 (bismuth oxide) addition to glass systems can alter their dielectric characteristics, and its influence is governed by several factors such as glass composition and present oxide components. Bi2O3 addition to K2O–TiO2–P2O5 glass systems leads to increased dielectric constant and decreased dielectric loss, with a favorable impact on permittivity.25 Dielectric dispersion at low frequency is decreased by Bi2O3 addition, with better dielectric stability in frequency ranges. Li2O– Bi2O3–TeO2–Ag glasses exhibit nonlinear conductivity and dielectric response with Bi2O3 composition, reflecting initial loss with subsequent improvement in dielectric constant with the increase in Bi2O3 content, with implications of compositional complexities.27 In Na2O–CuO–SiO2, Li2O–Bi2O3–B2O3–As2O3 glass systems, higher Bi2O3 content reduces AC conductivity. This is because Bi2O3 promotes network polymerization and its electronegative nature suppresses ionic movement. The electrical characteristics of bismuth silicate glasses were examined by Kusz et al.,28 who found that the conductivity of the prepared materials results from a single ionic process, and is dependent on the mobility path of Bi3+ ions. Bi2O3 plays a more intricate and poorly understood structural role in oxide glasses. This is because the presence of lone-pair electrons causes the [BiOn] polyhedra to be extremely deformed. There are few reports on the dielectric properties of cadmium-silicate glasses, and even fewer studies that discuss the effect of bismuth oxide on the dielectric properties of such glass systems. There are still a lot of unresolved issues about the structure and conductivity mechanism of glass materials. Therefore, the goal of the present research is to create new Bi2O3-containing glasses based on the composition of (60 − X)CdO–XBi2O3–40SiO2 (where X = 0, 7.5, 15 and 30 mol%) and to investigate the influence of Bi2O3 on the structural, physical, and mechanical properties and the dielectric measurements of permittivity, dielectric loss, and AC conductivity from 0.1 Hz to 10 MHz at 30 °C–150 °C. The study also aims to correlate the structural and mechanical changes with the observed dielectric behavior.
| Sample ID | Composition (mol%) | Melting temperature (°C) | ||
|---|---|---|---|---|
| CdO | Bi2O3 | SiO2 | ||
| CSB0 | 60 | 0.0 | 40 | 1375 |
| CSB7.5 | 52.5 | 7.5 | 40 | 1325 |
| CSB15 | 45 | 15 | 40 | 1300 |
| CSB30 | 30 | 30 | 40 | 1250 |
![]() | (1) |
| Vm = Mwt/ρ | (2) |
| OPD = 1000T/Vm | (3) |
| VO = Vm/(∑xini) | (4) |
![]() | (5) |
![]() | (6) |
The packing density factor (Vi) and the dissociation energy per unit volume of the supplied glass system oxides (Gi) are represented by these variables.33–35 The samples' elastic modulus was designed to theoretically extend the Makishima–McKenzie model.36,37 The following formulae are used to measure the elastic parameters:36,37
| E = 2VtGt | (7) |
| B = 1.2VtE | (8) |
| S = 3EB/(9B − E) | (9) |
![]() | (10) |
| σ = 0.5 − (1/7.2Vt) | (11) |
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| Fig. 1 XRD patterns of the Bi2O3 modified CdO–SiO2 glass samples CSB0 (Bi2O3-free) and CSB30 (with 30 mol% Bi2O3). | ||
The presence of a typical “halo” pattern at 20° ≤ 2θ ≤ 30° without any prominent peaks in the XRD measurements throughout a range of 10°–80° proved the samples' amorphous nature. The absence of distinct peaks confirms that the prepared samples are amorphous or non-crystalline materials.7,38 Information obtained from prepared materials, such as physical properties, is an important foundation upon which their possible use in numerous technological applications is based. Measurements of density (ρ), molar volume (Vm), oxygen packing density (OPD), and oxygen molar volume (VO) were used to examine the basic physical characteristics of the synthesized glass materials. The ρ and Vm variations of the synthesized samples are presented in Fig. 2. The results show that the substitution of cadmium oxide by Bi2O3 increases the density of the non-crystalline materials. The density of CSB30 is found to be 6.45 g.cm−3, which is higher than the density obtained for base glass CSB0 (5.73 g.cm−3). The density increases due to the substitution of the CdO compound (molar mass of 128.4112 g mol−1) with the Bi2O3 oxide (molar mass of 465.96 g mol−1), leading to an increased molecular mass (M) of the samples.39 The connection between the density and the molar volume is mostly inverse. However, in certain cases, the relationship is directly related under special conditions.
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| Fig. 2 Densities (ρ) and molar volumes (Vm) of the Bi2O3-modified CdO–SiO2 glass samples vs. the Bi2O3 level. | ||
Fig. 2 shows that Vm rises in conjunction with the inclusion of Bi2O3 instead of CdO from 17.64 cm3 mol−1 for the Bi2O3-free sample to 30.42 cm3 mol−1 for the sample that has a lot of bismuth (30 mol%). The increases in molar volume reflect the formation of BiO3 pyramids and BiO6 octahedra.40,41 The integration of Bi3+ ions into the glass network through Bi–O–Si and Bi–O–Bi linkages indicates the growth of the glass structure.40,41 The increase in Vm with substitution reinforces the fact that the addition of Bi2O3 reduces the cohesion and compactness of the glass structure.36,42 The data in Fig. 3 indicate a decrease in OPD and an increase in VO as the concentrations of Bi2O3 increase. The OPD of the glass samples varied between 79.363 and 65.729 mol cm−3, and the VO values varied from 12.60 to 15.21 cm3 mol−1. The decrease in the OPD and the increase in volume with increasing Bi2O3 concentration indicate that a higher non-bridging oxygen content leads to bond lengthening and reduced network compactness, weakening the glass network strength. These structural changes in molar volume, oxygen packing density, and network compactness are further reflected in the mechanical properties and dielectric responses discussed in the following sections.
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| Fig. 4 FTIR absorbance spectra of all four Bi2O3-modified CdO–SiO2 glass samples (a) and deconvoluted FTIR spectrum of glass samples: CSB0 (b) and CSB30 (c). | ||
The absorption at 927 cm−1 is attributed to the Si–O asymmetric stretching vibrations in Q2 structural units containing two non-bridging oxygens per SiO4 tetrahedron. The band at 870 cm−1 is consistent with NBO-related Si–O vibrations in modifier-affected silicate environments.45,46 The νs(Si–O–Si) bending vibration is responsible for the weak absorption band that is displaced from 765 cm−1. The wide absorption band centered at about 439 cm−1 can be attributed to the δ(O–Si–O) bending vibration mode.47 From the infrared results studied, a difference was found in the strength of the band between 700 and 1200 cm−1, especially at the peak of 857 cm−1, with a decrease in the intensity of the band between 400 and 600 cm−1 with the inclusion of bismuth instead of cadmium. This band evolution indicates BiO6 octahedral formation and Si–O–Si bond disruption, which would weaken the strength of the glass network. The 860–880 cm−1 enhancements indicate BiO3 pyramidal units, reducing cross-link density and rigidity of the glass.18,36,48 Tetrahedral coordinated oxygen (SiO4) can change into three-coordinated non-bridging oxygen (NBO) species (Q3) when bismuth oxide (Bi2O3) is added. This change creates oxygen vacancies, reducing structural coherence.
The deconvoluted FTIR spectra for CSB0 and CSB30 are presented in Fig. 4b and c. For CSB0, deconvolution yields seven components at 1028, 927, 870, 765, 672, 484, and 439 cm−1. The band at 1028 cm−1 is assigned to the Si–O–Si asymmetric stretching vibrations associated with bridging oxygen environments in the silicate network. The band at 927 cm−1 is attributed to the Si–O stretching vibrations in Q2 structural units containing two non-bridging oxygens per SiO4 tetrahedron. The band at 870 cm−1 is consistent with NBO-related Si–O vibrations in modifier-affected silicate environments. The band at 765 cm−1 corresponds to the νs(Si–O–Si) bending vibrations. The bands at 672 and 484 cm−1 are assigned to Cd–O vibrations, while the band at 439 cm−1 is attributed to δ(O–Si–O) bending. In CSB30, the components appear at 1041, 946, 857, 672, 606, and 462 cm−1. The shift of the 1028 cm−1 band to 1041 cm−1 suggests changes in the Si–O bond environment associated with network modification. The shift of the 927 cm−1 band to 946 cm−1, together with the enhanced intensity in the NBO-related region, suggests an increased fraction of non-bridging oxygens as Bi2O3 replaces CdO. The dominant band at 857 cm−1 is consistent with Bi–O vibrations commonly associated with BiO3 pyramidal units in bismuth-containing glasses. The new band at 606 cm−1 can be attributed to the Bi–O stretching vibrations reported for octahedral coordinated Bi environments. These spectral features suggest that Bi3+ ions are incorporated into the glass network through Bi–O structural units consistent with BiO3 and BiO6 configurations rather than acting solely as interstitial modifiers. The low-frequency band shifts from 439 cm−1 in CSB0 to 462 cm−1 in CSB30 reflect changes in the Si–O bending environment accompanying structural rearrangement of the glass network. This progressive increase in the non-bridging oxygen content is independently supported by the observed rise in molar volume from 17.64 to 30.42 cm3 mol−1, the decrease in oxygen packing density from 79.363 to 65.729 mol cm−3, and the reduction in elastic moduli and microhardness, collectively indicating progressive network depolymerization that governs the dielectric and electrical response of the glasses.
| Sample ID | Poisson's ratio (σ) | Atomic packing density (Vt) | Dislocation energy (Gi) | Elastic moduli parameters (GPa) | Experimental microhardness HV (GPa) | |||
|---|---|---|---|---|---|---|---|---|
| E | S | L | B | |||||
| CSB0 | 0.27967 | 0.630374 | 47.12 | 59.406 | 23.212 | 75.887 | 44.938 | 5.86 |
| CSB7.5 | 0.26807 | 0.59884 | 47.01 | 56.291 | 22.196 | 70.060 | 40.451 | 5.13 |
| CSB15 | 0.25467 | 0.566141 | 46.88 | 53.081 | 21.153 | 64.266 | 36.062 | 4.50 |
| CSB30 | 0.23897 | 0.532081 | 46.64 | 49.633 | 20.030 | 58.397 | 31.690 | 3.87 |
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| Fig. 5 Estimated mechanical characteristics, including the longitudinal (L), bulk (B), shear (s), and Young's (E) moduli, vs. the Bi2O3 level. | ||
The relationship between the atomic packing density and the Poisson ratio is depicted in Fig. 6, according to Bi2O3 and CdO contents. The findings revealed a decrease in both the atomic packing density and the Poisson ratio with CdO substitution by Bi2O3 and an increase in molar volume, which confirms the precision of the mechanical parameter computations. The Poisson ratio and the atomic packing density are directly related.53 There was greater room for atom movement as a result of the reduction in both the Poisson ratio and the atomic packing density, and transverse strain could be minimal.44
Micro-hardness is an essential mechanical property that manufactured materials must possess since it significantly affects the choice of appropriate technological applications. The experimental Vickers micro-hardness (Hv) values and Poisson's ratio (σ) of the prepared glass specimens as a function of Bi2O3/CdO is shown in Fig. 7. When the values fall between 0.3 and 0.5, σ shows low resistance to lateral expansion; when the values fall between 0.1 and 0.2, the resistance is stronger. High and low real cross-link densities are associated with low and high resistances to lateral expansion, respectively.54 Increased NBO formation reduces network stiffness, decreasing Hv and σ.36,38 According to Fig. 7, the microhardness of samples presents a linear trend decreasing with the progress of CdO substitution by Bi2O3. The decrement in Hv from 5.86 to 3.87 GPa with the increase in Bi2O3 attributed to the creation of NBO and the formation of BiO3 groups to decrease the toughness of the network. The decrease in H and σ indicates increased formation of non-bridging oxygens, resulting in a less rigid and more weakly connected glass network. This reduction in mechanical stiffness is consistent with the FTIR-based evidence for increased non-bridging oxygen content and BiO3 unit formation, as well as the rise in molar volume and decrease in oxygen packing density observed with the increase in Bi2O3 content.
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| Fig. 7 Variation of Vickers micro-hardness (Hv) and Poisson's ratio (σ) of the prepared glass specimens as a function of Bi2O3 content. | ||
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| Fig. 8 Dielectric permittivity vs. frequency the for Bi2O3-modified CdO–SiO2 glasses, at temperatures between 30 and 150 °C with a step of 20 °C as indicated. | ||
CSB15 shows further permittivity increase (17–55), particularly at low frequency, with strong frequency dependence, especially at high temperatures. ε′ goes down from ∼5 at 0.1 Hz to ∼23 at 10 MHz at 150 °C. ε′ goes down from ∼35 at 0.1 Hz to ∼17 at 10 MHz at 30 °C. Fast relaxation behavior can take the form of sharp drops in ε′ at mid-frequencies. When the temperature goes higher, relaxation moves to a higher frequency. At high frequency (>1 MHz), all temperature curves are approximately close to 17–21. CSB30 exhibits the highest permittivity (24–65). The maximum ε′ at 0.1 Hz and 150 °C is ∼65, the highest in all the compositions. ε′ is close to 36 at 0.1 Hz and 30 °C. It also has high temperature and frequency dependence along with the well-defined relaxation behavior much like CSB15 but with a higher magnitude.
The curves for the various temperatures are well resolved from each other at all high-frequency situations. ε′ varies between ∼24 (30 °C) and 30 (150 °C) at 10 MHz. An increase in the concentration of Bi2O3 gradually leads to an increase in the dielectric permittivity.55 The maximum ε′ at 0.1 Hz and 150 °C has the following order: CSB0 (∼27) < CSB7.5 (∼45) < CSB15 (∼55) < CSB30 (∼65). The dielectric relaxation enhances with the increase in the concentration of Bi2O3. Dielectric permittivity becomes more dependent on temperature with an increasing ratio of Bi2O3 in the material. The temperature effect gets higher for the increasing concentration of Bi2O3, and its effect is highly noticed at low frequencies, which vanishes at high frequencies. With increasing frequency, ε′ decreases for all compositions, and the extent of dispersion becomes more pronounced as the Bi2O3 content increases. With increasing temperature, the relaxation region, marked by the sharp decrease in ε′, shifts toward higher frequencies, with the main dispersion occurring in the 10–105 Hz range depending on composition. CSB7.5 shows an almost plateau-like behavior at very low frequencies (0.1–10 Hz), more prominent in the higher temperature curves (100–150 °C). At 150 °C, ε′ is in the range of 44–45 between 0.1 and 1 Hz before it starts decreasing more steeply. A similar near-saturation type of behavior in CSB15 is observed at low frequencies where ε′ is around 53–55 between 0.1 and 1 Hz at 150 °C. At frequency values above 10 Hz, the permittivity has a well-defined and rather steep decline. The effect gets augmented by increasing both the temperature and the concentration of Bi2O3.
At frequency values above 10 Hz, the permittivity has a well-defined and rather steep decline, which suggests some specific mechanisms of polarization becoming operative at the involved frequency. SiO2 has low polarizability (ε′ ≈ 3.9). CdO introduces highly polarizable heavy ions, resulting in ε′ values in the range of approximately 18–27 for the CSB0 composition. The closed-shell 4d10 configuration of Cd2+ ions enhance electronic polarizability, while its role as a network modifier promotes the formation of non-bridging oxygens (NBOs) that enable ionic displacement under an applied field. However, the relatively intact silicate network in CSB0 limits NBO formation, and hence, the response remains largely dominated by electronic polarization, as reflected by the weak frequency and temperature dependence above ∼100 Hz. CSB0 therefore represents a baseline electronic polarization response against which the effects of Bi2O3 addition can be evaluated. CSB0 shows little change with temperature or frequency. Above 100 Hz, ε′ approaches a constant value as the response becomes dominated by electronic polarization. Adding 7.5 mol% Bi2O3 increases ε′ to 17–45. Bi–O units and non-bridging oxygens boost space-charge polarization.25,55 At 100–150 °C, ε′ drops in steps between 102 and 105 Hz. A low-frequency plateau appears at 0.1–1 Hz and 150 °C. Temperature curves separate more with Bi2O3, showing stronger thermal activation. CSB15 reaches an ε′ value of 17–55. More BiO3/BiO6 units enhance the local dipolar polarizability within the glass network.25,56 Mid-frequency drops shift to higher frequencies as the temperature increases. All curves converge to similar ε′ values (17–21) above 1 MHz, consistent with high-frequency polarization dominated by intrinsic electronic contributions.57 All compositions (CSB0–CSB15) converge to similar ε′ values (≈17–21) above 1 MHz, consistent with the dominance of intrinsic electronic polarization associated with Cd2+ within the Si–O and Cd–O bonding framework. At a higher Bi2O3 content (CSB30), the increased concentration of Bi3+ ions with 6 s2 lone-pair electrons provides additional electronic polarizability, leading to a noticeable rise in the high-frequency ε′ (≈23–30). This behavior suggests that heavy cations with ns2 electronic configurations can further enhance the electronic component of the dielectric response. CSB30 has the highest ε′ of 24–65. Relaxation shifts to a higher frequency with more Bi2O3 and higher temperatures. ε′ always falls as the frequency increases. The high-frequency ε′ remains nearly constant at ∼18 for samples with up to 20 mol% Bi2O3, then increases in CSB30, because at these frequencies the dielectric response is dominated mainly by electronic polarization. Up to 20 mol% Bi2O3, adding Bi causes network expansion but does not change the core electronic polarizability much. The Si–O and Cd–O bonds still dominate the response at >1 MHz, holding ε′ near 18. At 30 mol% Bi2O3, the concentration of Bi3+ ions with their 6 s2 lone pairs becomes high enough to boost the electronic polarizability of the glass.48,49 These Bi–O units add extra polarizable electrons that can follow the high-frequency field, increasing ε′ to about 23.
Network expansion from CdO substitution by Bi2O3 increases the molar volume and lowers the packing density. More free volume means that the oxygen ions can shift more under a field. The extra motion boosts low-frequency ε′ because dipoles and space charge polarize easily. FTIR spectra show the growing non-bridging oxygen (NBO) content as the Bi2O3 content rises. Each NBO breaks a Si–O–Si bond and creates a more polarizable site. More NBOs correlate with higher ε′ at low and mid-frequencies, since those oxygens can reorient or trap charges in slower fields. Mechanical moduli drop (E, B, S, and L) and hardness falls with Bi2O3 addition. This means that the network becomes softer with a lower restoring force, which indicates a possible increment of dipolar polarization at low frequencies.48,56 Weaker networks allow dipoles to follow fields more before high frequencies.
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| Fig. 9 AC conductivity (σ′) vs. frequency for the Bi2O3-modified CdO–SiO2 glasses at temperatures between 30 and 150 °C with a step of 20 °C as indicated. | ||
The conductivity increases monotonically with frequency in three regions. From 0.1 Hz to 10 Hz, the slope is gentle. From 10 Hz to 100 kHz, the slope becomes moderate with higher Bi2O3 contents and higher temperatures. From 1 MHz to 10 MHz, the slope is steep and all temperatures converge. A semi-peak feature appears in all doped samples and has two shifts: one to higher frequencies as the temperature rises and another to lower frequencies as the Bi2O3 content increases. Slope steepness in the mid-frequency region increases with the Bi2O3 content: CSB0 is the shallowest, and CSB30 is the steepest. At any fixed frequency, conductivity always rises with temperature. The separation between the 30 °C and 150 °C curves is small at low frequencies (except for CSB0 at its highest temperatures) and largest in the frequency range of 100 Hz to 1 MHz. Above 1 MHz, the temperature dependence weakens slightly as electronic polarization takes over.
CSB0 glass network is tight and has few non-bridging oxygens. At low frequencies below 1 Hz, the conductivity keeps rising until 130 °C and 150 °C, where it flattens into a DC-like plateau. The FTIR spectrum shows strong Si–O–Si bands; this indicates a well-connected silicate network. This leads to fewer non-bridging oxygens (NBOs) and limited dipolar or ionic polarization mechanisms. The CSB0 glass network is relatively compact and contains a limited concentration of non-bridging oxygens. Although CdO contributes to both electronic and ionic polarization mechanisms, the ionic component remains limited in CSB0 due to restricted NBO formation and the relatively high network rigidity, consistent with the measured elastic moduli and hardness. As a result, electronic polarization associated with Cd2+ dominates the dielectric response, while significant ionic conduction emerges only at elevated temperatures (≥130 °C), where thermal activation facilitates charge carrier mobility. This also explains the smooth, gradual temperature behavior permittivity (ε′) that also lacks sharp features. The same structural tightness also constrains low-frequency conductivity (σ′) at lower temperatures, since fewer free carriers and lower hopping likelihood exist with a tighter potential landscape. With the increase in temperature, the thermal energy allows charge carriers to cross the strong network constraint, facilitating hopping through the rigid structure. That is, when σ′ rises more steeply, ε′ will begin to exhibit deviations (particularly, at low frequencies) due to space charge or interfacial polarization. The lack of NBO-related signatures in the FTIR spectrum corroborates the late onset of dispersion in conductivity, and this implies that AC conductivity remains flat (DC regime) until the onset of sufficient ion mobility or polaron hopping at a later temperature. CSB0's elastic moduli and hardness are high, so carriers need T ≥ 130 °C to reach constant low-frequency conductivity. CSB0 has no mid-frequency shoulder in σ′, as the permittivity shows no sharp drop in that range. At a high frequency above 1 MHz, all show near-ε′ values and rise steeply, as only electronic polarization remains. CSB7.5 adds non-bridging oxygens and Bi2O3 units. FTIR shows emerging Bi2O3 bands, so permittivity drops slightly in the 100 Hz–100 kHz range. In conductivity, a mild shoulder appears around 1 kHz, matching the permittivity relaxation. The molar volume is higher and the oxygen packing density is lower than those of CSB0, so the network is slightly softer. Elastic moduli and hardness drop a little, letting carriers move at lower frequencies. Conductivity rises earlier with the frequency but never flattens to a plateau down to 0.1 Hz. The mid-frequency slope is steeper than that of CSB0, matching the permittivity relaxation. High-frequency behavior again converges for all temperatures near the same value. CSB15 further increases non-bridging oxygens and BiO6 groups. Permittivity has a clearer step in the 100 Hz–100 KHz band. Conductivity shows a more pronounced shoulder matching that and shifts to higher frequencies with the increase in temperature. The molar volume is larger and the oxygen packing density is lower, providing more free volume. Elastic moduli and hardness drop more, and hence, the carriers move more easily. At a high frequency above 1 MHz, all curves merge near the same value, reflecting electronic polarization.
CSB30 has the most non-bridging oxygens, the largest molar volume, and the lowest oxygen packing density. The FTIR spectrum shows dominant BiO3/BiO6 features and weak Si–O–Si bands, so permittivity peaks around 65 at low frequency and drops broadly in the 100 Hz–100 kHz range. Conductivity shows a strong shoulder. The network is very soft, with the lowest elastic moduli and hardness, so ion motion is easiest. The mid-frequency slope in σ′ is the steepest of all samples. At a high frequency above 1 MHz, curves converge near the same value, as only electronic polarization persists.
In all doped samples, the peak or shoulder feature shifts to a higher frequency, while the spread starting point shifts to lower values with the Bi2O3 content. This behavior reflects a combined effect of network modification and carrier dynamics due to the increase in Bi2O3 content. It can be explained as follows.
Adding Bi2O3 breaks some Si–O–Si bonds and creates many non-bridging oxygens. This makes the network more disordered and gives ions a lot of different local sites. Some of those sites are still tight and force ions to move very slowly. Those slow sites start to conduct at low frequencies, so the low-frequency end of the conductivity curve moves downward. At the same time, other Bi-related sites are weak and let ions move faster. Those fast sites push the main relaxation peak to higher frequencies. With the increase in Bi2O3 content, the molar volume increases and the packing density decreases, which facilitates ion movement. This extra free volume means that some ions can respond even under very slow fields, extending the low-frequency side of the curve. As the Bi content goes up, the number of both slow and fast sites grows. This stretches the conductivity response, so the onset of dispersion shifts to a lower frequency and the peak shifts to a higher frequency. This implies that the system is more polarizable and more conductive in a broader window of frequencies. The broadening in the distribution of relaxation times produces more stretched dispersion. It also suggests that charge carriers in Bi-rich compositions experience less localized constraints and more site availability; hence, the full conductivity profile stretches—onset comes earlier, and the relaxation peak comes sooner in the frequency scale.
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| Fig. 10 Dielectric loss vs. frequency for the Bi2O3-modified SiO2–CdO glasses at temperatures between 30 and 150 °C with a step of 20 °C as indicated. | ||
CSB0 shows a smooth, monotonic ε″ decay from a low frequency to a high frequency with minor peaks at a low frequency that mirrors its permittivity dispersions at low frequencies and high temperatures. CSB0's lack of a mid-frequency peak indicates that there are no Bi-induced dipolar relaxations. The steady drop indicates that loss mechanisms in CSB0 are dominated by slow space-charge or ionic contributions at a low frequency, transitioning directly into electronic/atomic polarization at a high frequency, without any distinct dipolar relaxation. In CSB7.5, the shoulder near 1 kHz comes from dipoles associated with Bi2O3 or non-bridging oxygens that need a moderate field rate to respond. The shift of this peak to around 100 kHz at 150 °C shows that those dipoles move faster when heated. The increase in CSB7.5's peak height as the temperature changes indicates that more dipoles engage at a higher temperature. In CSB15, the competing dynamics merge into a broader peak than noticed in CSB7.5, and the dipolar relaxation prevails. Its shift to about 4.5 kHz at 150 °C shows that Bi-related dipoles require less time to respond when heated. The wider two-decade span of the CSB15 peak reflects a broader range of Bi-site environments compared to CSB7.5. CSB30's broad peak spanning roughly 100 Hz to 10 kHz indicates the most extensive non-bridging oxygen and Bi–O network, producing multiple overlapping relaxations. The rise in CSB30's peak height shows that it has the largest dipolar polarizability of the four samples. More varied relaxation sites are produced as the content of Bi2O3 rises, moving mid-frequency peaks to higher frequencies and broadening them. The shift of about one decade per 120 °C rise in peak frequency for Bi-doped samples suggests an Arrhenius-type thermal activation of dipoles. At frequencies greater than 1 MHz, the same values are approached by all the samples, leaving only electronic or atomic polarization behind. CSB0's monotonic ε″ decline highlights its strong Si–O–Si network with few non-bridging oxygens for mid-frequency relaxation. Every increase in Bi2O3 alters the loss spectrum from smooth decay (CSB0) towards sharp, heat-shifting peaks (CSB7.5, CSB15, and CSB30). The peak breadth grows with the Bi content, reflecting a wider distribution of relaxation times linked to varied Bi or non-bridging oxygen environments.
The progressive broadening of the dielectric loss peaks and their shift to higher frequencies with the increase in Bi2O3 content can be directly correlated with the structural changes identified by FTIR spectroscopy and physical measurements. The coexistence of Bi–O structural environments consistent with BiO3- and BiO6-like units introduces dipolar sites with different local bonding symmetries and field strengths. BiO3-type units, characterized by more asymmetric coordination, are associated with stronger local field distortions and relatively long relaxation times, contributing predominantly at lower frequencies. In contrast, BiO6-like environments, with a higher symmetry, are associated with shorter relaxation times and contribute at higher frequencies. At low Bi2O3 content, these distinct local environments are sufficiently differentiated to produce separable or weakly resolved relaxation peaks, as observed for CSB7.5. With the increase in Bi2O3 content, the growing structural disorder and diversity of Bi-related sites lead to a broader, more continuous distribution of relaxation times, resulting in the merging of these features into a single broad loss peak spanning multiple frequency decades, as observed for CSB30. The shift of relaxation peaks to higher frequencies with both increasing temperature and Bi2O3 content reflects a progressive reduction in the potential barrier for dipolar hopping and reorientation. The increase in non-bridging oxygen concentration weakens the network connectivity and reduces the restoring forces acting on dipolar units, effectively lowering the depth of the local potential wells. The reduction in network rigidity lowers the energy barrier for dipolar motion, enabling faster reorientation and shifting relaxation to higher frequencies at a given temperature.
In each Bi-doped sample, the σ′ shoulder or semi-peak lines up with the ε″ peak at the same frequency and temperature. For CSB7.5, the σ′ feature appears around 1 kHz at 30 °C and shifts to about 10 kHz at 150 °C, and ε″ also peaks near 1 kHz at 30 °C and near 10 kHz at 150 °C. In CSB15, the σ′ shoulder shows up around 500 Hz at 30 °C and moves to ∼5 kHz at 150 °C, matching the ε″ peak that rises near 500 Hz at 30 °C and near 5 kHz at 150 °C. CSB30's σ′ semi-peak spans ∼500 Hz at 30 °C to ∼10 kHz at 150 °C, and ε″ also peaks broadly in that same range under the same conditions. In contrast, CSB0 shows a smooth decrease in ε″ without a mid-frequency peak, and σ′ increases steadily without exhibiting a shoulder. In other words, whenever ε″ has a clear peak in a Bi-doped glass, σ′ shows a corresponding feature at the same frequency, and CSB0 lacks both.
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