Open Access Article
This Open Access Article is licensed under a Creative Commons Attribution-Non Commercial 3.0 Unported Licence

Defect Engineering and Hydrogen-Induced Reversibility in Metallic States of MoS2 Grain Boundaries

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Hangbo Zhou , Viacheslav Sorkin , Zhi Gen Yu , Kah-Wee Ang and Yong-Wei Zhang

Received 27th May 2025 , Accepted 14th August 2025

First published on 14th August 2025


Abstract

One-dimensional metallic states along grain boundaries (GBs) in two-dimensional (2D) semiconducting materials offer unique opportunities for electronic and quantum device applications. However, the stability and tunability of these metallic states remain poorly understood. Here, we systematically investigate how point defects and hydrogenation affect the electronic properties of representative GBs in monolayer MoS2 using density functional theory. We identify two classes of GBs based on their symmetry response to point defects: defect-sensitive boundaries, which lose metallicity due to symmetry breaking, and defect-robust boundaries, which preserve metallic conduction owing to symmetry retention. Remarkably, hydrogenation can reverse the effects of point defects—restoring metallicity in defect-sensitive GBs and opening band gaps in defect-robust ones. These findings reveal a reversible and controllable mechanism for tuning grain boundary conduction through defect engineering and chemical functionalization, offering new pathways for nanoscale interconnects and reconfigurable 2D electronic devices.


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