Jacklyn A. DiPietro,
Bellamarie Ludwig* and
Benjamin J. Lear
*
Department of Chemistry, The Pennsylvania State University, University Park, Pennsylvania 16803, USA. E-mail: bul14@psu.edu; bxb234@psu.edu
First published on 8th July 2025
The surface patterning of polymers is an important approach to enhancing material properties for a large variety of applications. Due to the formation of irreversible crosslinks however, thermoset polymers tend to be challenging to pattern. In this paper we present a novel method of patterning a commonly used thermoset polymer, polydimethylsiloxane (PDMS), through controlled photothermal curing. We show that by incorporating 0.05% carbon black by weight into PDMS and moving a continuous wave-based laser engraver over the surface in a snake pattern, we can photothermally generate micron-scale surface features, and that these patterns can be controlled through laser parameters. Finally, we show that the photothermally patterned PDMS surfaces undergo changes in the optical properties as a result of patterning.
The process of patterning is relatively simple for thermoplastics, which can be reheated and reshaped multiple times.7 In contrast, thermosets form irreversible crosslinks and cannot be reshaped once cured.8 Consequently, surface patterning of thermosets is typically performed in one of two ways. In one, the thermoset is generated without patterns, and then patterns are milled or ablated into the material.9–11 Successive iterations of this ablation can lead to the formation of complex patterns.11 A disadvantage of this approach is that the polymer surface can be damaged during the removal.12 A second approach is to use soft lithography, generating micro/nano scale features on a polymer surface by curing the material in a mold.13 Soft lithography offers an accurate method of generating sub-micron features for various applications.14 However, the technique has several drawbacks. For instance, creating a master mold necessitates a clean room and involves several intricate steps to generate. This makes the process expensive, impedes its scalability, limits its accessibility, and prohibits rapid changes in pattern design.9,13,15 Furthermore, attaining high fidelity matching between the mold and the surface can prove challenging. Therefore, there is a need for an inexpensive, accessible method of patterning thermoset polymers that allows easy reconfigurability of the patterns.
Herein, we demonstrate that photothermal curing is one avenue for directly writing patterns into thermosetting polymers. This approach leverages photothermal heating by small light absorbing particles, which produce tightly localized heat upon illumination.16 Though the heat is local, it has been shown effective in driving bulk-scale transformations of polymers.17–21 At the same time, the heat produced is local, and so too must be the chemical changes it drives—a fact that could be harnessed to write patterns into a polymer during its curing. For instance, cured thermosetting polymers are expected to have a different surface potential than uncured pre-polymers, thereby yielding differences in surface tension and driving a Maragoni flow.22 Thus, if photothermal heating could be applied in a manner sufficient to realize a different in local surface tensions, we would expect this could be harnessed to draw physical features into a thermosetting polymer. We demonstrate such patterning via photothermal curing of a PDMS/carbon black composite. Specifically, we use a laser engraver to expose the PDMS composite to light following a ‘snake’ pattern with two different line spacings (Fig. 1). Prior work by ourselves and others have shown photothermal heating is effective for driving the curing of PDMS.23–25 We find that this approach generates controllable micron scale features in cured PDMS. We note that prior efforts have demonstrated that photothermal heating can be used to generate patterns in PDMS by pyrolysis of the existing polymer,11 while our work demonstrates such patterning through curing of the polymer. Though we briefly consider the ramifications of these patterns for the polymer properties, the focus of the manuscript is on the generation of these patterns, as well as their regularity and fidelity.
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Fig. 1 Schematic of photothermal patterning using a laser etcher. Control over the patterns can be done by changing the spacing between lines in a ‘snake’ pattern. |
The stock solution was diluted 20-fold using the PDMS pre-polymer to yield a carbon black loading of 0.055 w/w%. For every 10 parts of this mixture, 1 part of curing agent is added, resulting in the final formulation of 0.05 w/w% CB in PDMS.
The final composite was mixed by hand until the CB was thoroughly dispersed in the PDMS, followed by degassing at 80 kPa for 20 minutes. A casting knife was used to coat 1 × 3 inch clear glass microscope slides to a thickness of 5 mils. Immediately following slide coating, the PDMS film is patterned.
To characterize the surface roughness and features generated by photothermal patterning, an optical profilometer (NexviewTM NX2 3D Optical Profilometer, Zygo Corportation, USA) with a 2.75× objective and 1× zoom was used. A total of five scans from different areas of the surface were taken for each sample type.
We can also consider a rough estimate of the lower limit of resolution we expect for lines drawn using the xTOOl. As noted above, the spot size is 16 μm. However, during irradiation, the thermal energy can diffuse away from the plot, increasing the size of the feature being written. Given the translation speed of the laser, the spot size, and thermal diffusivity of PMDS, as well as the fact that significantly elevated temperatures are needed to cure PDMS, we estimate that the lower limit of our resolution will be around 100 microns. The rationale for this estimate is given in the ESI.†
Outside of where the laser passed, the composite material remained liquid; however, the surface features generated by the laser were solid and could be manipulated physically. We assume that the solid features are cured polymer, as the power density used is well known to produce cured PDMS.24 While PDMS is able to cure over a 48 hours period, the patterns are left distorted and delaminated. This is shown in Fig. S1.† In order to ensure that the patterns generated were affixed in place for further evaluation, the slide was heated in an oven for 30 min at 100 °C. This treatment ensured the material was fully cured, thereby securing the patterns. Though this two-step process of laser curing followed by oven curing does not offer a significant speed advantage over conventional heating, we note that the patterns are generated in a manner that is new for thermosetting polymers and offers a simple means to change the pattern dynamically—a capability that is not attainable using conventional lithographic techniques. Additionally, we are working with pre-polymers, rather than cured systems, as would be done for milling or ablating.
In order to demonstrate that it was the scanning of the laser that produced the features in the PDMS and to demonstrate that we have control over the patterns via parameters of the laser, we generated samples in which the targeted line density was either 100 lines per cm (left side) and 140 lines per cm (right side). Fig. 2A shows an image of these samples, produced side by side on a single slide. This was done by depositing a single polymer film, and then curing the samples, changing the line density half way across the slide. Visual examination of this slide shows that there is a clear transition in the appearance of the films, when the line density changes. In particular, the higher line density produces a larger blurring effect on the image behind the slide. To demonstrate that this blurring is not the result of the glass slide or the polymer film, Fig. 2B and C shows the results of viewing the same background through slide that was coated with unpatterned PDMS with 0.05 w/w% CB and a slide coated with pure PDMS (i.e., no CB), respectively. From these photographs, it is clear that patterning is associated with increased blurring.
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Fig. 3 Optical microscopy images of samples patterned with line densities of (A) 100 lines per cm, and (B) 140 lines per cm. |
Using a Zygo NexView 3D, with a 2.75× objective and operating at 1× zoom, we sampled five different regions for both of our line spacings. Fig. 4 presents a summary of the optical profilometry data. The data presented is after any large scale features (a.k.a., form) have been removed. Details of the data processing are found in the ESI.† Exemplars of regions for both 100 lines per cm and 140 lines per cm are shown in Fig. 4e and f, respectively. In these images the height is magnified by 10×, relative to this scale. From examining these images, one can see that the 100 lines per cm sample does indeed appear to have lines of alternating depth. In comparing the regions from the 100 lines per cm and 140 lines per cm, we can also easily see that the lines spacing is closer for the 140 lines per cm sample.
When considering the profilometry data, it is critical to note that data is acquired using illumination of the samples from above. Because of this, sharp features in a sample can obscure some of the data. For our 100 lines per cm samples an average of 2% of the sample was obscured. However, the 140 lines per cm sample contains sharper features and roughly 27% of the sample is obscured. In processing the data, missing data is replaced by local averages, as described in the ESI.† However, this is done simply to aid in the processing of the data, as the analysis presented below is performed using only the acquired data points, which are unaffected by the local averaging. We also note that the missing data points are almost exclusively located on the walls of the ridges and furrows of the lines, and that data for the top and bottom of the features is retained. This can be see in Fig. S2,† where we present the same profile regions, color-coded by presence or absence of data.
The presence of the line pattern introduces a directionality to the samples and it makes sense to consider profiles that are taken parallel and perpendicular to the line pattern. In Fig. 4, these profiles are shown above and below the 3D rendering of the region, respectively. These profiles are color coded such that real data is dark cyan and missing data is pink. Looking over the profiles, one can see that the missing data (pink) is largely localized to the walls of the features.
For both the parallel and perpendicular profiles, we show three profiles: the profile with the largest roughness for the areal region, the median roughness for the areal region, and the lowest roughness for the areal region, as calculated using eqn (1):26
Ra = ∑abs(zi − zmean)/n | (1) |
To better visualize the presence or absence of a pattern, we also calculate the auto correlation for all profiles, and the corresponding auto correlation is shown to the right of the profiles. The auto correlation profiles are found by calculating the Pearson correlation coefficient between the profile and itself, but translated by a given distance. Details for this process are given in the ESI.† The autocorrelation coefficient can run between values of 1 and −1, with a value of 0 indicating no correlation. In inspecting these auto correlations, it is immediately clear that there is an underlying pattern contained within the profiles perpendicular to the line pattern, but that there is essentially no pattern within those profiles running parallel to the lines.
To further characterize the profiles running perpendicular to the drawn lines, we can consider the distance between features. For this, one might consider the distance between the minima (i.e., “valleys”). Given the reasoning presented in the introduction, we believe these are the locations where the laser directly passed. The heating results in pushing material out of the way yielding a valley, and forming maxima (i.e., “peaks”) to either side. This suggests that one might also be interested in the distance between peaks, as well as the height difference between adjacent peaks and valleys. Thus, we processed each of the 5320 perpendicular profile, across all 5 regions for each pattern and found the peaks and valleys. Details on this processing are given in the ESI,† and examples of the results are shown in Fig. S3.† Fig. 4k–p presents histograms for all three metrics, as well as fits of appropriate distributions to these histograms. Each of these reveal some information about the nature of the patterns, and how they are formed.
We first consider the valley-to-valley separations, shown in the blue histograms. These histograms reveal a single major feature for both the 100 lines per cm and 140 lines per cm samples, with an approximately Gaussian shape. Both histograms also show minor features with peaks at roughly twice those of the major feature. We ascribe these to a small number of separations where an intervening valley is missed, and so the separation between two valleys becomes twice that of the average. The 100 lines per cm also has a feature that is at shorter distances, and we believe this is due to rougher valleys (see discussion of SEM results, below), which can result in multiple locations found within a single valley. However, both of these additional features are relatively minor and do not significantly influence the analysis.
We fit each valley-to-valley histogram to a single Gaussian profile and the results are shown as the bold dark red line. The mean and standard deviation extracted from this fit, as well as the uncertainties in these values, are also given next to the histograms. When considering the mean values, we can see that the separation between features is smaller for the 140 lines per cm samples than the 100 lines per cm sample. Using the mean separations found, we find that the sample for which we tried to write 100 lines per cm produced a mean spacing associated with 95 lines per cm, while the sample for which we tried to write 140 lines per cm produced a mean spacing associated with 132 lines per cm. Thus, both samples produced lines that were roughly 95% of the desired density. We believe that this is likely due to calibration issues with the laser engraver, rather than a fundamental limitation of photothermal patterning.
Considering the standard deviations of the distributions, we find them to be quite similar. Thus, the standard deviations are not tied to the parameters of the pattern, but either to the behavior of the laser-engraver's stepper motors or the behavior of the PDMS upon exposure. At this time, we are unable to make a clear distinction between these two possibilities. However, a discussion of the standard deviation also speaks to reproducibility, and it is natural to ask how well-preserved the patterns are across the entire sample. As noted above, we sampled our patterns at 5 different regions each, and so we can also perform the valley-to-valley distance analysis separately for each measured region of the patterns. The values that are extracted from this analysis are reported in Table S1.† What we find is that the variation in valley-to-valley measurements are largely within a few microns of one another, except for an outlier for the 100 line per cm sample. Thus, we conclude that our approach can write patterns with close to micron-scale fidelity, though again we are uncertain if the fluctuations in the pattern spacing is due to the behavior of the PDMS or of the engraver.
Turning to the peak-to-peak separations, presented in the orange histograms in Fig. 4, the most obvious difference is that the 100 lines per mm sample is bimodal, while the 140 lines per mm samples is monomodal. The monomodal distribution was fit to a single Gaussian lineshape, and the extracted mean and standard deviations are not meaningfully different from those associated with the valley-to-valley separations for the 140 lines per cm patterns. Thus, for the 140 lines per cm pattern the peaks and valleys appear to be fully determined by the lines being written.
The bimodal distribution found for the 100 lines per cm pattern was fit to two Gaussian profiles, and the resulting fit is shown in dark red. From this we find that the intensity of the two features is nearly identical; the intensity of the Gaussian with the larger mean value is 93% that of the Gaussian with the smaller value. Furthermore, we find that the weighted average of the means for the two Gaussians is 100 microns—close to that that found for the valley-to-valley separation. Thus, we conclude that the process generating the valleys also responsible for generating the peaks. Specifically, we hypothesize that, while the sample is pushed away through heating by the laser (at a spacing of 104 microns), the degree to which the sample is pushed varies every other line. In testing our laser, we found that the intensity of the laser could vary every other pass, which explains these results. This result, while leading to irregular features in this particular sample, highlights that changes in the light intensity can be used to modulate the final patterns within the film.
Finally, we can turn to the peak-to-valley height differences, shown in Fig. 4 using grey histograms. The shape of these histograms, together with the fact that there cannot be negative differences suggests that the data should follow a gamma distribution, and the dark red lines in the histograms are fits of the data to this distribution. From these fits, we can extract a mean value and an uncertainty in this value, which is also shown on the histograms. We find that the mean depth for the 140 lines per mm patterns are 7.4 times deeper than for the 100 lines per mm sample.
Something else that is of interest in the peak-to-valley data is that the 100 lines per cm sample is fit to a single gamma distribution, despite the fact that the image of the region shown in Fig. 4e seems to indicate that there are two distinct heights. Indeed, if we perform the same analysis on a single region, we find that two gamma distributions are needed, as shown in Fig. S4.† Thus, it seems that there is enough variance across the sample that, when different regions are combined, the distinction between heights is blurred and the distribution can be fit to a single gamma distribution. Close inspection of the profile exemplars shown in Fig. 4g reveals that the every-other height variation is not as great for the smoothest profile as for the roughest profile. Thus, even within the areal region shown in Fig. 4g, there is not a clear retention of the two peak-to-valley heights. This is some indication that improvements in pattern uniformity across the cm scale is needed.
While optical profilometry allows us to construct a 3D image of the surface, the loss of data for the steepest features means that we do not have a good indication of morphology of the lines at the smallest scale. To address this limitation, SEM imaging was performed to investigate the morphology within these features. SEM images of each patterned surface are shown in Fig. 5.
In this figure, we can again see that the 100 lines per cm sample contains clear alteration between adjacent lines, with one of the lines being very difficult to see. Within the easier to see line, we can observe some smaller scale structures, which appear to be circular in shape. The 140 lines per cm sample share similar appearance of these circular features within the sample and, while all lines were fairly easy to see for the 140 lines per cm samples, the SEM does show some variability between adjacent lines. In particular, the circular features present within these lines are more pronounced every other line. Given the intense nature of the heating, we hypothesize that these circular features could be the remnants of an explosive volatilization reaction within the curing PDMS, leaving behind these features in the cured sample. This volitization could arise from trace amounts of solvent, or even lighter weight components of the pre-polymer.
If our hypothesis as to the nature of the circular features is correct, then we might expect that the roughness of the surface is greatest where they occur, and they should be occurring where the laser intensity was greatest (i.e., the valleys). We can confirm this is the case by returning to the profilometry data and computing the roughness for each profile parallel to the lines, and then plotting this for each position in the profile. This shown as the blue traces in Fig. 5C (100 lines per cm) and D (140 lines per cm). In this data, one can see clear spikes in the roughness, which is especially clear for the 100 lines per cm sample. To aid in understanding of these features, we also show the average height for each profile, as the orange traces in Fig. 5C and D. From this plot, it does seem that areas of high roughness correspond to the valleys drawn in the sample, consistent with our hypothesis. However, we do note that this these are much more clearly correlated for the 100 lines per cm pattern than the 140 lines per cm pattern.
The conclusion of this surface analysis that we are clearly generating patterns within the PDMS using laser scanning, and that the nature of these patterns is dependent on the scan parameters. To understand if these lead to control of other properties, we next examine the optical properties and hydrophobic properties of the films.
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Fig. 6 (A) Reflectivity, and (B) transmission spectra of various surfaces compared to photothermally patterned PDMS. |
As shown in Fig. 6A, the reflectivity of pure PDMS is similar to that of uncoated glass, but the reflectivity decreased significantly with the addition of CB. This outcome is expected owing to the absorptive properties of CB. Introduction of patterns did not change the reflectivity as significantly as addition of CB. Nevertheless, there is a small increase in reflectivity, the origins of which we do not fully understand. It is possible that the small scale features that are seen in the SEM image (Fig. 5) are on a scale appropriate to increase the scattering of light, relative to the unpatterned sample. However, we have not directly tested this hypothesis.
Turning to transmission (Fig. 6B), we again see that the properties of glass and pure PMDS are similar, while addition of CB to the PDMS results in a dramatic decrease in transmission. This is again expected, given the absorptive properties of CB. However, introduction of patterns to the PDMS now introduces a substantial increase in transmission. The creation of feature via pushing of material makes some pathlengths longer and some shorter, without removing material. The non-linear dependence of transmission on the pathlength, as explained via Beer's law, means that such patterns must result in an overall increase in the transmission.
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Fig. 7 Average contact angle measurements of water droplets on various nonpatterned and photothermally patterned surfaces. |
Footnote |
† Electronic supplementary information (ESI) available. See DOI: https://doi.org/10.1039/d5lp00093a |
This journal is © The Royal Society of Chemistry 2025 |