Sanggyun Kima,
Justine S. Wagner
b,
Sina Sabury
b,
Jack Lawton
a,
Martin Gómez-Domínguez
a,
Diana K. LaFollette
a,
Dwanleen E. Shen
b,
Anna M. Österholm
b,
Ruipeng Li
c,
Carlo A. R. Perini
a,
John R. Reynolds
*ab and
Juan-Pablo Correa-Baena
*ab
aSchool of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, USA. E-mail: jreynolds43@gatech.edu; jpcorrea@gatech.edu
bSchool of Chemistry and Biochemistry, Center for Organic Photonics and Electronics, Georgia Institute of Technology, Atlanta, Georgia 30332, USA
cNational Synchrotron Light Source II, Brookhaven National Lab, Upton, New York, 11973, USA
First published on 21st August 2025
Charge transport layers (CTLs) play a critical role in the performance and long-term stability of perovskite solar cells (PSCs) by facilitating efficient charge extraction and providing interfacial stabilization. For organic CTLs, different functional groups have been designed to modulate the interactions with the substrate. Anchoring groups are used to establish strong adhesion to transparent conductive oxides (TCOs) but are not routinely incorporated in organic CTL design. In this study, we investigate the influence of anchoring groups in organic electron transport layers (ETLs) on PSC performance and stability by synthesizing and evaluating two naphthalene diimide (NDI)-based ETLs: NDI-(PhPA)2, functionalized with polar phenyl phosphonic acid (PhPA) groups, and NDI-(PhBr)2, modified with nonpolar bromophenyl (PhBr) groups. X-ray photoelectron spectroscopy confirms that PhPA functionalization leads to NDIs anchored onto fluorine-doped tin oxide (FTO) following chemical bath deposition, while NDI-(PhBr)2 shows no detectable surface presence after deposition. We show that NDI-(PhPA)2 deposits as a thin film on FTO, exhibiting strong adhesion, high solvent resistance, and enhanced light and thermal stability, achieving a maximum device efficiency of 14.3%. Stability assessments conducted under continuous illumination at 25 °C for 200 hours and at 65 °C for 100 hours demonstrate performance on par with TiO2-based ETLs. In contrast, NDI-(PhBr)2, which lacks strong anchoring interactions, fails to adhere to the FTO surface, resulting in a rapid decrease in efficiency over a few hours, comparable to devices without an ETL. These findings highlight the importance of anchoring groups in organic CTLs for achieving long-term PSC stability under operational conditions.
Broader contextMetal halide perovskites (MHPs) are among the most promising materials for low-cost, high-efficiency optoelectronic technologies, including solar cells, photodetectors, and light-emitting devices. However, their widespread deployment remains hindered by device instability and poor interfacial durability, especially when using organic charge transport layers deposited via scalable methods. Although significant progress has been made in engineering hole transport layers with anchoring functionalities, the development of robust organic electron transport layers (ETLs) remains a major challenge due to weak interfacial adhesion and insufficient stability under operational conditions. This work addresses these limitations by introducing phosphonic acid-functionalized naphthalene diimides (NDIs) as ETLs for perovskite solar cells. By leveraging strong interfacial binding through phosphonic acid anchoring groups, these molecules form stable interlayers at the transparent electrode interface. We demonstrate that these materials enable enhanced wettability, superior film quality, efficient charge extraction, and long-term device stability under thermal and continuous illumination stress. These findings contribute to the broader goal of achieving durable and high-performing perovskite optoelectronics through molecular-level design of functional interlayers. |
Organic CTLs have emerged as promising candidates due to their solution processability, low-temperature fabrication, and tunable optoelectronic properties.16 However, one of the key challenges in organic CTLs lies in achieving strong interfacial adhesion with transparent conductive oxides (TCOs) such as indium-doped tin oxide and fluorine-doped tin oxide (FTO) which are widely used as transparent electrodes in optoelectronic technologies.15,17,18 Unlike metal-oxide based CTLs such as TiO2 and SnO2, which readily form chemical bonds with TCOs, organic CTLs often exhibit weak adhesion when the conjugated core itself lacks functional groups capable of directly binding to metal oxides. This can result in delamination and create discontinuities that hinder efficient charge transport, ultimately compromising device performance. To overcome these limitations, organic CTLs are commonly functionalized with anchoring groups, which facilitate strong interfacial bonding with the underlying TCOs as well as strong interaction with the perovskite layer. These anchoring groups play a decisive role in interfacial stabilization and indirectly improve charge transport by promoting uniform molecular coverage and reducing interfacial defects between TCOs and organic CTLs.19,20
Historically, achieving uniform and stable organic CTLs has been challenging due to poor adhesion to metal oxides and chemical incompatibility with perovskite precursor solutions. Various anchoring groups including carboxylic acids,21 thiols,22 alcohols23, organosilanes,24 and phosphonic acids (PAs)20,25,26 have been explored, not only to strengthen interfacial bonding with TCOs, but also to modulate work function and tune surface energy, thereby enhancing charge extraction and controlling perovskite nucleation and film formation. Among these, PAs have demonstrated strong surface binding and self-assembled monolayer formation, making them particularly effective for stabilizing organic CTLs. Their strong adhesion primarily arises from bidentate or tridentate coordination of the PA group to metal atoms on the TCO surface, forming stable bonds.25 Secondary hydrogen bonding with surface hydroxyl groups further reinforces these interactions, collectively promoting uniform film formation and enhancing interfacial stability between the TCO and the organics. PA-based anchoring has been widely implemented in organic hole transport layers (HTLs) for p–i–n PSC device architecture where molecules such as, [(2-(4-(bis(4-methoxyphenyl)amino)phenyl)-1-cyanovinyl)phosphonic acid (MPA-CPA) and 4-(7H-dibenzo[c, g]carbazol-7-yl)phenyl)phosphonic acid (Bz-PhpPACz) have displayed PCEs exceeding 24% with improved thermal stability.27,28 For both molecules, the formation of a bi-layer, and the presence of phosphonic groups pointing towards the perovskite interface enhancing wettability were instrumental in driving the high performance. While these design strategies have been well established for HTLs, the use of PA-based anchoring groups in organic electron transport layers (ETLs) remain largely unexplored. To date, the only reported organic ETL in n–i–p PCS device with PA is N-(2,5-di-tert-butylphenyl)-N′-(methyl)-1,4,5,8-naphthalene tetracarboxylic diimide phosphonic acid (PANDI), which incorporates a single PA anchoring group and has demonstrated a PCE of 21.5%.29 This limited precedent highlights the need for further systematic development of PA-functionalized organic ETLs to fully understand their potential in interfacial engineering, charge transport, and long-term device stability.
In this work, we examined two functionalized naphthalene diimide (NDI) based molecules as ETLs in n–i–p PSC device configuration, ((1,3,6,8-tetraoxo-1,3,6,8-tetrahydrobenzo[lmn][3,8]phenanthroline-2,-diyl)bis(4,1-phenylene))bis(phosphonic acid) (NDI-(PhPA)2) which features PA group on each end of the molecule, and 2,7-bis(4-bromphenyl)benzo[lmn][3,8]phenanthroline-1,3,6,8(2H, 7H)-tetraone (NDI-(PhBr)2), which has bromine terminations instead of the PA anchoring groups (Fig. 1a). NDI derivatives are widely recognized for their strong electron-accepting characteristics, high stability under ambient conditions, and efficient π–π stacking interactions to facilitate enhanced charge transport, making them attractive candidates for organic ETLs.30–32 NDI-(PhPA)2 was specifically designed to form robust covalent bonds with the TCO while providing enhanced surface hydrophilicity through its second PA group, thereby improving the wettability and uniform coverage of the perovskite layer. In contrast, NDI-(PhBr)2 serves as a control to isolate the effect that the absence of PA groups have on adhesion. NDI-(PhBr)2 relies solely on weak physisorption and lacks specific binding interactions with the TCO. Devices incorporating NDI-(PhPA)2 demonstrate a maximum PCE of 14.3% and exhibit remarkable operational stability, retaining performance under continuous illumination at 25 °C for 200 hours and at 65 °C for 100 hours, comparable to devices using conventional TiO2-based ETLs. Conversely, devices treated with NDI-(PhBr)2 degrade rapidly, with performance indistinguishable from devices lacking an ETL. These results underscore the critical importance of anchoring group design in organic ETLs and establish PA functionalization as a highly effective strategy for achieving robust interface engineering and long-term device stability in PSCs.
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Fig. 2 CBD process of NDI-based ETLs. Schematic representation of the CBD process of NDI-based thin films. |
Thin-film formation was optimized by varying the time of the CBD process for each molecule based on their anticipated interactions with the FTO surface. For NDI-(PhPA)2, deposition times of 24, 48, and 72 hours were explored, as the anchoring group was expected to form strong chemical bonds with metal oxides, potentially enhancing film growth with extended deposition time. Conversely, NDI-(PhBr)2, being nonpolar and dependent on weak physisorption to the metal oxide surface, was deposited over shorter durations of 6, 12, and 24 hours. Longer deposition times were not expected to improve coverage, as weak, non-specific interactions typically reach equilibrium rapidly and do not benefit from extended exposure, making shorter deposition times sufficient to assess any potential adsorption behavior.36 Preliminary confirmation of molecular deposition and structural integrity was carried out by comparing thin-film UV-vis absorption spectra with solution-phase spectra (Fig. S16a and b). Thin films were deposited on glass substrates using the longest CBD durations, and spectra were acquired with a double-beam spectrophotometer, using a blank glass substrate as the reference to ensure that the recorded signals correspond exclusively to the deposited molecules. Both NDI-coated glass substrates exhibit an absorption at 260 nm and 270 nm, likely originating from minor baseline deviations arising from changes in the refractive index of the glass surface following CBD treatment.
Normalized thin-film spectra of NDI-(PhPA)2 show distinct absorption peaks at 361 nm and 381 nm, matching those observed in solution, confirming deposition and preservation of molecular structure. In contrast, no corresponding peaks for NDI-(PhBr)2 were observed, indicating the likely absence of film formation. As a result, only the optical HOMO–LUMO gap of NDI-(PhPA)2 was determined using the Tauc method from the absorption edge between 370 nm and 390 nm, yielding a value of approximately 3.12 eV (Fig. S16c). In addition, absorptance spectra derived from transmittance and reflectance measurements further confirm that the lack of a defined band edge in NDI-(PhBr)2 is not due to light scattering, and is instead due to the absence of any NDI-(PhBr)2 on the substrate surface (Fig. S17).
X-ray photoelectrons spectroscopy (XPS) was performed to confirm the deposition of NDI-(PhPA)2 and NDI-(PhBr)2 onto the FTO substrates, and to assess the influence of varying chemical bath durations on molecular coverage. Fig. 3a and b present elemental XPS scans of P 2p and Br 3d, corresponding to NDI-(PhPA)2 and NDI-(PhBr)2 thin films, respectively. For NDI-(PhPA)2, P 2p signals were examined at chemical bath durations of 24, 48, and 72 hours, with bare FTO serving as a reference. The bare FTO exhibited a peak at 139 eV, which we could attribute it to Zn or Pb impurities from substrate processing. After NDI-(PhPA)2 deposition, two distinct peaks with binding energies of 139 eV and 133.5 eV were observed. The persistent 139 eV signal, though reduced in intensity, is attributed to the underlying FTO substrate, whereas the new peak at 133.5 eV peak corresponds to phosphorous P 2p within the NDI-(PhPA)2 molecule. The increasing signal intesity at 133.5 eV from 24 to 48 hours, followed by saturation between 48 and 72 hours, indicates progressive and self-limited deposition and suggests a monolayer is formed after this wait time. The deposition was further confirmed by a π–π* satellite feature near 291.5 eV (Fig. S18) in the C 1s spectrum, which is attributed to the conjugated or aromatic π-electron systems in the NDI backbone.
For NDI-(PhBr)2, the Br 3d signal was analyzed for samples processed at 6, 12, and 24 hours. No Br 3d signal was detected at any deposition duration, indicating the absence of measurable film formation. This result suggests that weak physisorption of the nonpolar PhBr groups and the hydroxyl-terminated FTO surface prevents stable adsorption, with any loosely adhered molecules likely removed during the EtOH dipping step of the CBD process. Consistent with this finding, the C 1s spectrum of NDI-(PhBr)2 showed no π–π* satellite feature (Fig. S19), and no N 1s signal was detected (Fig. S20). In contrast, N 1s peaks were clearly observed for NDI-(PhPA)2, with increasing intensity correlating with longer deposition times, further supporting the formation of a uniform, well-anchored thin film. The absence of both Br 3d and N 1s signals for NDI-(PhBr)2 conclusively confirms that stable film formation was not attained under the investigated conditions.
For NDI-(PhPA)2 thin films, XPS analysis revealed an increase in the signal at 139 eV following the wash test when compared to unwashed films (Fig. 3c), except for 72-hours depositions. The data shows an increase in the FTO signal after washing, suggesting that some of the NDI-(PhPA)2 is being removed. This increase was inversely correlated with CBD duration, where the peak intensity increase at 139 eV was more pronounced for thin films deposited for 24 and 48 hours but remained largely unchanged for 72-hours depositions. These observations suggest that longer CBD durations enhance interfacial bonding. The ability of NDI-(PhPA)2 to endure both polar DMSO and nonpolar CB solvent exposure is indicative of its stability under perovskite processing conditions, highlighting it as a suitable ETL for n–i–p PSCs. This illustrates the critical role of anchoring groups such as phosphonic acids in establishing strong interactions with metal oxides. Furthermore, the ability of NDI-(PhPA)2 to withstand exposure to perovskite precursor solvents, particularly DMSO which was originally used for CBD, ensures interfacial integrity during PSC fabrication.
Despite forming a uniform, well-anchored interlayer, NDI-(PhPA)2 devices exhibited lower stabilized PCEs, primarily due to a reduction in open-circuit voltage (VOC) (Fig. S32a). Given its superior molecular coverage and strong interaction with FTO, the reduced VOC is likely linked to the introduction of suboptimal energy band alignment, generating an interfacial energy barrier with the perovskite. Contact angle measurements (Fig. S30) revealed that NDI-(PhPA)2 yields a more hydrophilic surface than bare FTO yet remains less hydrophilic than the reference (c-TiO2 + mp-TiO2) surface. Prior studies indicate that surface polarity can influence perovskite nucleation, where more hydrophilic surfaces promote denser nucleation and smaller grains, while more hydrophobic surfaces favor fewer nucleation and larger grains.39 Smaller grains typically result in more grain boundaries, which are often correlated with increased non-radiative recombination and reduced VOC. However, since the reference devices show higher VOC than NDI-(PhPA)2-based devices, the VOC loss is unlikely due to grain size differences and instead supports the hypothesis of an energy level mismatch at the FTO/ETL or ETL/perovskite interface. This hypothesis is further supported by cross-sectional SEM images of REF, w/o ETL, and NDI-(PhPA)2 incorporated PSCs, which reveal comparable perovskite grain sizes across all devices (Fig. S31). In contrast, devices treated with NDI-(PhBr)2 exhibited higher PCEs than those with NDI-(PhPA)2 (Fig. 4b), which can be attributed to the lack of deposition of NDI-(PhBr)2 during CBD processing, resulting in performances closer to devices without an ETL.
To evaluate the impact of NDI-based ETLs on PSC long-term stability, ISOS-L-1I and ISOS-L-2I protocols were employed.40 Following the ISOS-L-1I testing, the devices were subjected to continuous maximum power point tracking (MPPT) under 1 sun equivalent illumination at 25 °C in an N2 atmosphere (Fig. 4c). Current density–voltage scans were conducted every 12 hours to monitor the evolution of short-circuit current density (JSC), VOC, fill factor (FF), and stabilized PCE (Fig. S33). Over 200 hours of stress testing, the normalized stabilized PCE remained unchanged for both the reference (c-TiO2 + mp-TiO2) and NDI-(PhPA)2 devices, while devices without ETL and those treated with NDI-(PhBr)2 exhibited rapid and comparable degradation. Under ISOS-L-2I high-temperature stress testing at 65 °C for 100 hours, degradation accelerated for devices without ETL and those treated with NDI-(PhBr)2 (Fig. 4d). Conversely, the REF and NDI-(PhPA)2 devices showed greater stability. The gradual decline in normalized stabilized PCE observed in these more stable devices is likely linked to doped spiro-OMeTAD degradation, given that the ETL is the only variable and the thermal instability of doped spiro-OMeTAD is well established in the literature.14,16,33 These results suggest that PhPA anchoring groups in NDI-based molecules enhance device longevity by preventing interface degradation, reinforcing that NDI-(PhPA)2 exhibits comparable stability to c-TiO2 + mp-TiO2 under both light and thermal stress conditions. In particular, devices with direct FTO-perovskite contact suffer from interface degradation due to unmitigated ion migration, surface reactions, and trap formation.15 The impact of molecular coverage and unbound excess molecules on long-term stability was also examined in PSCs with NDI-(PhPA)2 and NDI-(PhBr)2 processed via 24-hours CBD. The unbound excess molecules refer to devices without EtOH dipping during the CBD process. Under ISOS-L-1I testing, NDI-(PhPA)2 showed linear degradation, while NDI-(PhBr)2 treated devices degraded rapidly. ISOS-L-2I testing further revealed that unbound NDI-(PhPA)2 accelerated degradation, whereas NDI-(PhBr)2 excess caused additional instability. An extended analysis is provided in SI Note 1 (Fig. S24–S29 and Tables S1–S3).
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