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Correction: Enhanced field emission stability of vertically aligned carbon nanotubes through anchoring for X-ray imaging applications
Xinchuan
Liu
ab,
Yuanxun
Li
bd,
Jianfeng
Xiao
ab,
Jiuzhou
Zhao
b,
Chi
Li
*be and
Zhenjun
Li
*bce
aSchool of Materials Science and Engineering, Zhengzhou University, Zhengzhou 450001, China
bCAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, China. E-mail: lizhenjun@nanoctr.cn; lichi@nanoctr.cn; Tel: +86 10 82545609
cThe GBA National Institute for Nanotechnology Innovation, Guangdong, Guangzhou 510700, China
dSchool of Instrument Science and Engineering, Southeast University, Nanjing 210096, China
eCenter of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China
First published on 6th March 2023
Abstract
Correction for ‘Enhanced field emission stability of vertically aligned carbon nanotubes through anchoring for X-ray imaging applications’ by Xinchuan Liu et al., J. Mater. Chem. C, 2023, 11, 2505–2513, https://doi.org/10.1039/d2tc04363g.
The authors wish to update the details of affiliation c given in the published article, as well as the address details given on the associated inside back cover, replacing “GBA Research Innovation Institute for Nanotechnology” with “The GBA National Institute for Nanotechnology Innovation”. The corrected list of affiliations for this article is as shown here.
The Royal Society of Chemistry apologises for these errors and any consequent inconvenience to authors and readers.
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