Correction: Electrochemical gating enhances nearfield trapping of single metalloprotein junctions

Abstract

Correction for ‘Electrochemical gating enhances nearfield trapping of single metalloprotein junctions’ by Albert C. Aragonès et al., J. Mater. Chem. C, 2021, DOI: 10.1039/d1tc01535d.

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The authors regret an error in the x-axis scale of Fig. 2c in the published article (the value of 400 cm⁻¹ should be replaced with 800 cm⁻¹). The corrected version of Fig. 2 is shown below (the caption remains unchanged). Please note that this error does not affect any of the discussions and conclusions reported in the article.

Fig. 2 (a) EC-STM image (200 nm × 200 nm, z-scale = 1 nm) of an Azu-functionalized Au(111) surface in 50 mM NH₄Ac buffer at pH 4.55 with U_sample = 1000 mV, U_bias = 300 mV, I_t = 1 nA. (b) CV of Azu under the conditions of (a) with a scan rate of 50 mV s⁻¹. (c) Raw TER spectra obtained with ca. 9.49 mW μm⁻² farfield power density at 1.96 eV excitation energy and 120 s integration time of oxidized Cu(II) (U_sample = 1000 mV, red) and reduced Cu(I) (U_sample = 500 mV, blue) Azu, respectively. LSPR mode energies as extracted from Lorentzian fits to the TER spectral background are indicated with dotted vertical lines. (d and e) Examples of EC-PBJ captures of Azu junctions at (d) U_sample = 500 mV (blue, τ_red) and (e) U_sample = 1000 mV (red, τ_ox) with maximum (τ_M) and minimum (τ_m) laser power conditions of 9.49 mW μm⁻² and 6.72 × 10⁻² mW μm⁻², respectively.

The Royal Society of Chemistry apologises for these errors and any consequent inconvenience to authors and readers.

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