Open Access Article
Ruri Agung Wahyuonoab,
Andrea Dellitha,
Christa Schmidta,
Jan Dellitha,
Anna Ignaszak
c,
Martin Seyringd,
Markus Rettenmayrd,
Jennifer Fizee,
Vincent Artero
e,
Murielle Chavarot-Kerlidou
e and
Benjamin Dietzek
*abf
aLeibniz Institute of Photonic Technology (IPHT), Department Functional Interfaces, Jena e. V. Albert-Einstein-Str. 9, 07745 Jena, Germany. E-mail: benjamin.dietzek@ipht-jena.de
bInstitute for Physical Chemistry and Abbe Center of Photonics, Friedrich Schiller University Jena, Helmholtzweg 4, 07743 Jena, Germany
cDepartment of Chemistry, University of New Brunswick, 30 Dineen Drive (Toole Hall Room 122), Fredericton, NB, E3B 5A3 Canada
dOtto Schott Institute of Materials Research (OSIM), Friedrich Schiller University Jena, Löbdegraben 32, 07743 Jena, Germany
eUniv. Grenoble Alpes, CNRS, CEA, IRIG, Laboratoire de Chimie et Biologie des Métaux, 38000 Grenoble, France
fCenter for Energy and Environmental Chemistry (CEEC Jena), Friedrich Schiller University Jena, Philosophenweg 7a, 07743 Jena, Germany
First published on 29th November 2019
We report the wet chemical synthesis of mesoporous NiO nanostars (NS) as photocathode material for dye-sensitized solar cells (DSSCs). The growth mechanism of NiO NS as a new morphology of NiO is assessed by TEM and spectroscopic investigations. The NiO NS are obtained upon annealing of preformed β-Ni(OH)2 into pristine NiO with low defect concentrations and favorable electronic configuration for dye sensitization. The NiO NS consist of fibers self-assembled from nanoparticles yielding a specific surface area of 44.9 m2 g−1. They possess a band gap of 3.83 eV and can be sensitized by molecular photosensitizers bearing a range of anchoring groups, e.g. carboxylic acid, phosphonic acid, and pyridine. The performance of NiO NS-based photocathodes in photoelectrochemical application is compared to that of other NiO morphologies, i.e. nanoparticles and nanoflakes, under identical conditions. Sensitization of NiO NS with the benchmark organic dye P1 leads to p-DSSCs with a high photocurrent up to 3.91 mA cm−2 whilst the photoelectrochemical activity of the NiO NS photocathode in aqueous medium in the presence of an irreversible electron acceptor is reflected by generation of a photocurrent up to 23 μA cm−2.
Seminal work on p-DSSCs was reported by Hagfeldt in 1999, achieving PCE of 0.0076% using a tetrakis(4-carboxyphenyl)-porphyrin-sensitized NiO photocathode.4 While n-type DSSC have matured into a robust technology awaiting commercialization, the photocathode remains subject of optimization.5 Their low performance compared to photoanodes hinders e.g. the design of tandem DSSC (t-DSSC) which theoretically can break the Shockley–Queisser (SQ) limit.5–7 Nonetheless, the development of dye-sensitized photocathodes has also inspired the design of dye-sensitized photoelectrochemical cells (DSPECs) providing an attractive alternative for direct solar energy conversion and storage into the form of a fuel such as hydrogen8–15 or CO2 reduction products.16,17
Recent studies suggest that achieving high-performance p-DSSC should address the low hole mobility in p-semiconductor, the fast geminate recombination, the high dark current density, high series resistance and low shunt resistance.5–12 As mentioned above, NiO (Eg = 3.7–3.9 eV) which exhibits good transparency in the wavelength range of the absorption of common photosensitizers13–19 is the almost exclusively used material in p-DSSC although other wide-band gap p-type semiconductors have been explored, e.g. copper-based delafossites, copper oxides, and cobalt oxides.20–27 The main challenges in using NiO are its high valence band (VB) potential (0.54 V vs. NHE), thus limiting the maximum voltage generated in a DSSC, and the poor hole mobility.5,15–17 These properties of NiO originate from a vast amount of inherent defects, such as oxygen- and nickel-site defects, due to the non-stoichiometric conditions in NiO.5,28–31 These defects, which are reflected in the absorption spectrum of NiO, create localized electronic states in the band gap and act as trap states which cause charge recombination at the NiO-photosensitizer interface.37–40 In order to reduce the defects in NiO, modifications of the synthetic routes or post-treatment have been suggested. It has been shown that modifying the structural properties of metal-oxide semiconductor alters the electronic energy levels in semiconductors by modifying interatomic distances and hence, affects its functionality.28–30
Here we report a novel NiO nanostructure, i.e. porous NiO nanostars, fabricated by wet chemical synthesis. The growth and formation mechanism of these NiO nanostars are discussed based on a combination of electron microscopy and Raman scattering. The NiO nanostars are evaluated as materials for photocathodes in DSSCs and DSPECs and their structure and performance are compared to other NiO morphologies conventionally employed in NiO-based photocathodes. We show that NiO prepared via β-Ni(OH)2 displays superior performance in terms of photoelectrochemical characteristics compared to NiO samples prepared via α-Ni(OH)2. Thus, the results presented here provide key information for the design of synthetic routes in wet chemical synthesis of NiO for photocathode materials.
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1% v/v) and stirred at 50 °C for 15 min. The reaction mixture was then heated to 225 °C and stirred for 12 h until a light blue precipitate was obtained. The precipitate was annealed at 450 °C for 2 h to obtain NiO NS.
Synthesis of compact NiO nanoparticles (NP) was carried out by preparing 0.1 M of Ni(CH3COOH)2·2H2O (Sigma Aldrich) in diethyleneglycol (DEG) and heating at 180 °C. Once the reaction temperature reached 150 °C, 10 mL of distilled water were injected and the solution was stirred for 2 h. A green solution was obtained and cooled down in a flask and centrifuged. The reaction solution was annealed at 450 °C for 2 h to obtain NiO NP. Synthesis of NiO nanoflakes (NF) was carried out by dissolving 2.5 g NiSO4 and 0.5 g potassium persulfate 6H2O (Carl Roth GmbH & Co. KG) into 200 mL distilled water and subsequent stirring at 50 °C for 15 min. An amount of 2.5 mL NH4OH was added dropwise to the solution. The solution turned dark blue and eventually became black. The black precipitate was filtered and washed with distilled water several times to remove excess ammonium, and annealed at 450 °C for 2 h to obtain NiO NF.
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5
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10) onto FTO substrates and subsequently annealing at 450 °C. Different dyes bearing different anchoring groups were used for sensitization,32–34 i.e. Ru1 ([Ru(bpy)2dppz](PF6)2 with phosphonic acid anchoring groups), Ru2 (tris[4,4′-bis(ethylcarboxy)-2,2′-bipyridine]Ru(II) dihexafluorophosphate, [Ru(dceb)3](PF6)2), Cu1 (Cu(I) 4H-imidazolate complex with a pyridine anchoring group), P1 (4-(Bis-{4-[5-(2,2-dicyano-vinyl)-thiophene-2-yl]-phenyl}-amino)-benzoic acid) or Coumarin 343 (see Fig. 5). While P1 (Dyenamo) and Coumarin 343 (Sigma Aldrich) were purchased, Ru1, Ru2, and Cu1 were synthesized and prepared from the previous studies.41–43 The NiO electrodes were soaked in a 0.5 mM solution of dye in acetonitrile for 24 h. To estimate the amount of dye chemisorbed on the NiO photocathode (dye-loading), the dye-sensitized NiO photocathode was immersed in a 1 M NaOH solution in a water
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ethanol mixture (1
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1 v/v) for 2 h, resulting in the desorption of the dye molecules.35 The absorbance of the resulting solution was measured and the amount of desorbed dye was determined by comparing the absorbance of the desorbed solution at the absorption maximum with the absorbance of a reference UV/vis spectrum of a known concentration of the dye (also in 1 M NaOH solution with water and ethanol mixture (1
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1 v/v)).
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| Fig. 1 (a) Raman spectra of reaction solution containing intermediates, NiC2O4·xH2O and Ni(OH)2, during the synthesis of NiO NS. (b) The intensity profile of selected area diffraction (SAD) pattern of reaction intermediates (7 h, 180 °C) dried at 150 °C. Inset of panel (b) shows the TEM image for different SAD measurements, in which HRTEM images at position (c) 2 and (d) 3 are recorded. (e) HRTEM image of NiO samples (11 h, 220 °C) annealed at 200 °C. Inset of panel (c–e) shows fast Fourier transform (FFT) images of the corresponding HRTEM images indicating the lattice spacing. (f) A schematic of α/β-interstratification in a single crystal (left) and the idealized crystal structure of α-Ni(OH)2·xH2O and β-Ni(OH)2 represented by unit cell projection (right) adopted from literature.42 (g) Schematic growth and formation mechanism of NiO NS. | ||
The electron micrographs (Fig. 2) compare the morphology of NiO NS to the structures of NiO NP and NiO NF (see Experimental section for synthesis details). NiO NS show a porous surface constituted of 3D networks composed of 3 to 5 μm fibers that are assembled into star-like shapes (Fig. 2a). These fibers are formed by NiO nanoparticles chained up to form quasi-1D structures (inset Fig. 2b). The morphology of NiO NP (Fig. 2c) reveals that the primary nanoparticles also form aggregates. However, compared to NiO NS, the nanoparticle aggregates form a dense and compact surface. The aggregation in both NiO NS and NiO NP is due to the role of DEG during the growth of Ni(OH)2. The aggregates form a compact surface in NiO NP since higher concentration of DEG is used in the synthesis of NiO NP, while formation of porous self-assembled nanoparticles in NiO NS requires a mixture of DEG and water as solvent. Due to the water content during NS synthesis, hydrolysis forming Ni(OH)2 occurs rapidly which breaks aggregation and eventually forms the fiber-based nanostars. NiO NF show characteristic thin flake-like nanostructures (Fig. 2d) which also form a surface with porous flake networks.
Prior to investigating the electronic and microstructural properties of NiO NS, knowledge about the pre-formed NiO, i.e. α-Ni(OH)2 and β-Ni(OH)2, is important to obtain as different polymorphs of Ni(OH)2 might affect the defect characteristics of NiO:42–44 The β-phase possesses an isostructure of the brucite Mg(OH)2 while the α-Ni(OH)2 constitutes stacking β-Ni(OH)2 parallel to ab-plane intercalated by water molecules (see Fig. 1f). A first indication on the formation of either α or β polymorph is provided by thermal analysis, i.e. DSC (Fig. 2d). The first exothermal peak in DSC at 225 °C indicates the transformation of Ni(OH)2 to NiO NS. NiO NP and NiO NF on the other hand are formed upon thermally annealing of Ni(OH)2 at 390 and 350 °C, respectively. The significant weight loss of NiO NS at relatively low temperatures is due to the loss of surface adsorbed water (T ≈ 100–150 °C) which is a characteristic of β-Ni(OH)2: surface water and incorporated water in β-Ni(OH)2 can be completely removed at T ≈ 160 °C.42 In contrast, a notable weight loss starting at higher temperature of 300 °C for either NiO NP and NiO NF indicates that α-Ni(OH)2 are the pre-formed nickel hydroxide for both nanostructures.42 α-Ni(OH)2 is always hydrated by intercalated water, which is intrinsic to their structure (α-Ni(OH)2·xH2O), so that higher temperatures, T ≈ 240–300 °C, are required to remove the water.42,44
Raman spectroscopy is used to further assess the Ni(OH)2 polymorphs preforming NiO (Fig. S3 and S4 in ESI†). Raman spectra of preformed-NiO NS show characteristics of β-Ni(OH)2: Raman peaks at 441, 607, and 900 cm−1.42–44 Raman spectra of preformed-NiO NF and NiO NP exhibit in addition to the features of β-Ni(OH)2 the Raman peaks characteristic for α-Ni(OH)2, i.e. at 1050, 1565, and 3300 cm−1.43–45 Finally, all NiO nanostructures present the typical Raman peaks for cubic NiO single crystals at 419, 509, 875, 1010 and 1562 cm−1.
The microstructural properties of NiO nanostructures are assessed by X-ray diffraction (Fig. 3). The diffraction pattern within the range of diffraction angle between 15 and 70° is assigned to the bunsenite-type of NiO, where peaks at 37.25, 43.29, and 62.91° correspond to the (111), (200), and (200) planes, respectively.46–48 Furthermore, all nanostructures show the (200) crystal plane as the preferred orientation indicating that the resultant NiO nanostructures are formed with stoichiometric ratio. In addition, consistent with the analyses by DSC and Raman scattering, the preformed Ni(OH)2 is dominated by β-Ni(OH)2 for NiO NS, while a mixture of α-Ni(OH)2 and β-Ni(OH)2 is observed as the precursor for NiO NP and NiO NF (Fig. 3 and in ESI†). For NiO NS, HRTEM images (Fig. 3c–e) further corroborate the XRD analysis. The HRTEM of NiO NS annealed at 250 °C (phase transformation temperature) reveal a lattice spacing of 0.207 and 0.241 nm characteristic for the (111) and (200) orientations of bunsenite NiO, respectively.
A quantitative analysis yields the microstructural properties, i.e. crystallite size, lattice strain and dislocation density. The crystallite size of NiO NS is estimated by the Debye–Scherrer formula49 to 11.5 nm. According to the Stokes-Wilson approximation50 the lattice strain of NiO NS is 0.0034 and the dislocation density of NiO NS amounts to 9.4 1015 lines per m2. Compared to other nanostructures, the lattice strain and dislocation density in NiO NS is lower (see ESI†) indicating a low density of defects. Furthermore, different defects, which are (at least to some extent) characteristic for each of the NiO nanostructures, yield distinct electronic properties, e.g. indicated by the distribution of charge density within the crystal structure as revealed in the 3D (inset of XRD pattern) and 2D Fourier maps (Fig. 3, right panel). As shown, the positive charge density dominates the Fourier maps indicating hole as majority carriers in p-type NiO. For NiO NS, the highest positive charges density (0.59 e Å−3) are largely localized at either O and Ni atoms. A similar charge density distribution is found in NiO NP (Fig. S5 in ESI†) while in NiO NF both high positive (26.0 e Å−3) and negative (−9.1 e Å−3) charge density is delocalized in the space of the unit cells, indicating the possible intercalation of impurities. This is at least plausible when considering the growth of NiO NF predominantly from α-Ni(OH)2. These differences in charge density distribution within the unit cells of NiO might affect its affinity towards binding sensitizers51,52 onto the surface of the photocathode materials (vide infra).
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| Fig. 4 (a) UV/vis absorption and emission (inset) of NiO NS, NiO NP, and NiO NF. Emission spectra were recorded upon excitation at 310 nm. (b) Cyclic voltammogramms of NiO recorded after 20 cycles of measurement at scan rate of 100 mV s−1 using 0.2 M KCl as the supporting electrolyte and 0.01 M KH2PO4 and 0.01 M K2HPO4 as the buffer. (c) The trapping states densities originating from bulk traps (black) and surface traps (blue) of NiO NF, NiO NP, and NiO NS. The trapping state density distribution is derived from the open-circuit voltage decay (OCVD) measurement (Fig. S11 in ESI†). | ||
The cyclic voltammogramm of NiO NS (Fig. 4b) shows two oxidation peaks at 0.58 and 1.01 V (vs. Ag/AgCl) which can be attributed to Ni2+/Ni3+ and Ni3+/Ni4+, respectively. The diverging current above 1.2 V is due oxygen evolution (2OH− → H2O + 1/2O2 + 2e−).56 The electrochemical data is used to assess the basic functionality of the NiO nanostructures to serve as material in a dye-sensitized photocathode (vide infra). The driving force for hole injection ΔGinj = e[EVB(NiO) − {E0–0(S*) + E(S/S−)}] is estimated by taking into account the flat band potential (Fig. S8, in ESI†).57,58 The flat band potential of NiO NS is found at 0.52 V vs. Ag/AgCl at pH 7 which is comparable to the value of 0.47 V vs. Ag/AgCl, which is reported in literature.58 When organic dye P1 is considered as photosensitizer (E0–0 (S*) = 2.25 eV, and E(S/S−) = −0.767 V vs. NHE),17 NiO NS yield ΔGinj = −0.764 eV. This estimation presents a preliminary indication that NiO NS are suitable for the preparation of photocathodes. Furthermore, the trapping states in NiO, which act as recombination centers and affect the hole mobility in the material, are evaluated using the open circuit voltage decay (OCVD).36 The density of trapping states in NiO (Fig. 4d) generally shows a non-exponential VB tail due to the complex band structure with multiple valence bands (3d band of Ni2+ and 2p band of O2−).31,59 The density of bulk traps (BTs, in Fig. 4c) is similar for all investigated NiO nanostructures. These bulk traps allow release of a trapped hole to the valence band at room temperature. Surface traps (STs) on the contrary release trapped holes to either valence band or other acceptor species, for example, the oxidized species in electrolyte. In a good agreement with the minimum VO2+ and Oi defect emission in NiO NS, the corresponding density of STs in NiO NS is also the lowest of amongst all investigated nanostructures, reflecting the minimized density of recombination centres.
As a next step towards evaluating different NiO nanostructures as materials for photocathodes, their sensitization by various molecular photosensitizer is discussed: Table 1 summarizes the dye loading and other important physical properties of the photocathodes. BET measurement shows that the specific surface area of NiO NS is moderate with 44.9 m2 g−1. The N2 isotherm adsorption and desorption curve of NiO NS (Fig. S10 in ESI†) indicates the mesoporous character of the semiconductor material (pore diameter between 2 and 50 nm). This observation is supported by BJH (Barret–Joyner–Halenda) analysis, which reveals a peak pore radius of NiO NS of 5.7 nm. The resultant pore volume of the NS, 0.064 cc g−1, is the largest amongst the different NiO nanostructures compared. Grafting of the organic dye P1 with carboxylic anchoring group (Fig. 5) on the NiO nanostructures yields dye loading of 41.0, 15.1, and 7.9 nmol cm−2 for NiO NS, NiO NP, and NiO NF, respectively (obtained from the dye desorption test, see Experimental section). Despite the fact that NiO NF displays a higher surface area, the dye-loading does not scale with the surface area (see Table 1): NiO NS exhibit three (vs. NiO NP) or five times (vs. NiO NF) higher dye-loading irrespective of the dye's specific anchoring groups (i.e. Copper complex bearing pyridine anchoring group (Cu1), RuII complex bearing phosphonic acid (Ru1) and methyl-ester (Ru2) anchoring group, see Table 1), which is consequently profitable for current generation when used as photocathodes.
| NiO | Efb (vs. Ag/AgCl)/V | S/m2 g−1 | rS/nm | VS/cc g−1 | d/μm | Dye-loading/nmol cm−2 | |||
|---|---|---|---|---|---|---|---|---|---|
| –COOH (P1) | –C5H4N (Cu1) | –POOH (Ru1) | –COOH (Ru2) | ||||||
| NS | 0.51 | 44.9 | 5.7 | 0.064 | 1.62 | 41.0 | 3.1 | 18.3 | 20.6 |
| NP | 0.44 | 21.2 | 4.7 | 0.050 | 1.05 | 15.1 | 1.0 | 8.3 | 12.7 |
| NF | 0.36 | 120.9 | 2.1 | 0.056 | 2.27 | 7.9 | 0.7 | 2.0 | 6.9 |
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| Fig. 5 Different molecular structures of photosensitizers bearing different anchoring groups used for dye-loading studies on NiO nanostructures. | ||
This seemingly contradictory behaviour can be related to the microstructure and electronic properties discussed earlier. The different dye-loading capacity can be rationalized by the different affinity of NiO surface toward different anchoring groups of dye photosensitizers.60–64 As revealed in charge density maps (Fig. 3a), the positive charge density of NiO NS is mainly localized on either the O or Ni atom and hence, it is advantageous since binding modes of phosphonic and carboxylic acid anchoring group toward NiO surface are determined by the formation of strong P–O–Ni and C–O–Ni covalent bonds, respectively.52–54 Electrostatic interaction between pyridine anchoring moiety and non-polar plane (100) of NiO may occur for sensitization although the binding strength is lower than the interaction between either carboxylic or phosphonic acid and NiO, and hence, it results in a lower dye-loading compared with other complexes.60,61
| NiO structure | EIS | OCVD | J–V | |||||||
|---|---|---|---|---|---|---|---|---|---|---|
| Rrec/kOhm | Ln/L | τVB/s | τ1/s (A1) | τ2/s (A2) | Jsc/mA cm−2 | Voc/V | FF | η/% | Γ/mA cm−3 | |
| NS | 5.23 | 1.89 | 0.37 | 1.8 (0.59) | 17 (0.41) | 3.95 | 0.121 | 0.31 | 0.145 | 0.81 |
| NP | 2.56 | 1.57 | 0.26 | 2.8 (0.36) | 21 (0.64) | 0.64 | 0.115 | 0.32 | 0.023 | 0.17 |
| NF | 2.30 | 1.03 | 0.21 | 0.5 (0.34) | 9.4 (0.66) | 0.34 | 0.156 | 0.28 | 0.015 | 0.14 |
The performance of DSSCs using different NiO nanostructures is further evaluated by electrochemical impedance spectroscopy (EIS, Fig. 6b). According to an impedance study on dye-sensitized NiO solar cells by Wu and co-workers,14,26 the Nyquist plots (Fig. 6b) show two semicircles attributed to (i) electron transfer at the NiO/dye/electrolyte interface and within the NiO film (charge transfer resistance R2 ∼ Rct, bigger semicircle in the frequency range of 1 to 103 Hz) and (ii) electron ejection at the counter electrode/electrolyte interface and the transport in the electrolyte (R1 ∼ Rtr, smaller semicircle in the frequency range of 103 to 105 Hz). By fitting an equivalent circuit model (Fig. 6c)18 to the impedance data the recombination resistance (Rrec), the effective diffusion length (Ln/L), and the hole lifetime (τ) can be quantified. The thus obtained values are summarized in Table 2.
NiO NS show two times higher recombination resistance than other nanostructures, i.e. the overall interfacial recombination is minimized in NiO NS. The effective diffusion length (Ln/L = 1.89), which is highest in NiO NS, indicates that NiO NS electrodes can be prepared with a thickness of up to 1.9 times higher than the thickness of the electrodes used in this study (ca. 1.5 μm) without affecting the charge collection efficiency. The higher ratio Ln/L also reflects the increased hole transport within NiO NS electrodes. Finally, the hole lifetime (τVB) in NiO NS, which characterizes the recombination rate between the non-geminate holes in the VB edge and the extended band gap with the acceptor species, is the longest of all investigated structures.
Cathodic photocurrents were measured under visible light irradiation (Fig. 7b) likely associated with the reductive quenching mechanism shown in Fig. 7a: upon photoexcitation of T1, a hole is injected from its excited state to the VB of NiO creating a charge-separated states between radical anion T1− immobilized on NiO and photoinjected hole (T1−|NiO(h+)). Hole injection was indeed previously shown to occur on the subpicosesond timescale for F108-templated NiO films sensitized with T1.39 Subsequently, the CoIII irreversible electron acceptor present in solution is reduced by thermal electron transfer from T1−, thus regenerating T1. The net photocurrent is determined by the efficiencies of hole injection, dye regeneration, and more importantly the stability of charge-separated states.9–11 According to literature,61 the Gibbs free energies for both hole injection into the NiO valence band (ΔGing) and dye regeneration (ΔGreg) are exergonic. The driving force ΔGreg is estimated to −1.09 V by ΔGreg = e[E(T1/T1−) − E(CoIII/CoII)], where E(T1/T1−) and E(CoIII/CoII) are −1.77 and −0.68 V vs. Fc+/0, respectively. However, the driving force of hole injection can vary because the morphology dependent VB potential. The estimated ΔGinj = e[EVB(NiO) − {E(T1/T1−) + E0–0}] for NiO NS is −0.27 eV enabling efficient hole injection into NiO NS.
Fig. 7b shows the photocurrents recorded using different NiO photocathodes. The photocathode based on NiO NS generates photocurrents of 23 μA cm−2. The significant drop in photocurrent when comparing NiO NF to NS (drop of more than 1700%) can be associated with the inferior dye-loading: 17.4 nmol cm−2 of the dye are chemisorbed on NiO NS, i.e. the loading is about 800% higher than in NiO NF (1.9 nmol cm−2). Other factors that might also contribute the superior performance of the NiO NS cathode are more efficient hole injection and a higher charge collection efficiency due to increased hole mobility. The photocurrent in the NiO NS-based DSPEC performs comparably to commercially available NiO films with an average photocurrent of 30 μA cm−2 (Fig. S12† in ESI†).
Footnote |
| † Electronic supplementary information (ESI) available. See DOI: 10.1039/c9ra08785k |
| This journal is © The Royal Society of Chemistry 2019 |