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Correction: Focused ion beam milling of self-assembled magnetic superstructures: an approach to fabricate nanoporous materials with tunable porosity

Verner Håkonsen a, Gurvinder Singh bc, Jianying He a and Zhiliang Zhang *a
aNTNU Nanomechanical Lab, Department of Structural Engineering, Norwegian University of Science and Technology (NTNU), Trondheim 7491, Norway. E-mail: zhiliang.zhang@ntnu.no
bDepartment of Materials Science and Engineering, Norwegian University of Science and Technology (NTNU), Trondheim 7491, Norway
cSchool of Aerospace, Mechanical and Mechatronic Engineering, University of Sydney, Sydney, NSW 2008, Australia

Received 10th January 2019 , Accepted 10th January 2019

First published on 23rd January 2019


Abstract

Correction for ‘Focused ion beam milling of self-assembled magnetic superstructures: an approach to fabricate nanoporous materials with tunable porosity’ by Verner Håkonsen et al., Mater. Horiz., 2018, 5, 1211–1218.


The axis labels of Fig. 3f and 4f were not displayed in the originally published version of the manuscript. The correct versions of Fig. 3 and 4 are shown below.
image file: c9mh90005e-f3.tif
Fig. 3 Tuning the porosity of the resulting pore network during ion beam exposure of superstructures composed of nanospheres, by controlling the ion beam voltage at a constant dose of 0.5 nC μm−2. (a–e) Show SEM micrographs of the resulting pore network after ion beam exposure at 2, 5, 10, 20 and 30 kV, respectively. (f) The measured pore sizes were fitted to a lognormal distribution, and mean values were found to increase in a linear manner with increasing ion beam voltage.

image file: c9mh90005e-f4.tif
Fig. 4 Tuning the porosity of the resulting pore network during ion beam exposure of superstructures composed of nanocubes, by controlling the ion beam voltage at a constant dose of 0.5 nC μm−2. (a–e) Show SEM micrographs of the resulting pore network after ion beam exposure at 2, 5, 10, 20 and 30 kV, respectively. (f) The measured pore sizes were fitted to a lognormal distribution, and mean values were found to increase in a linear manner with increasing ion beam voltage.

The authors would also like to correct a mistake in the Introduction. On page 1211, in the first paragraph of the Introduction the sentence “Here, we fabricate self-assembled superstructures in different morphologies from magnetic nanoparticles of different shapes, and investigate their interaction with a Ga+-ion beam by means of the focus ion beam (FIB) milling technique.” should read “Here, we fabricate self-assembled superstructures in different morphologies from magnetic nanoparticles of different shapes, and investigate their interaction with a Ga+-ion beam by means of the focused ion beam (FIB) milling technique.”

The Royal Society of Chemistry apologises for these errors and any consequent inconvenience to authors and readers.


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