Open Access Article
Kenichi
Hayashida
*a and
Yasuhiro
Takatani
b
aMaterials and Processing Dept. II, Toyota Central R&D Labs., Inc., Nagakute, Aichi 480-1192, Japan. E-mail: e1440@mosk.tytlabs.co.jp
bMaterials Analysis and Evaluation Dept., Toyota Central R&D Labs., Inc., Nagakute, Aichi 480-1192, Japan
First published on 29th March 2016
A series of poly(methyl methacrylate)-grafted ZnO nanoparticles (PMMA–ZnO) were synthesized using a surface-initiated polymerization technique and the optical and dielectric properties of PMMA–ZnO were studied. The dielectric constant εr′ of PMMA–ZnO thin films was highly increased by irradiation of UV light. It is indicated that electrons in the ZnO nanoparticles are excited from a valence band to a conductive band by absorption of UV light, resulting in a large increase in εr′ owing to Maxwell–Wagner polarization of the resultant free electrons. On the other hand, the dissipation factor (tan
δ) of PMMA–ZnO is very low and almost constant during UV irradiation because PMMA–ZnO is electrically insulated by the grafted PMMA chains on the ZnO nanoparticles. Also, it was confirmed that due to the grafted PMMA chains, PMMA–ZnO nanocomposites exhibited low light scattering in addition to strong absorption of UV light. The low light scattering of PMMA–ZnO would enhance the absorption efficiency of UV light and therefore contribute to the large increase in εr′ for PMMA–ZnO. Thus, PMMA–ZnO is a promising material for high sensitivity and low loss UV light sensors using the change in εr′.
Here, we suggest a composite system where semiconductor particles are incorporated in a polymer matrix. It is known that the conductivity of some semiconductors is strongly enhanced by absorption of light because electrons are excited from a valence band to a conductive band.18 Therefore, during light irradiation, the polymer/semiconductor composite should exhibit a high εr′ owing to Maxwell–Wagner polarization of the resultant free electrons.19 Unfortunately, it is expected that the dielectric loss of the composite simultaneously becomes very large owing to leak current by the free electrons. Generally, for polymer/inorganic particle composite systems, three-dimensional networks of inorganic particles are formed in the polymer matrix because interaction between the inorganic particles is stronger than that between the inorganic particles and the matrix polymer.9,20 For the polymer/semiconductor composite under light irradiation, therefore, the large leak current would be caused through the conductive networks of semiconductor particles. If the individual semiconductor particles are isolated and uniformly distributed in the polymer matrix, the composite should be electrically insulated to be a low-loss dielectric material. A successful method of insulation would be polymer grafting on the semiconductor particles. It has been reported that even carbon nanotubes with very high conductivity can be insulated by polymer grafting.21–23
In order to obtain a large εr′ change Δεr′ for the polymer/semiconductor composite, it is desirable that the intrinsic εr′ of the semiconductor is small enough in addition to high conductivity during light irradiation. The larger Δεr′ provides better sensitivity of the light sensor. Furthermore, in terms of absorption efficiency of light for the composite, the smaller diameter of the semiconductor particles is desirable because of low scattering of light by the particles. Based on the above, ZnO is one of the most promising candidates for semiconductors with a variable εr′. ZnO exhibits strong absorption of ultraviolet (UV) light,24,25 and the εr′ of pure ZnO is as low as about 10.26 In addition, a variety of ZnO nanoparticles are commercially and inexpensively available.24,25
In this study, poly(methyl methacrylate) (PMMA) was grafted on ZnO nanoparticles using a surface-initiated atom transfer radical polymerization (SI-ATRP) technique.27 The optical and dielectric properties of the PMMA-grafted ZnO nanocomposites (PMMA–ZnO) were compared to those of conventional nanocomposites prepared by blending PMMA with the initiator-modified ZnO nanoparticles (PMMA/ZnO). We demonstrated that PMMA–ZnO exhibits a large Δεr′ by irradiation of UV light with a low dissipation factor (tan
δ). To the best of our knowledge, this is the first report on polymer/semiconductor composites with a variable εr′ by light irradiation although many studies have been reported on the dielectric properties of polymer/semiconductor composites such as polymer/ZnO composites.28–37
Amine-modification of the ZnO nanoparticles: trimethoxy[3-(methylamino)propyl]silane (840 μl, 4.3 mmol) was added to the ZnO nanoparticles (10 g) homogeneously dispersed in dimethylformamide (DMF) (97 ml) containing a small amount of water (0.5 ml). The dispersion was sonicated and kept at 50 °C for 6 h. The amine-modified ZnO nanoparticles (ZnO–NHMe) were purified by 3 cycles of centrifugation and redispersion in acetonitrile (AN).
Immobilization of ATRP initiators on the ZnO nanoparticles: p-(bromomethyl)benzyl 2-bromoisobutylate (BBnBiB)27 (1.0 g, 2.9 mmol) and 1,8-bis(dimethylamino)naphthalene (0.60 g, 2.8 mmol) were added to ZnO–NHMe (16 g) dispersed in AN (95 ml). The mixture was sonicated and kept at 40 °C for 12 h. The initiator-modified ZnO nanoparticles (ZnO–Br) were purified by 3 cycles of centrifugation and redispersion in DMF.
SI-ATRP from the ZnO nanoparticles: the following is an example. N,N-Dimethylacetamide (90 ml) was added to ZnO–Br (16.8 g) and CuBr (14.3 mg, 100 μmol) in a N2 atmosphere. After sonication of the mixture, 2,2′-bipyridyl (46.8 mg, 300 μmol) in methyl methacrylate (60 ml) was added, and the dispersion was kept at 60 °C for 2.5 h. The resultant core–shell nanoparticles (PMMA–ZnO) were precipitated in methanol and freeze-dried by 1,4-dioxane.
PMMA/ZnO nanocomposites were prepared by blending ZnO–Br with PMMA. First, ZnO–Br and the PMMA matrix were added to 1,4-dioxane and homogeneously dispersed by sonication. The dispersion was quickly frozen in liquid nitrogen, and then freeze-dried under vacuum. Subsequently, the preliminary mixed PMMA/ZnO nanocomposites were further kneaded in a molten state. Thus-obtained PMMA/ZnO and PMMA–ZnO nanocomposites were molded into disk-like specimens with a diameter of 33 mm and a thickness of ∼0.52 mm by compression at 120–140 °C.
SEM images of the modified ZnO nanoparticles were obtained using an SEM (S-5500, Hitachi) operated at an accelerating voltage of 1 kV. The cross-section of the molded samples that had been flattened with the argon ion beam using a cross section polisher38 was observed at an accelerating voltage of 2 kV.
Transmission spectra of the disk-like specimens were obtained using a UV-vis spectrophotometer (UV-3600, Shimadzu), where the sample was scanned in the wavelength λ range of 300–800 nm at a resolution of 2 nm.
Complex permittivity of the disk-like specimen was recorded in the frequency range of 102–106 Hz using an LCR meter (E4980A, Agilent) operated at 2 V, where two gold electrodes with a diameter of 27 mm were deposited on the top and bottom of the specimens. In the case of dielectric measurements under UV light irradiation, a thin film of the sample (1–30 μm) was formed from γ-butyrolactone solution using spin-coating on an indium tin oxide (ITO) electrode supported by a glass substrate as shown in Fig. 2. The values of capacitance and tan
δ at 1 kHz were measured after the UV irradiation for 3 min using an LCR meter (IM3523, Hioki) operated at 2 kV. The film thickness was calculated using the capacitance of the thin film and the obtained εr′ for the corresponding disk-like specimen. UV intensity was changed in the range of 0.3–2.2 mW cm−2 by varying the distance between the UV lamp (SLUV-4, AS ONE) and the sample. The actual UV intensity was measured using a UV light meter (UV-340C, CUSTOM).
| Sample | Φ ZnO | PMMA shell thicknessb [nm] |
|---|---|---|
| a Calculated using a density of 5.22 g cm−3 for the ZnO nanoparticles and of 1.19 g cm−3 for the organic components. b Calculated from the average diameter of the ZnO nanoparticles (15 nm) and ΦZnO. | ||
| PMMA/ZnO | 0.054 | — |
| 0.105 | — | |
| 0.173 | — | |
| 0.239 | — | |
| PMMA–ZnO | 0.051 | 13 |
| 0.107 | 8.2 | |
| 0.172 | 6.0 | |
| 0.233 | 4.7 | |
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| Fig. 4 High resolution SEM images of modified ZnO nanoparticles. (a) ZnO–Br. (b) PMMA–ZnO with ΦZnO = 0.11. | ||
Conventional nanocomposites (PMMA/ZnO) were also prepared by blending the ZnO–Br nanoparticles with PMMA, and designed to have the same ΦZnO as PMMA–ZnO. The two types of nanocomposite samples were molded by hot pressing. The dispersivity of the ZnO nanoparticles in the molded specimens was observed by SEM. Fig. 5 shows SEM images of the two types of nanocomposites with ΦZnO = 0.11. For PMMA/ZnO, the ZnO nanoparticles are inhomogeneously dispersed and form agglomerates with a submicron size. In contrast, the dispersivity of the ZnO nanoparticles is surprisingly good for PMMA–ZnO. In the PMMA–ZnO system, the ZnO nanoparticles are forced to be isolated and uniformly dispersed by the grafted PMMA shells.
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| Fig. 5 SEM images of cross-sections of two types of composites with ΦZnO = 0.11. (a) PMMA/ZnO. (b) PMMA–ZnO. | ||
For dielectric measurements, gold electrodes were deposited on the molded specimens by sputter coating. In Fig. 7, εr′ and tan
δ of the two types of nanocomposites at 1 kHz are plotted as a function of ΦZnO. Because of the low εr′ of ZnO (εr′ ≈ 10),26 both the nanocomposites have relatively low εr′s in comparison with PMMA/BaTiO3 composites.4,8,9 In addition, PMMA–ZnO has a smaller εr′ than PMMA/ZnO, resulting from the better dispersivity of the ZnO nanoparticles for PMMA–ZnO. The same phenomenon has already been reported for a PMMA/BaTiO3 composite system, and a detailed explanation is provided.9 Moreover, Wang and Tan have also demonstrated that a composite with agglomerated particles exhibited slightly higher εr′ than that with well-dispersed particles using a simulation method.39
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Fig. 7 (a) Dielectric constant εr′ and (b) dissipation factor (tan δ) of PMMA (diamonds) and two types of composites at 1 kHz as a function of ΦZnO. Gray circles, PMMA/ZnO; black circles, PMMA–ZnO. | ||
δ of the PMMA–ZnO thin films with ΦZnO = 0.17 at 1 kHz after UV light irradiation. As the UV light intensity becomes strong, the εr′ of PMMA–ZnO is highly increased. It is indicated that by absorption of UV light, electrons in the ZnO nanoparticles are excited from a valence band to a conductive band,18 resulting in large Δεr′ owing to Maxwell–Wagner polarization of the resultant free electrons.19 In addition, the εr′ of the PMMA–ZnO thin film becomes lower as the thickness is larger, suggesting that a thickness over 1 μm is too large for UV light to penetrate into the inside of the PMMA–ZnO thin films because UV light is strongly absorbed by the ZnO nanoparticles. Although we also tried to prepare PMMA–ZnO thin films with a thickness less than 1 μm, the reproducibility of the dielectric properties was poor probably because the thickness was excessively inhomogeneous. On the other hand, the tan
δ of PMMA–ZnO is very low and almost constant as shown in Fig. 8b. This is because PMMA–ZnO is electrically insulated by the grafted PMMA chains on the ZnO nanoparticles. The ideal thickness of the PMMA shell is calculated from ΦZnO and the average diameter of the ZnO nanoparticles, and is listed in Table 1. The thick PMMA shell over 5 nm would prevent tunneling conduction between the ZnO nanoparticles by the free electrons according to an impedance analysis reported before.22 In this dielectric measurement, a PMMA/ZnO thin film with ΦZnO = 0.17 was also prepared, and the dielectric properties under UV light irradiation were evaluated in the same manner. During UV light irradiation with an intensity of 2.2 mW cm−2, the tan
δ of the PMMA/ZnO thin film was over 10 which was out of the range of the used LCR meter. This extremely large dielectric loss is due to leak current by the free electrons.
Fig. 9 shows dielectric properties of PMMA–ZnO thin films with a thickness of about 1 μm at 1 kHz after UV irradiation with an intensity of 2.2 mW cm−2. The increase rate for the εr′ of PMMA–ZnO after UV irradiation R was calculated by the following equation: R = Δεr′/εr′0, where εr′0 is the εr′ of PMMA–ZnO before UV irradiation. Δεr′/εr′0 is more than 10% when ΦZnO > 0.1, which is large enough for the capacitive UV light sensor. Furthermore, the tan
δ of PMMA–ZnO is less than 0.12 as shown in Fig. 9b although the tan
δ value is increased when ΦZnO > 0.1. These results demonstrate that PMMA–ZnO has a high sensitivity and a low dielectric loss for the capacitive UV light sensor.
For the application of a UV light sensor, the response speed of εr′ is also important. Fig. 10 shows the response speed of the εr′ of the PMMA–ZnO thin film with ΦZnO = 0.23 to UV irradiation with various intensities. The εr's are sharply increased right after UV irradiation and saturated in a few minutes during UV irradiation. When UV light turns off, the increased εr's are relaxed to the initial value in about 20 minutes. Owing to the low response speed for UV light irradiation, we suggest that the PMMA–ZnO thin films are used for a sunlight sensor that controls outdoor illumination for which no quick response is required. Because the UV intensity in sunlight is around 3 mW cm−2, PMMA–ZnO should have a sufficient sensitivity for sunlight. In fact, we have experimentally confirmed that PMMA–ZnO had a good sensitivity for sunlight. Further investigation on the capacitive UV light sensor using PMMA–ZnO is in progress.
δ) of PMMA–ZnO is very low and almost constant during UV irradiation because PMMA–ZnO is electrically insulated by the grafted PMMA chains on the ZnO nanoparticles. Also, it was confirmed that due to the grafted PMMA chains, PMMA–ZnO nanocomposites exhibited low light scattering in addition to strong absorption of UV light. The low light scattering of PMMA–ZnO would enhance the absorption efficiency of UV light and therefore contribute to the large increase in εr′ for PMMA–ZnO. Thus, PMMA–ZnO is a promising material for high sensitivity and low loss UV light sensors using the change in εr′.
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