Quanchao Weia,
Qingzhong Li*a,
Jianbo Chenga,
Wenzuo Lia and
Hai-Bei Li*b
aThe Laboratory of Theoretical and Computational Chemistry, School of Chemistry and Chemical Engineering, Yantai University, Yantai 264005, People's Republic of China. E-mail: liqingzhong1990@sina.com
bSchool of Ocean, Shandong University, Weihai 264209, People's Republic of China. E-mail: lihaibei@sdu.edu.cn
First published on 15th August 2016
A theoretical study of the complexes formed by dimethylsulfoxide (DMSO) with ZF3X (Z = C and Si; X = halogen) has been performed at the MP2/aug-cc-pVTZ level. Three local minima were found on the potential surface of complex DMSO–ZF3X, forming tetrel bonds and halogen bonds with O⋯Z and O⋯X contacts, respectively. The halogen-bonded complexes are more stable for CF3X than for SiF3X with an exception of CF4, on the contrary, the tetrel-bonded complexes DMSO–SiF3X are more stable than the analogues DMSO–CF3X. The strength of the tetrel bonds in DMSO–CF3X has a small dependence on the nature of the halogen atom, and DMSO–SiF3X has an abnormal dependence on it. Surprisingly, the tetrel bond in DMSO–SiF3X is stronger than that with an anion as the electron donor, exhibiting a partially covalent bond nature. A red shift was observed for the SO stretch vibration in most complexes, particularly in the tetrel-bonded complexes of DMSO–SiF3X. The Z–X stretch vibration exhibits a red shift in the tetrel bond but an irregular shift in the halogen bond.
The formation of tetrel bonding can be explained with the term “σ-hole” (a region with positive electrostatic potentials) on the covalent-bonded Group 14 atom proposed by Politzer and coauthors.5 The magnitude of the σ-hole on the Group 14 atom can be tuned through changing the atom of Group 14 or the remainder of the molecule, that is, it will be more positive in going from the light to the heavy (more polarizable) atoms in the Group 14 atom, and as the electron-withdrawing ability of the remainder of the molecule becomes larger.6 The interaction between the σ-hole on the Si atom and the lone pair on the N atom logically explains the Si–O–N angle contraction in XYZSi–O–N(CH3)2.7 The six cyclic silicon atoms in perhalocyclohexasilane Si6X12 (X = Cl or Br) form a planar hexagon with the two halide anions via the formation of the anion⋯Si tetrel bonding interactions,8 similarly the case for the complexes of Si5Cl10 with organocyanides due to the existence of N⋯Si interactions.9 The nature of both interactions in these complexes were then studied theoretically.10,11 It was demonstrated that the Lewis acid⋯base interactions between Si6H12 and the carbonyl groups of amphiphilic invertible macromolecules is responsible for the stable composition of both molecules in solution.12,13
The aqueous solutions of dimethylsulfoxide (DMSO) have been frequently studied both experimentally and theoretically14–18 due to their unique biological and physicochemical properties. DMSO is an effective solvent not only for polar solutes but also for aromatic compounds due to the arrays of positive and negative sites in DMSO which give rise to a variety of simultaneous intermolecular electrostatic interactions.19 Recently, the interactions between DMSO and ionic liquids have also attracted much attention,20–22 in which hydrogen bonding is a main driving force. In addition, DMSO can form halogen bonding, which can compete with hydrogen bonding,23–25 with dihalogen molecules26 and halobenzene23 investigated with excess infrared spectroscopy and quantum chemical calculations. It has been demonstrated that some oxygen-containing molecules can act as an electron donor in tetrel bonds.27–34 As a common solvent, little study is performed for tetrel bonding with DMSO as the electron donor. It is necessary to investigate the structures, properties, and nature of tetrel bonds involving DMSO.
In this paper, we study the complexes of DMSO and ZF3X (Z = C and Si; X = halogen) with quantum chemical calculations. To the best of our knowledge, neither theoretical nor experimental data regarding the structural information of the interaction of DMSO with ZF3X are available in the literature. This work presents a detailed examination of the stabilities, electronic structures, and vibrational frequencies of these complexes. Our aim is to predict and characterize the tetrel bond and to compare it with the halogen bond in the complexes consisted of molecules ZF3X and DMSO.
Molecular electrostatic potentials (MEPs) on the 0.001 electrons Bohr−3 contour of electronic density were obtained at the MP2/aug-cc-pVTZ level with the wavefunction analysis-surface analysis suite (WFA-SAS) program.38 Electron densities of complexes have been analyzed by employing the Atoms in Molecules (AIM) methodology39 with the AIM2000 program.40 Natural Bond Orbital (NBO) method41 has been used to obtain natural atomic charges and analyze charge–transfer interactions between occupied and virtual orbitals at the WB97XD/aug-cc-pVDZ level. In addition, energy decomposition analysis (EDA) was carried out to obtain a deep insight into the nature of the interactions using GAMESS program42 with the localized molecular orbital-energy decomposition analysis (LMOEDA) method43 at the MP2/aug-cc-pVTZ level.
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Fig. 1 Molecular electrostatic potentials of SiF3Br. Color ranges, in kJ mol−1, are: red, greater than 105; yellow, between 105 and 52; green, between 52 and 0; and blue, less than 0. |
The most positive MEPs (Vmax) of the σ-holes on both the extension of Z–X bond and the outer side of the X atom in ZF3X are collected in Table 1. No σ-hole is found on the F atom. For a given X, the Vmax value of the σ-hole on the extension of Si–X is larger than that of C–X due to the lower electronegativity and greater polarizability of Si atom than that of C. Furthermore, the value of this Vmax is also related to the X atom, exhibiting a growing tendency for the lighter X atom. In addition, the Vmax on the X atom is also dependent on the Z atom, and it becomes more positive in CF3X than in SiF3X owing to the larger electronegativity of the C atom. The Vmax on the X atom is more positive than that on the side of C atom in CF3X but less positive than that on the side of Si atom in SiF3X. These values obtained at the MP2/aug-cc-pVTZ level have a consistent variation with those reported at the M06-2X/6-311G(d) level,6 but the values in the latter case are greater than those in the former.
Molecules | Z![]() |
X![]() |
Vmax,Z | Vmax,X |
---|---|---|---|---|
CF3F | C | F | 88.40 | — |
CF3Cl | C | Cl | 71.29 | 88.86 |
CF3Br | C | Br | 70.13 | 106.35 |
CF3I | C | I | 60.47 | 129.95 |
SiF3F | Si | F | 191.03 | — |
SiF3Cl | Si | Cl | 168.85 | 57.02 |
SiF3Br | Si | Br | 162.81 | 77.27 |
SiF3I | Si | I | 151.36 | 101.97 |
Complexes | ΔEpVDZ | ΔEpVTZ | RTB/RXB | α1/α2 | ΔrS![]() |
ΔrZ–X |
---|---|---|---|---|---|---|
CF–TB | −6.59 | −8.10 | 3.259 | 109.4 | 0.001 | 0.006 |
CCl–TB | −5.98 | −7.68 | 3.315 | 110.2 | 0.001 | 0.009 |
CBr–TB | −5.99 | −7.79 | 3.302 | 110.2 | 0.001 | 0.009 |
CI–TB | −5.48 | −7.31 | 3.326 | 110.5 | 0.001 | 0.008 |
SiF–TB | −159.77 | −129.30 | 2.001 | 96.8 | 0.040 | 0.044 |
SiCl–TB | −160.53 | −137.89 | 1.985 | 96.4 | 0.042 | 0.089 |
SiBr–TB | −164.95 | −146.60 | 1.966 | 96.0 | 0.044 | 0.104 |
SiI–TB | −170.24 | −157.11 | 1.946 | 95.3 | 0.046 | 0.122 |
CCl–XB-I | −13.69 | −14.21 | 2.893 | 110.6 | 0.004 | −0.006 |
CBr–XB-I | −19.70 | −19.47 | 2.829 | 110.8 | 0.007 | −0.004 |
CI–XB-I | −29.77 | −28.53 | 2.808 | 111.2 | 0.013 | 0.002 |
SiBr–XB-I | −13.51 | −12.88 | 3.088 | 110.6 | 0.004 | −0.002 |
CCl–XB-II | −14.60 | −15.14 | 2.861 | 110.9 | 0.004 | −0.005 |
CBr–XB-II | −20.85 | −20.72 | 2.796 | 111.0 | 0.007 | −0.002 |
CI–XB-II | −30.83 | −30.02 | 2.777 | 111.4 | 0.012 | 0.005 |
SiCl–XB-II | −7.92 | −9.58 | 3.105 | 111.0 | 0.002 | −0.003 |
SiBr–XB-II | −14.12 | −13.14 | 3.045 | 111.0 | 0.004 | −0.001 |
SiI–XB-II | −21.54 | −19.58 | 2.989 | 111.5 | 0.007 | 0.004 |
The interaction energies of tetrel and halogen bonds are obtained at both MP2/aug-cc-pVDZ and MP2/aug-cc-pVTZ levels. For the tetrel bond, the interaction energy at the MP2/aug-cc-pVTZ level is a little larger than that at the MP2/aug-cc-pVDZ level for the complexes CX–TB. On the contrary for SiX–TB, it is larger at the MP2/aug-cc-pVDZ level than at the MP2/aug-cc-pVTZ level. The possible reason is that a larger deformation of SiF3X is found at the former level. For the halogen bond, the interaction energies at both levels are nearly the same. Therefore, the basis sets used on the interaction energy is slightly different for the tetrel bond interactions. The following discussion on the interaction energy is based on the MP2/aug-cc-pVTZ results.
It is obvious from Table 2 that the interaction energy of SiX–TB is far more negative than that of CX–TB, indicating that SiF3X forms a very stronger tetrel bond with DMSO than CF3X. This result is in a line with the variation of the positive MEP on the σ-hole of the Z atom, showing the role of electrostatic interaction in the formation of tetrel bond. However, a comparative analysis shows that the ratio of the interaction energy between SiX–TB and CX–TB is much larger than that of the positive MEP on the σ-hole of the related Z atom between SiF3X and CF3X. We attribute this to the structural deformation of SiF3X. The stronger tetrel bond corresponds to the larger deformation of SiF3X, characterized with a smaller angle ∠F–Si–X.
The positive MEP on the σ-hole of the C atom in CF3X shows an obvious decrease as the electronegativity of X becomes smaller, but the interaction energy of the related tetrel bond does not exhibit a remarkable reduction. We attribute this to another interaction present in the complexes CX–TB. In view of the conformation of CX–TB, we anticipate it may be an organic fluorine hydrogen bond C–F⋯H–C interaction, which is shown with a green disk between the H atom of DMSO and the F atom of CF3X (Fig. 3). The F⋯H distance is 2.840, 2.792, 2.771 and 2.729 Å for X = F, Cl, Br and I, respectively, showing an enhancing order of the F⋯H interaction. The C–F⋯H–C interaction and the tetrel bond complement each other, which results in a small change of the interaction energy in CX–TB as X is varied.
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Fig. 3 Gradient isosurfaces (s = 0.1 au) in the complexes of CF3X (X = F, Cl, Br, and I). Green and orange areas correspond to weak attractive and weak repulsion interactions, respectively. |
The interaction energies of tetrel bonds are −129.30, −137.89, −146.60 and −157.11 kJ mol−1 in SiX–TB (X = F, Cl, Br, and I, respectively). Clearly, with the increase of X atomic mass, the interaction energy of tetrel bond increases in SiX–TB, inconsistent with the positive MEP on the σ-hole of the Si atom in SiF3X. This indicates that the structural deformation of the monomer and other contributions including a F⋯C interaction (see the AIM analysis) are also very important in the formation of the O⋯Si tetrel bond although the electrostatic interaction is a main driving force (see the section of energy decomposition). Such abnormal dependence on the nature of halogen atom was also found in pnicogen-bonded complexes of silylene and YH2X (Y = P, As, and Sb; X = F, Cl, Br, and I).44 Surprisingly, the interaction energy of tetrel bond in SiX–TB is more negative than that in SiF4⋯Cl− [4], where an anion usually acts as a strong electron donor. In contrast, the interaction energy in CX–TB is less negative than that in CF4⋯Cl−.4 It is known that DMSO has a large dipole moment (>4 Debye). The electronic distribution of Si in SiF3X is more dispersive than that of C in CF3X. Consequently, DMSO causes a greater polarization on the Si atom than on the C analogue and the former forms a stronger tetrel bond with DMSO. In addition, we think that an S⋯Si tetrel bond may be possible between DMSO and SiF3X (Fig. S1†). However, this S⋯Si interaction is weaker than the O⋯Si tetrel bond due to the small negative MEP on the S atom of DMSO.26 Thus the S⋯Si tetrel-bonded complexes are not studied here.
From Table 2, the halogen bond becomes stronger in ZX–XB-I/-II as Z is smaller and X is larger, consistent with the positive MEP on the σ-hole of the X atom in ZF3X. The structure of SiCl–XB-I is not obtained, and it is optimized to be the S⋯Si bonded structure (Fig. S1†). The structure of SiI–XB-I can be obtained at the MP2/aug-cc-pVDZ level, and it is changed to be SiI–XB-II at the MP2/aug-cc-pVTZ level. This shows that the complex ZX–XB-II is more stable than ZX–XB-I, evidenced with the larger interaction energy in the former. It is obvious from Table 2 that the interaction energy of halogen bond in the CF3X system is larger than that of tetrel bond, while in the SiF3X system the former interaction is much weaker than the latter. As a result, DMSO is favorable to bind with CF3X via a halogen bond with an exception of CF4, for which only a tetrel bond is formed, while it prefers forming a strong tetrel bond with SiF3X. A similar conclusion was found in the HCN counterparts.6 However, HCN forms a much weaker tetrel bond with SiF3X than DMSO, due to the greater polarization ability of DMSO than HCN.
From Table 1, the O⋯Z distance shows a consistent change with the interaction energy of tetrel bond, that is, the larger interaction energy corresponds to a shorter O⋯Z distance. Furthermore, the linear relationship is better for the O⋯Si distance than the O⋯C distance with the interaction energy (Fig. 4). One can see that the interaction energy is more susceptible to the O⋯Si distance. The O⋯Si distance is about 2.0 Å, which is much shorter than the sum of van der Waals radii of both atoms (∼3.6 Å) but is slightly longer than the length of Si–O bond (∼1.6 Å). Accordingly, the O⋯Si tetrel bond exhibits a nature of partially covalent interaction, like the bond in Lewis acid–base complexes HCN–BF3 and HCN–SO3.45 Similarly, the stronger halogen bond is related with a shorter O⋯X distance.
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Fig. 4 Interaction energy versus binding distance in the tetrel-bonded complexes of CF3X (up) and SiF3X (down). |
The SO bond is elongated in ZX–TB and ZX–XB as well as that in hydrogen-bonded complexes of DMSO–H2O46 and halogen-bonded complexes of DMSO–dihalogen.26 The elongation of S
O bond is very small (0.001 Å) in CX–TB due to the weak tetrel bond, while this double bond suffers a large elongation in the strong tetrel-bonded complex of SiX–TB as well as in the strong halogen-bonded ones. Upon complexation of a tetrel bond, the Z–X bond is extended. The extension of Si–X bond is much larger in SiX–TB than that of C–X bond in CX–TB. The extension of C–X bond displays an irregular variation with the different X and the magnitude of the tetrel bond; in remarkable contrast, the extension of Si–X bond shows an increasing tendency with the enhancement of tetrel bond. The formation of halogen bond causes an elongation or a contraction of Z–X bond. In addition, the change of Z–X bond in the halogen-bonded complexes is smaller than that in the tetrel-bonded ones.
Complexes | ΔvS![]() |
ΔvZ–X | δZ/δX | δF |
---|---|---|---|---|
a Note: δZ/δX is δZ in the TB system and δX in the XB system. | ||||
CF–TB | −3 | −33 | −0.46 | −1.97 |
CCl–TB | −5 | −18 | −0.84 | −3.38 |
CBr–TB | 7 | −28 | 0.01 | −4.02 |
CI–TB | 2 | −23 | 0.02 | −4.96 |
SiF–TB | −132 | −164 | 19.01 | −26.08 |
SiCl–TB | −133 | −321 | 30.06 | −32.96 |
SiBr–TB | −134 | −28 | 32.83 | −34.96 |
SiI–TB | −136 | −9 | 38.23 | −37.35 |
CCl–XB-I | −14 | 10 | −14.54 | 3.16 |
CBr–XB-I | −24 | 15 | −23.06 | 6.74 |
CI–XB-I | −40 | 20 | −9.10 | 12.41 |
SiBr–XB-I | −13 | 0 | −27.86 | 0.27 |
CCl–XB-II | −12 | −2 | −13.79 | 3.20 |
CBr–XB-II | −21 | −6 | −16.13 | 7.15 |
CI–XB-II | −35 | −9 | −9.90 | 13.54 |
SiCl–XB-II | −4 | −1 | −19.47 | 0.05 |
SiBr–XB-II | −12 | −1 | −44.70 | 0.35 |
SiI–XB-II | −21 | −1 | −10.57 | 1.90 |
The Z–X stretch vibration exhibits a red shift in the tetrel-bonded complexes, consistent with the stretching of the Z–X bond. The elongation of Z–X bond is large in SiX–TB, but the red shift of Z–X stretch vibration is much small in SiBr–TB and SiI–TB due to the heavier mass of Br and I atoms. In the halogen bond, the Z–X stretch vibration displays a small blue shift in CX–XB-I, no shift in SiBr–XB-I and a small red shift in ZX–XB-II. A blue-shifting halogen bond has been reported in the complexes of CF3X with NH3, H2O, and anions, where the authors mentioned that the blue-shifting halogen bond is much more ubiquitous in the halogen-bonded complexes than the blue-shifting hydrogen bond in the hydrogen-bonded complexes.47,48
The formation of CX–TB makes the chemical shielding of the C atom in CF3X nearly no shift, while the strong tetrel bond in SiX–TB shifts the signal of the silicon atom involved to the higher field, such as up to 38.23 ppm in SiI–TB. This shift is reverse to that of the proton in hydrogen bonds.24 However, the formation of a tetrel bond results in a shift of the F atom to the lower field in ZX–TB. This lower shift is small in CX–TB but large in SiX–TB. These lower shifts of the F atoms in the tetrel-bonded complexes can be observed experimentally. The signal of the F atom involved in the halogen bond shows a reverse shift to that in the tetrel bond. The different halogen atom exhibits a shift to the lower field in all halogen bonds.
Complexes | CT | E1 | E2 | WBI |
---|---|---|---|---|
a Note: CT is the sum of charge on all atoms of DMSO in the complexes. E1 corresponds to the orbital interactions of ![]() ![]() |
||||
CF–TB | 0.001 | 1.29 | 0.75 | 0.003 |
CCl–TB | −0.001 | 1.00 | 0.79 | 0.003 |
CBr–TB | −0.001 | 1.00 | 0.96 | 0.003 |
CI–TB | −0.002 | 0.88 | 1.00 | 0.003 |
SiF–TB | 0.133 | 42.13 | 64.54 | 0.253 |
SiCl–TB | 0.151 | 41.51 | 70.22 | 0.277 |
SiBr–TB | 0.158 | 145.13 | 366.79 | 0.288 |
SiI–TB | 0.163 | 148.81 | 386.52 | 0.299 |
CCl–XB-I | 0.009 | 10.57 | — | 0.014 |
CBr–XB-I | 0.020 | 20.61 | — | 0.028 |
CI–XB-I | 0.038 | 54.26 | — | 0.053 |
SiBr–XB-I | 0.005 | 5.77 | — | 0.011 |
CCl–XB-II | 0.009 | 7.44 | — | 0.016 |
CBr–XB-II | 0.021 | 18.64 | — | 0.033 |
CI–XB-II | 0.041 | 39.79 | — | 0.061 |
SiCl–XB-II | 0.001 | 2.22 | — | 0.007 |
SiBr–XB-II | 0.003 | 5.02 | — | 0.013 |
SiI–XB-II | 0.012 | 11.54 | — | 0.026 |
A charge transfer occurs from DMSO to ZF3X upon the formation of tetrel- and halogen-bonded complexes. The charge transfer is very small in complexes CX–TB, and even becomes negative in CX–TB (X = Cl, Br, and I). We ascribe it to the coexistence of both a tetrel bond and an organic fluorine hydrogen bond C–F⋯H–C interaction in CX–TB, with a reverse direction of charge transfer in both interactions. The O⋯Si tetrel bond in SiX–TB displays a very large charge transfer (0.133–0.163e), confirming its nature of the partially covalent interaction. Moreover, the interaction energy in SiX–TB takes on a nonlinear relationship with the corresponding charge transfer (Fig. 5). The charge transfer in the halogen-bonded complexes is larger than that in CX–TB but is much smaller than that in SiX–TB. In addition, a good linear relationship is found between the charge transfer and the interaction energy of halogen bond (Fig. 5).
![]() | ||
Fig. 5 Interaction energy versus charge transfer in the tetrel- (up) and halogen-bonded (down) complexes. |
The strength of tetrel and halogen bonds can also be measured with WBI. This index is very small in CX–TB but very large in SiX–TB, corresponding to a weak tetrel bond for the former complexes and a strong one for the latter, respectively. Similar with the tendency of the charge transfer as discussed above, the O⋯X halogen bond has a larger WBI than the O⋯C tetrel bond and a smaller one than the O⋯Si tetrel bond. Especially, the WBI of O⋯X halogen bond has a good linear relationship with the interaction energy (Fig. S2†).
In SiBr–TB, there are an O⋯Si BCP and a F⋯C BCP, respectively corresponding to the O⋯Si and F⋯C tetrel bonds. Mani and Arunan pointed out that a methyl group adjoined with an electron-withdrawing group or atom may form a carbon bond with a Lewis base.34 The O and C atoms in DMSO act as the electron donor and acceptor in the O⋯Si and F⋯C tetrel bonds, respectively, thus a positive cooperativity is present between them. The electron density at the O⋯Si BCP is much larger than that at the F⋯C BCP, showing the complex SiBr–TB is mainly stabilized by the O⋯Si tetrel bond. The O⋯Si BCP has a positive Laplacian and a negative energy density, providing a further evidence for the nature of a partially covalent bond.51
In CBr–XB-I and SiBr–XB-I, an O⋯Br BCP and a Br⋯H BCP are found, indicating the coexistence of a halogen bond and a hydrogen bond in both complexes. The Br atom plays a dual role of the Lewis acid and base in the O⋯Br halogen bond and Br⋯H hydrogen bond, respectively. This dual role can be demonstrated by the anisotropic distribution of MEP on the Br atom (Fig. 1). The fact that the hydrogen atom of the methyl group in DMSO can participate in hydrogen bond has been demonstrated in the complexes of DMSO and water.52 According to the value of electron density, it is concluded that the halogen bond in CBr–XB-II is stronger than that in SiBr–XB-II, while the strength of the hydrogen bond is nearly the same in both complexes. The former result is consistent with the positive MEP on the σ-hole of the Br atom in CF3Br and SiF3Br (Table 1).
In CBr–XB-II and SiBr–XB-II, an O⋯Br BCP and two Br⋯H BCPs are observed, confirming the presence of one O⋯Br halogen bond and two Br⋯H interactions. Furthermore, these interactions have an equivalent strength with those in CBr–XB-I and SiBr–XB-I, evidenced with the equivalent electron density at the O⋯Br and Br⋯H BCPs in both types of halogen-bonded complexes. This supports the conclusion that the ZX–XB-II complex is more stable than the ZX–XB-I with the energy difference of −0.93, −1.25, and −1.49 kJ mol−1 for the Cl⋯H, Br⋯H, and I⋯H interactions, respectively.
Complexes | Eele | Eex | Erep | Epol | Edisp |
---|---|---|---|---|---|
CF–TB | −11.50 | −19.69 | 34.49 | −2.22 | −7.65 |
CCl–TB | −9.57 | −19.65 | 34.28 | −2.26 | −9.15 |
CBr–TB | −9.86 | −20.86 | 36.41 | −2.38 | −9.66 |
CI–TB | −8.99 | −21.74 | 37.87 | −2.51 | −10.45 |
SiF–TB | −297.41 | −325.62 | 656.76 | −168.54 | 17.85 |
SiCl–TB | −309.36 | −336.62 | 681.42 | −178.70 | 18.31 |
SiBr–TB | −323.03 | −348.61 | 708.59 | −190.27 | 20.40 |
SiI–TB | −342.26 | −362.70 | 740.99 | −201.48 | 23.16 |
CCl–XB-I | −23.20 | −35.28 | 61.57 | −7.11 | −8.74 |
CBr–XB-I | −38.25 | −58.98 | 104.29 | −13.00 | −10.99 |
CI–XB-I | −62.41 | −95.64 | 169.67 | −25.29 | −11.75 |
SiBr–XB-I | −20.65 | −38.12 | 65.33 | −6.10 | −11.54 |
CCl–XB-II | −26.46 | −41.13 | 72.06 | −8.40 | −9.61 |
CBr–XB-II | −43.97 | −70.39 | 124.98 | −15.51 | −12.87 |
CI–XB-II | −70.31 | −113.61 | 201.81 | −29.97 | −14.34 |
SiCl–XB-II | −13.88 | −27.84 | 47.44 | −4.35 | −9.91 |
SiBr–XB-II | −24.45 | −46.44 | 80.05 | −7.65 | −12.75 |
SiI–XB-II | −43.14 | −76.45 | 132.59 | −15.63 | −14.55 |
The interaction energy of halogen bond is essentially determined by the electrostatic energy and the contributions from the polarization and dispersion energies are also substantial. The ratio of the polarization energy to the dispersion energy is increased with the enhancement of halogen bonding interaction.
The SO stretch vibration in the tetrel-bonded complexes of SiF3X shows a large red shift of about 130 cm−1 and the halogen bond presents a small red shift of S
O stretch vibration. The Z–X stretch vibration exhibits a red shift in the tetrel bond but an irregular shift in the halogen bond. In the tetrel-bonded complexes of SiF3X, the chemical shielding of Si and F is large enough to be detected with NMR.
NBO and AIM analyses indicate that the tetrel bond in the complexes of CF3X is a weak interaction. In remarkable contrast, the tetrel bond in the complexes of SiF3X is very strong with the nature of partially covalent bond, confirmed by the large electrostatic and polarization energy, and the interaction energy has a quadratic relationship with charge transfer, and a linear relationship is found between them in the halogen bond involving SiF3X.
Footnote |
† Electronic supplementary information (ESI) available. See DOI: 10.1039/c6ra18316f |
This journal is © The Royal Society of Chemistry 2016 |