Heming Wang* and
Vikas Kumar
Materials & Engineering Research Institute, Sheffield Hallam University, City Campus, Howard Street, Sheffield, S1 1WB, UK. E-mail: h.wang@shu.ac.uk
First published on 6th January 2015
We demonstrated for the first time that optically transparent and conductive polysiloxanes/PEDOT:PSS nanocomposite thin films were produced at 85 °C by mixing a sol–gel modified polysiloxane with the aqueous PEDOT:PSS solution. Polysiloxanes/PEDOT:PSS nanocomposite thin films were deposited by conventional solution-processed spin- or spray-coating methods, presenting superior water- and scratch-resistance. ∼100 Ω □−1 sheet resistance with ∼80% transmittance was obtained and was further reduced to 25 Ω □−1 by adding 90 nm ± 20 nm Ag nanowires to the solution. The p-type polysiloxanes/PEDOT:PSS nanocomposite thin films were then applied on n-type c-Si wafers to fabricate organic–inorganic Schottky hybrid photovoltaic devices, demonstrating a similar performance in power conversion efficiency as PEDOT:PSS. However, to the best of our knowledge our high conductive polysiloxanes/PEDOT:PSS nanocomposite c-Si hybrid photovoltaic devices presented the best stability among this type of devices under the ambient environment. Performance of our photovoltaic devices kept no degradation even if the devices were immersed in water without encapsulation for protection.
PEDOT has potentially wide applications in optoelectronic, electronic, electrical, and electrochemical devices due to its high electrical conductivity, thermal and chemical stability, high transparency, and low-cost.13,14 However, co-polymer PEDOT:PSS thin films from an aqueous solution have very poor water resistance. Properties of the PEDOT:PSS film including its adhesion to the substrate are significantly affected by water or ambient environment. A phenomenon is that the PEDOT:PSS thin film disintegrates and is removed or peels off from the substrate shortly after immersion in water. Although many studies have been carried out to form composites or nanocomposite PEDOT:PSS thin films by combining either inorganic nanoparticles (NPs) or organic components,15,16 no report demonstrated that transparent and highly conductive properties via addition of assistant solvents17 (e.g. typically of dimethyl sulfoxide (DMSO)) and a water-proof bonding to the substrate were achieved. The doped components in the nanocomposites either reduced the conductivity of PEDOT:PSS due to percolation or provided no contributions on forming a strongly water-resistant bond to the substrate. In this report, a PSES ([RR′SiO]m[(SiO4R′′SiO2]n) derived from a sol–gel method was able to combine with PEDOT:PSS to form optically transparent and highly conductive nanocomposite thin films. The sol–gel modified PSES provided significant water- and scratch-resistance through the chemical bonding while PEDOT:PSS delivered its electrical conductivity. The mixed solution from the PEDOT:PSS aqueous solution with the sol–gel PSES solution changed neither their easy-processable properties by the solution-based method nor the tuneable electrical conductivity via assistant solvents.
Without an addition of DMSO, nanocomposite thin films had very high sheet resistance (greater than 100 kΩ □−1) similar to PEDOT:PSS. However, sheet resistance was significantly reduced by adding 10 vol% DMSO in SGP-1 or SGP-2. Transmittance and sheet resistance of PSES:PEDOT:PSS thin films on PP were shown in Fig. 3a where samples A, B, and C were produced from SGP-1 with ∼4-, ∼12-, and ∼24 μm thicknesses, separately. They respectively presented ∼10.4, ∼3.4, and ∼1.7 kΩ □−1 sheet resistance (equivalent to ∼0.245 S cm−1) with on average ∼98%, ∼95%, and ∼86% transmittance in the visible light wavelengths range after the baseline was corrected. We noticed that high transparency was still kept even if the thickness of the PSES:PEDOT:PSS thin film reached 24 μm. In comparison with PEDOT:PSS, this high transparency was impossible to be achieved at the same thickness. Furthermore, sheet resistance of thin films produced from SGP-2 was significantly reduced. Their relationship of sheet resistance and transmittance was illustrated in Fig. 3b where sheet resistance decreased from ∼181 (equivalent to ∼2.30 S cm−1) to ∼42 Ω □−1 and the corresponding transmittances reduced from ∼85% to ∼58%. Sheet resistance of the nanocomposite thin films can be further reduced by adding Ag nanowires (NWs) in SGP-1. As shown in Fig. 3c, sheet resistance of the thin film produced by the spray-coating method on PP substrates decreased to ∼25 Ω □−1 with on average ∼80% transmittance. The PSES:PEDOT:PSS film had the capability of not only preventing Ag NWs films from oxidation and corrosion but also providing a strong adhesion to the substrate. The Ag NWs used in this work had on average 90 ± 20 nm at diameter and ∼30 nm at length. Therefore, we expected that 85% transmittance with ∼10 Ω □−1 sheet resistance can potentially be obtained by optimising Ag NWs with ∼35 nm at diameter.
Water and acid resistance were significantly enhanced for the PSES:PEDOT:PSS thin film. The SGP-1 or SGP-2 coated PP and/or GS samples were then immersed in DI water or 10% HCl aqueous solution for three weeks. Adhesion of the PSES:PEDOT:PSS thin film to the substrates was measured after immersion according to ASTM D3359-09e2. A cross-hatch cutter or scribe was used to cut a lattice-like pattern with ∼1.0 × 1.0 mm size for each separate square in the pattern on the substrate. Special sellotape was applied onto this region and then pulled off. No any sign of detachment for each square was observed from the pattern, illustrating an excellent adhesion to the substrate. Electrical conductivity presented negligible changes after the immersion test. By comparison, thin films from the aqueous PEDOT:PSS solution can immediately be removed from the substrate after immersion in water. Mechanical properties were also compared by the pencil hardness test according to ASTM Test Method D 3363. The PSES:PEDOT:PSS thin films on PP substrates showed ∼6H pencil hardness while the PEDOT:PSS thin film had only below 4B pencil hardness, which demonstrated that the PSES has enormously increased scratch resistance of the PEDOT:PSS thin film.
The PSES:PEDOT:PSS nanocomposite thin film was subsequently applied on n-type c-Si wafers to fabricate hybrid photovoltaic (PV) devices using high conductive Ag paste dots as the top contact points for testing. Schematic diagram of the device structure was shown in Fig. 4a as Sn film/c-Si/PSES:PEDOT:PSS or PEDOT:PSS/Ag paste dots. Fig. 4b illustrated J–V characterisation of hybrid PV devices produced by PSES:PEDOT:PSS or PEDOT:PSS, respectively. The hybrid PSES:PEDOT:PSS PV device presented poor performance with 1.32% power convention efficiency (PCE). All parameters from the J–V curve were listed in Table 1. The PSES:PEDOT:PSS PV device had Voc of 0.40 V, short circuit current density (Jsc) of 7.93 mA cm−2, and fill factor (FF) of 42%. Inferior performance of the PSES:PEDOT:PSS PV device was assigned to low conductivity (low positive charge transport) of the nanocomposite thin film (∼0.245 S cm−1) compared to that of PEDOT:PSS.18 On the contrast, the PEDOT:PSS hybrid PV device achieved much better performance as listed in Table 1. It obtained PCE of 2.81% with Voc of 0.40 V, Jsc of 12.54 mA cm−2, and FF of 56%. Much higher conductivity of the PEDOT:PSS layer than that of PSES:PEDOT:PSS played a key role on securing better efficiency devices. Nevertheless, the PEDOT:PSS PV device fully degraded after stored in air for overnight as shown in Fig. 4b, illustrating very poor stability.
PV devices | Voc (V) | Jsc (mA cm−2) | PCE (%) | FF (%) |
---|---|---|---|---|
PSES:PEDOT:PSS | 0.40 | 7.93 | 1.32 | 42 |
PEDOT:PSS after preparation | 0.40 | 12.54 | 2.81 | 56 |
The hcPSES:PEDOT:PSS nanocomposite thin films from SGP-2 were also utilised to fabricate the n-type Si-based hybrid PV devices with Ag nanowires as the top contact electrode. As a comparison, the controlled sample of n-type Si-based hybrid PV devices were simultaneously fabricated using the corresponding hcPEDOT:PSS. Device structures as shown in Fig. 5a were of Sn film/c-Si/hcPSES:PEDOT:PSS or hcPEDOT:PSS/Ag NWs. We characterised J–V behaviour of the hcPSES:PEDOT:PSS and hcPEDOT:PSS hybrid PV devices as presented in Fig. 5b, respectively. Performance parameters according to J–V curves were illustrated in Table 2. A similar PCE of the PV devices from hcPSES:PEDOT:PSS as that of hcPEDOT:PSS was obtained. The PV device from hcPSES:PEDOT:PSS presented ∼4.74% PCE compared to ∼4.63% of the device from hcPEDOT:PSS. The hcPSES:PEDOT:PSS PV device had Voc of 0.52 V, Jsc of 17.34 mA cm−2 and FF of 53% while the hcPEDOT:PSS PV device showed lower Voc of 0.48 V, higher Jsc of 20.41 mA cm−2, and smaller FF of 47%. PCE of n-type Si-based hybrid solar cells can be affected by many factors like HF etching methods (e.g. creating Si nanowires structures for enhancing light absorption), hole conductivity of hcPSES:PEDOT:PSS or hcPEDOT:PSS, transmittance and sheet resistance of top electrode, and contact resistance of front and back electrodes. In comparison with the PEDOT:PSS PV device listed in Table 1, the hcPEDOT:PSS PV device in Fig. 5b demonstrated much higher PCE. The cause was mainly due to the improved top contact electrode. Silver nanowires provided better contact and lower resistance for charge transport and hence enhanced the PCE of the PV devices. In the following paragraphs, we also demonstrated that the hcPEDOT:PSS PV device with the same structure as shown in Fig. 4a obtained the similar J–V performance as the PEDOT:PSS PV device in Fig. 4b. It was noticed that the hcPEDOT:PSS thin film had much higher conductivity (up to 1000 S cm−1)19 than the hcPSES:PEDOT:PSS nanocomposite thin film; nevertheless, the hcPEDOT:PSS hybrid PV device did not obtain much better PCE than the hcPSES:PEDOT:PSS PV device. Further compared the PEDOT:PSS PV device with the PSES:PEDOT:PSS PV device in Fig. 4b, the PEDOT:PSS PV device illustrated much better J–V behaviour. Therefore, we inferred that it required a critical value (or in a range of the value) of conductivity (Ck) for the p-type semiconductor layer on the n-type c-Si to fabricate high efficiency Schottky PV devices. When conductivity of the p-type semiconductor layer is lower than Ck, J–V performance of the fabricated PV device was seriously affected by the value of conductivity; e.g. PSES:PEDOT:PSS PV devices in Fig. 4b. However, when conductivity for the p-type semiconductor layer is greater than Ck, it no longer plays a key role on the J–V performance of the hybrid PV devices; e.g. hcPSES:PEDOT:PSS and hcPEDOT:PSS PV devices in Fig. 5b. Another point for PSES:PEDOT:PSS PV devices is that they demonstrated the same J–V performance as the hcPEDOT:PSS PV devices but had overall a lower conductivity of the p-type semiconductor layer, which may imply that the PSES:PEDOT:PSS nanocomposite thin film has a high conductivity along the direction perpendicularly to the surface of the c-Si substrate. Further investigation is required for this.
PV devices | Voc (V) | Jsc (mA cm−2) | PCE (%) | FF (%) |
---|---|---|---|---|
hcPSES:PEDOT:PSS | 0.52 | 17.34 | 4.74 | 53 |
hcPEDOT:PSS | 0.48 | 20.41 | 4.63 | 47 |
Overall, our PV devices referred to other published papers (10 to 13% PCE) had a relatively low PCE, which was mainly due to two factors; i.e. flat c-Si etching surface that had small light absorption compared to Si NWs surfaces and high contact resistance from the front and rear contact electrodes.9 The objective in this work mainly focused on studies of enhancing device stability through comparison; therefore, we did not adopt the best device structure in our experiments for obtaining high efficiency. Conversely, the device structure, Sn film/c-Si/PSES:PEDOT:PSS or PEDOT:PSS/Ag paste dots as shown in Fig. 4a, was further used to fabricate hcPSES:PEDOT:PSS-based PV devices. This device structure allowed the p-type hcPSES:PEDOT:PSS layer fully expose to the environment without protection, which intended to perform a rapid evaluation for long term stability of the PV devices. Fig. 6 illustrated a typical cross section SEM image of the hcPSES:PEDOT:PSS thin film on our hybrid PV devices, which presented ∼7.5 μm of the thickness. This film had ∼80% transparency and ∼200 Ω □−1 sheet resistance. An impressive stability was obtained for our hcPSES:PEDOT:PSS PV devices as shown in Fig. 7a where J–V characterisation of the hcPSES:PEDOT:PSS PV devices was illustrated. Performance of our hybrid hcPSES:PEDOT:PSS PV devices without encapsulation gradually improved with time after stored under an ambient condition for 140 hours. Performance parameters of the PV devices from J–V curves were listed in Table 3. Voc, FF, and PCE moderately increased from 0.40 to 0.44 (V), 0.46 to 0.49, and 1.92% to 2.32%, respectively while Jsc retained within the range of from 10.54 to 10.94 mA cm−2. PCE enhancement of our PV devices with time may be attributed to formation of a passive SiO2 film at the interfacial surface between the c-Si substrate and the hcPSES:PEDOT:PSS layer. As a comparison, Fig. 7b presented the J–V behaviour of a hcPEDOT:PSS hybrid PV device with the same structure as shown in Fig. 4a. A full degradation was observed from J–V characterisation of the hcPEDOT:PSS PV device after stored in air for overnight. The degradation was caused by water trapped or absorbed in the PV devices. Water trapped in the hcPEDOT:PSS layer can lead to a notably abatement of the PV device after stored under an ambient condition for 10 min.12 Moreover, in order to perform a rapid stability assessment, our hcPSES:PEDOT:PSS hybrid device was then immersed in DI water for another 96 hours after kept in the ambient condition for 140 h. In the case of no encapsulation, J–V performance of the hcPSES:PEDOT:PSS hybrid PV device did not degrade as shown in Fig. 7a. It still illustrated 2.2% PCE with other parameters listed in Table 3. This superior water-repellent property was attributed to the incorporation of PESE in PEDOT:PSS to form a nanocomposite thin film, which provided a “water-impermeable” property in n-type c-Si hybrid PV devices. This approach in this report could deliver one of the best solutions for manufacturing long term stable and low cost organic–inorganic solar cells and pave the way to realise the true commercial products.
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Fig. 6 SEM cross section images of hcPSES:PEDOT:PSS thin films for the hybrid PV devices, showing ∼7.5 μm thickness. |
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Fig. 7 (a) Stability performance of J–V characterisation of the hcPSES:PEDOT:PSS nanocomposite PV devices with the structure as shown in Fig. 4a; (b) degradation of J–V behaviour of hcPEDOT:PSS hybrid PV devices with the structure as shown in Fig. 4a. |
Devices | Voc (V) | Jsc (mA cm−2) | PCE (%) | FF (%) |
---|---|---|---|---|
Initial | 0.40 | 10.52 | 1.92 | 46 |
24 h | 0.42 | 10.94 | 2.20 | 48 |
140 h | 0.44 | 10.87 | 2.32 | 49 |
96 h immersion in H2O | 0.42 | 11.08 | 2.20 | 47 |
Chemical structures of the hcPSES:PEDOT:PSS and hcPEDOT:PSS thin films were separately characterised by FTIR. Their spectra were presented in Fig. 8. For hcPEDOT:PSS thin films, absorption peaks between 3140 and 2970 cm−1 are associated with the stretching vibration of O–H. The absorption peak at 2923 cm−1 is related to the alkyl C–H stretching vibration. Peaks at 1646, 1432, and 1413 cm−1 are assigned to aromatic –CC– stretching vibrations. IR bands at 1523, 1294, and 948 cm−1 are associated with vibrations of the thiophene ring. Absorption peaks at 1176, 1126, 1091 cm−1 are attributed to the stretching vibrations in –C–O–C– ethylenedioxy ring or –SO3− asymmetric stretching vibrations. The symmetric stretching vibrations of –SO3− are located at 1025 and 1002 cm−1. The O–C–C deformation of the dioxane ring may assign to 900 cm−1. IR spectra of the hcPSES:PEDOT:PSS thin film illustrated significant difference in comparison with that of the hcPEDOT:PSS thin film because of incorporation of polysiloxanes in the structures. IR bands between 1218 and 966 cm−1 are associated with –Si–O–Si– stretching vibrations. Absorption peaks at 1409, 1272, 798, and 769 cm−1 are assigned to Si–C–H vibrations in polysiloxanes.
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Fig. 8 FTIR spectra of the hcPSES:PEDOT:PSS and hcPEDOT:PSS thin films which were cured at 120 °C for 10 min. |
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