X-ray-induced long persistent luminescence of Cu+-doped borosilicate glasses for radiation detection

Abstract

A new strategy for fabricating LPL glass is reported based on the defect engineering of glass. Cu⁺-doped borosilicate glass was melted in a reducing atmosphere. Then, some defects were induced by X-ray radiation, which could trap ultraviolet (UV) light and exhibit long persistent luminescence (LPL) properties. To our knowledge, no previous study has used X-ray radiation induction to obtain LPL of glass. In addition, a highly linear relationship exists between the initial afterglow intensity of the glass and the radiation dose. It could be used as a new radiation detector to measure the radiation dose based on the initial afterglow intensity induced by radiation. To analyze the LPL mechanism, the glass was analyzed by absorption, fluorescence, thermoluminescence (TL), and electron paramagnetic resonance (EPR) measurements. Two types of defects were induced by the X-ray radiation. One type of defect can be eliminated after UV irradiation, and the other is the main cause of LPL.