Issue 27, 2024

A sensitive self-powered perovskite photodetector via noise suppression with poly(vinylidene fluoride–trifluoroethylene) doping for defect passivation

Abstract

The rapid advancement of self-powered perovskite photodetectors (PDs) in recent years has been hindered by numerous defects present in solution-processed perovskite polycrystalline films, significantly impacting device performance. Of particular concern is the influence of these defects on device noise, a critical parameter directly affecting detector sensitivity. This study proposes the incorporation of poly(vinylidene fluoride–trifluoroethylene) (PVT) additives into FA0.9MA0.05Cs0.05PbI3 perovskite precursor solutions to alleviate defect formation and enhance detector sensitivity. By optimizing the PVT concentration to 0.05 mg L−1, the photodetector (PD) demonstrates remarkable improvement, achieving a low noise power spectral density (0.1 pA Hz−1/2) and dark current density (2.12 nA cm−2) at zero bias. The device exhibits a notable decrease in defect density by an order of magnitude through the concurrent passivation of shallow-level defects with PVT. Additionally, the PD shows a high specific detection rate (D* = 2.8 × 1013 jones) at 700 nm, accompanied by a linear dynamic range exceeding 101 dB. This research not only advances our understanding of noise suppression mechanisms but also unveils the potential application of high-sensitivity PDs for real-time heart rate monitoring, showing promise for significant advancements in human health monitoring technology.

Graphical abstract: A sensitive self-powered perovskite photodetector via noise suppression with poly(vinylidene fluoride–trifluoroethylene) doping for defect passivation

Supplementary files

Article information

Article type
Communication
Submitted
16 Apr 2024
Accepted
08 Jun 2024
First published
25 Jun 2024

J. Mater. Chem. C, 2024,12, 9944-9949

A sensitive self-powered perovskite photodetector via noise suppression with poly(vinylidene fluoride–trifluoroethylene) doping for defect passivation

Y. Liu, Z. Liu, Z. Zhang, J. Huang, X. Li, H. Yu, Y. Shen, M. Wang and G. Tu, J. Mater. Chem. C, 2024, 12, 9944 DOI: 10.1039/D4TC01547A

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