A review of laboratory, commercially available, and facility based wavelength dispersive X-ray fluorescence spectrometers

Abstract

Wavelength dispersive X-ray fluorescence (WD-XRF) spectroscopy is a widely used instrumental spectroscopy method for a variety of samples and it requires no or a minimal of sample preparation. Compared to using the more conventional energy dispersive XRF spectrometers, WD-XRF spectroscopy has the advantage of a highly improved energy resolution, making this technique suitable for the detection of characteristic X-rays separated by only a few eV. WD-XRF is established both in industry for routine analyses and in the academic world for high-end research and development of the method. WD-XRF spectroscopy can be probed with a laboratory X-ray source and if higher X-ray-beam intensities, monochromatic and polarized beams are required a synchrotron X-ray radiation source can be used. In (synchrotron) radiation facilities all over the world interesting new setups are characterized and used. This review paper will give an overview of the important characteristic properties, such as energy resolution, sensitivity, and the reachable energy range of the different types of WD-XRF setups available and reported in the last 20 years, based on laboratory X-ray sources, radiation facility sources or availability as a commercial instrument. The commercially available instruments are listed by the manufacturer and type of instrument, and for each instrument at least one example of an application is shown.