The origin of a grain-boundary capacitance in mixed oxide-ion/electronic conductors has been investigated for the case of Ce0.8Sm0.2O1.9−δ using a.c. impedance spectroscopy under low pO2 from 250 to 400 °C. The observed capacitance is interpreted in terms of CeIII:4f1 electrons first introduced into the grains and not into the grain boundaries.
E. C. C. Souza and J. B. Goodenough, Phys. Chem. Chem. Phys., 2016, 18, 5901 DOI: 10.1039/C5CP07032E
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