Mechanisms of epitaxy and defects at the interface in ultrathin YSZ films on Si(001)
Abstract
Ultrathin YSZ epitaxial films have been deposited by
* Corresponding authors
a
Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus de la UAB, Bellaterra, Spain
E-mail:
fsanchez@icmab.es
Fax: +34 935805729
Tel: +34 935801853
b CEMES, CNRS UPR 8011, 29 rue Jeanne Marvig, Toulouse, France
c Transpyrenean Associated Laboratory for Electron Microscopy, CEMES – INA, CNRS, France – Universidad de Zaragoza, Zaragoza, Spain
Ultrathin YSZ epitaxial films have been deposited by
P. de Coux, R. Bachelet, C. Gatel, B. Warot-Fonrose, J. Fontcuberta and F. Sánchez, CrystEngComm, 2012, 14, 7851 DOI: 10.1039/C2CE26155C
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