Issue 41, 2009

Single layer growth of sub-micron metal–organic framework crystals observed by in situatomic force microscopy

Abstract

In situ atomic force microscopy was used to directly investigate the growth processes of the oriented metal–organic framework HKUST-1 grown on self-assembled monolayers on gold.

Graphical abstract: Single layer growth of sub-micron metal–organic framework crystals observed by in situatomic force microscopy

Supplementary files

Article information

Article type
Communication
Submitted
27 Apr 2009
Accepted
12 Aug 2009
First published
07 Sep 2009

Chem. Commun., 2009, 6294-6296

Single layer growth of sub-micron metal–organic framework crystals observed by in situatomic force microscopy

N. S. John, C. Scherb, M. Shöâeè, M. W. Anderson, M. P. Attfield and T. Bein, Chem. Commun., 2009, 6294 DOI: 10.1039/B908299A

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