Issue 5, 2008
From the journal:

Lab on a Chip

Numerical design of electrical-mechanical traps†

Duc Vinh Le,a   Carlos Rosales,bc   Boo Cheong Khoo*ac  and  Jaime Perairead  

* Corresponding authors

a Singapore-MIT Alliance, E4-04-10, 4 Engineering Drive, Singapore
E-mail: smaldv@nus.edu.sg

b Institute of High Performance Computing, 1 Science Park Road, #01-01 The Capricorn, Singapore
E-mail: carlos@ihpc.a-star.edu.sg

c Department of Mechanical Engineering, National University of Singapore, Kent Ridge Crescent, Singapore
E-mail: mpekbc@nus.edu.sg
Fax: +6567791459
Tel: +6568742889

d Department of Aeronautics and Astronautics, Massachusetts Institute of Technology, 77 Massachusetts Ave, Cambridge, MA, USA
E-mail: peraire@mit.edu

Abstract

We present a coupled immersed interface method-boundary element method (IIM-BEM) numerical technique that predicts the behaviour of deformable cells under the effect of both hydrodynamic and electrical forces. This technique is applied to the study of a hybrid electrical-mechanical trap for single-cell trapping. We report on the effect of different combinations of electrode positions and mechanical properties of the trap on the maximum loading and unloading Reynolds numbers. We also report on the effect that cells moving with the flow have on cells which have been already trapped in a cavity.

Graphical abstract: Numerical design of electrical-mechanical traps

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Article information

DOI
https://doi.org/10.1039/B718153A
Article type
Paper
Submitted
26 Nov 2007
Accepted
10 Mar 2008
First published
01 Apr 2008

Lab Chip, 2008,8, 755-763

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Numerical design of electrical-mechanical traps

D. V. Le, C. Rosales, B. C. Khoo and J. Peraire, Lab Chip, 2008, 8, 755 DOI: 10.1039/B718153A

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