3D Micro PIXE—a new technique for depth-resolved elemental analysis

Abstract

A novel experimental technique, 3D micro-particle-induced X-ray emission (PIXE) is described in the present paper. 3D Micro-PIXE is realized by using an X-ray optic in front of the detector, thus creating a confocal arrangement together with the focused proton micro-beam. This confocal setup defines a probing volume from which information on elemental distribution is obtained. If a sample is moved through the probing volume, depth-resolved measurements become possible. The confocal setup was characterized with respect to its spatial and depth resolution. As an example of application for this new non-destructive analytical technique, an archaeological ceramic fragment was examined. A first approach to simulate the complex experimental results is performed. The potential of 3D micro-PIXE to provide advanced qualitative information on the elemental distribution in the sample is discussed.