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Issue 10, 2007
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3D Micro PIXE—a new technique for depth-resolved elemental analysis

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Abstract

A novel experimental technique, 3D micro-particle-induced X-ray emission (PIXE) is described in the present paper. 3D Micro-PIXE is realized by using an X-ray optic in front of the detector, thus creating a confocal arrangement together with the focused proton micro-beam. This confocal setup defines a probing volume from which information on elemental distribution is obtained. If a sample is moved through the probing volume, depth-resolved measurements become possible. The confocal setup was characterized with respect to its spatial and depth resolution. As an example of application for this new non-destructive analytical technique, an archaeological ceramic fragment was examined. A first approach to simulate the complex experimental results is performed. The potential of 3D micro-PIXE to provide advanced qualitative information on the elemental distribution in the sample is discussed.

Graphical abstract: 3D Micro PIXE—a new technique for depth-resolved elemental analysis

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Publication details

The article was received on 18 Jan 2007, accepted on 30 May 2007 and first published on 27 Jun 2007


Article type: Paper
DOI: 10.1039/B700851C
J. Anal. At. Spectrom., 2007,22, 1260-1265

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    3D Micro PIXE—a new technique for depth-resolved elemental analysis

    A. Karydas, D. Sokaras, C. Zarkadas, N. Grlj, P. Pelicon, M. Žitnik, R. Schütz, W. Malzer and B. Kanngießer, J. Anal. At. Spectrom., 2007, 22, 1260
    DOI: 10.1039/B700851C

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