Convenient method for the determination of trace elements in solid samples using an inductively coupled plasma

Abstract

A method for the determination of trace elements in solid samples is described. The sample is loaded into a graphite cup, which is inserted horizontally into the tail region of the inductively coupled plasma. Application of the method to carrier distillation analysis of impurities in uranium oxide shows that detection limits in the range 0.02–5 µg g^–1 with a relative standard deviation of 4–12% are obtainable.