MeV Ion scatting has revealed a surprising periodic incorporation of residue in anodically-grown alumina films which may provide important ramification of the properties of these films.
D. L. Cocke, S. M. Kormali, C. V. B. Leit, O. J. Murphy, E. A. Schweikert, P. Filpus-Luyckx, C. A. Polansky and D. E. Halverson, J. Chem. Soc., Chem. Commun., 1984, 1560 DOI: 10.1039/C39840001560
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