Ianina L. Violiab,
Vittorio Lucac,
Analía L. Soldatid,
Horacio Troianid,
Galo J. A. A. Soler-Illiaae and
Andrés Zelcer*abf
aGerencia Química, CAC, CNEA, CONICET, Av. Gral. Paz 1499, B1650KNA, San Martín, Buenos Aires, Argentina. E-mail: Andres.Zelcer@cibion.conicet.gov.ar; Tel: +54 11 4899 5500
bCIBION, CONICET, Godoy Cruz 2390 (C1425FQD), CABA, Argentina
cCentro Atómico Constituyentes, Comisión Nacional de Energía Atómica, Av. Gral. Paz 1499, B1650KNA, San Martín, Buenos Aires, Argentina
dGerencia de Investigación Aplicada, Centro Atómico Bariloche, CNEA, CONICET, 8400, S.C. de Bariloche, Río Negro, Argentina
eInstituto de Nanosistemas, UNSAM, 25 de Mayo y Francia (1650), San Martín, Buenos Aires, Argentina
fECyT, UNSAM, 25 de Mayo y Francia (1650), San Martín, Buenos Aires, Argentina
First published on 18th May 2017
A scalable, simple, robust and reproducible method is presented for the preparation of chemically homogeneous and ordered nanocrystalline and mesoporous Zr1−xCexO2 thin films. The method utilizes widely available commercial block copolymers as templates. We show how the preparation conditions, film compositions and thermal treatments determine the mesoporous and crystalline structure. Through the scanning of the synthetic process, it was possible to arrive at an optimized and very reproducible method which allows the preparation of high quality, transparent, nanocrystalline and ordered Zr1−xCexO2 mesoporous thin films with different compositions.
Despite its excellent chemical properties, cerium oxide lacks sufficient structural and thermal stability to be used in long-term applications. Therefore, it must be supported on a robust material like alumina or incorporated into solid solutions with other metals that provide better mechanical stability. One of the most widespread ceria-containing solid solution system is the zirconia–ceria mixed oxide.10–13 This binary metal oxide combines the mechanical and thermal stability of zirconia and variable oxidation state of cerium, enhancing the reversibility of redox reactions through structural stabilization. Interestingly, the addition of Zr can even lead to an OSC higher than the observed for pure ceria.6,14,15 It is somewhat counterintuitive that Zr(IV), a non-reducible tetravalent ion, enhances the redox properties of ceria. Several studies have sought to shed light on the mechanism by which Zr modulates the electrochemical properties of Ce oxide. Based on high-resolution STM images and DFT calculations, Esch et al. proposed that Zr(IV) ions, being smaller than Ce(IV), facilitate the nucleation of surface defects, removing an energetic barrier for the formation of surface oxygen vacancy clusters.16 DFT calculations of the vacancy creation energies in the κ-CeZrO4 phase revealed that structural relaxation involved in creating an oxygen vacancy is assisted by the different radii of Zr and Ce ions.17
Mesoporous materials, which have pores in the 2–50 nm range, have high specific surface areas and pores that can readily be accessed by relatively small chemical species.18,19 These characteristics are highly desirable for catalysts and catalyst supports, two of the main applications of reducible oxides.18,20 In particular, the high surface area favors the formation of defects and surface states that act as catalytically active sites and also enhance the OSC.21 One of the most widely used and versatile strategies for the preparation of mesoporous materials is evaporation induced self-assembly (EISA).22,23 In this structuring strategy, the evaporation of solvents induces both a sol–gel transition of a precursor and the assembly of a structure directing agent, usually a surfactant, that serves as a sacrificial template for the pores. This method is particularly useful for the preparation of mesoporous thin films. This kind of processing allows the deposition of high surface area materials onto almost any substrate, thus allowing for the generation of materials that can be tailored to the environmental and catalytic applications. Indeed, the need to integrate the functionality of high surface Zr1−xCexO2 porous coatings in complex hierarchical porous structures usually also requires a deposition method compatible with industrial scale production.
Although some examples of mesoporous Zr1−xCexO2 thin film preparation have been reported, there is still a need for reproducible, scalable methods that employ readily available reagents. When producing mixed oxides, procedures that work for the preparation of xerogels and powders are not necessarily applicable for thin-film deposition, since evaporation rates are very different. This is particularly true for mixed metal oxides since the different reaction rates can lead to phase segregation and inhomogeneous materials.24 The difficulties arising in the preparation of mesoporous Zr1−xCexO2 thin films using sol–gel chemistry have been evident since the first studies of such materials.12,25 An early report from Crepaldi et al. used a commercial surfactant as a template and compositions up to 20 mol% Ce were investigated.12 As initially cast, the porous thin film shows little if any periodic ordering. A complex procedure was developed that entailed repeated exposition of the freshly deposited film to water vapor. This process promoted the rearrangement of oxo-clusters and resulted in a dramatic improvement in pore ordering. This synthetic pathway is sensitive to small changes in humidity during aging, leading to different mesopore arrangements. More recently, Brezesinski et al. prepared mesoporous Zr1−xCexO2 thin films using the custom-made KLE block copolymer as a template and a thermal treatment right after deposition.25 This rapid thermal treatment facilitates ordered film preparation within the full compositional range. They attributed the success of the synthetic strategy to the use of KLE as a template since (a) its self-assembly occurs with more rapid kinetics and (b) it is thermally more stable than Pluronic copolymers. The significant differences from bulk behavior in the electronic transport properties of these films were explained by a model based on surface defects.26
The objective of the present work is to optimize the synthesis and microstructure of mesoporous Zr1−xCexO2 thin films that fulfill the requirements for large scale production in terms of scalability, reproducibility and physicochemical properties. A simple, robust and reproducible synthetic strategy is presented for the preparation of chemically homogeneous mesoporous Zr1−xCexO2 thin films that utilizes as the porogen the commercially available Pluronic F127 block copolymer. It is demonstrated that the preparation conditions, film composition and thermal treatment determine the mesoporous and crystalline structure of the films. The mechanisms that dominate the complex processes that take place when preparing crystalline and mixed mesoporous thin films are also elucidated. The films can be prepared in a wide range of compositions and are highly porous. The pore system remains accessible to gases and other reagents. These films serve as supports for catalytically active gold nanoparticles leading to a reusable catalyst for chemical and electrochemical reactions.27
For the preparation of mesoporous thin films sols were dip coated onto silicon or soda-lime glass, using withdrawal rates between 0.5 and 4.0 mm s−1. In the optimized synthesis, films were left to dry in the dip-coater for 30 seconds and then transferred directly to an oven at 200 °C for 30 minutes (from now on, this post-synthetic treatment is called T1). For further analysis of the effect of the post-deposition treatment, another two different stabilization steps were applied: (T2) 24 h at 50% RH, 24 h at 60 °C and 24 h at 130 °C; (T3) same temperatures as T2 but only for 30 minutes each step. After one of these treatments, samples were finally calcined at 350 °C for 2 h with a heating ramp of 1 °C min−1.
In order to study the thermal stability of the films some were further treated at higher temperatures (between 550 and 650 °C) and for different times (between 30 min and 3 h) to induce crystallization. Films were kept in a preheated oven for a specific period of time prior to exposing to ambient air.
High Resolution Transmission Electron Microscopy (HRTEM) was performed using a Philips CM 200 microscope operating at 200 kV and equipped with a LaB6 filament. The TEM was equipped with a CCD camera and an EDS detector for chemical elementary analysis. The microscope operated with an ultra-twin objective lens ideal for HRTEM observations. Small fragments of the mesoporous structure were scraped from the support and suspended in ethyl alcohol. Subsequently, small drops of the suspension were deposited on commercial ultrathin carbon films supported on Cu grids and were allowed to dry.
Porosity and pore dimensions were determined by environmental ellipsoporosimetry (EEP), and refractive index n as well as extinction coefficient k of the films were obtained by modelling of the ellipsometric signal (SOPRA GES5A). UV-Vis measurements were carried out in a Hewlett-Packard 8453 spectrophotometer. Contact angle measurements were performed by dropping E-pure water over each film, using a Ramé-Hart 290 device. Pore arrangement and interplanar distances were measured using Small Angle X-ray Scattering with 8 keV radiation (SAXS2 beamline, Laboratório Nacional de Luz Síncrotron, Brazil). Crystalline phases were characterized by Grazing Incidence X-Ray Diffraction (GIXRD, PANAnalytical Empyrean) in grazing incidence configuration using Cu Kα radiation and a PIXcel3D detector. Soller slits (0.04 radian) were used on both the incident and diffracted beam side. A parallel beam mirror, 1/2° primary divergence slit, a 0.04 radian Soller slit, and a beam mask were used on the incident beam side while a parallel plate collimator and an 0.04 radian Soller slit was employed on the diffracted beam side. Rietveld refinements were undertaken using the Rietveld implementation within the Panalytical HighScore software. Further analyses of thickness, porosity and crystalline evolution were performed by X-Ray Reflectometry (XRR) and GIXRD in the XRD1 beamline at Laboratório Nacional de Luz Síncrotron, Brazil.
Fig. 1 Representative TEM images of Zr1−xCexO2 MPTF deposited onto glass. (A) x = 0.1; (B) x = 0.3; (C) x = 0.5. Inset: 2D-SAXS patterns. |
Fourier transforms of the FE-SEM images show the typical 4 + 2 arrangement compatible with an Imm disposition. The films are composed of multiple domains in the xy plane, each one exposing the [110] face. When SAXS diffractograms were obtained with a 90° incident beam, several peaks corresponding to different planes of an Imm pore arrangement are resolved (Fig. 2A). Moreover, in situ 2D-SAXS measurements show that the pattern obtained immediately following deposition of the sol used to synthesize Zr0.5Ce0.5O2 MPTFs perfectly matches the theoretical pattern32 of an Imm with (110) direction perpendicular to the substrate (Fig. S2†).
Films prepared with intermediate consolidation steps (T2 and T3) show well-ordered pores only for 0.1–0.3 ceria contents (Fig. S1† and 2A). For higher ceria proportions, a sponge-like structure is observed in FE-SEM, and in some cases, the films also show poor optical quality near the edges, with slightly opaque areas (Fig. S3†). Films prepared with ceria proportions 0.6 and higher show poor optical properties for all thermal treatments, and were not further studied.
Film thickness can be controlled by varying the withdrawal rate. Films with thicknesses between ∼50 and 200 nm can be cast using withdrawal speeds between 0.5 and 4.0 mm s−1 (Fig. S4†). Films with different cerium content prepared under the same conditions show small differences (25–50 nm) in thickness, but a similar dependence of thickness on withdrawal rate. Thus, withdrawal rate is the main processing parameter that controls film thickness, while the Ce to Zr ratio introduces a smaller variation.
While for T1 the same arrangement is obtained for all compositions, for the T2 treatment a diffraction pattern consistent with an Fmm space group is observed for low cerium molar ratio (0.1), and a Imm geometry is observed for a cerium ratio of 0.3. For a the intermediate molar ratio of 0.2, a mixture of both cubic phases is obtained. For T3, a diffraction pattern compatible with an Fmm arrangement is observed for cerium molar ratios of 0.1 and 0.2, and a Imm geometry otherwise (Fig. 2C).
The degree of film contraction in the z-direction was calculated from the interplanar distances obtained from 2D-SAXS experiments. The measured distances for the (10) (d10) and (110) (d110) planes of the cubic arrangement are 13.2 nm and 3.1 nm. The distance d10 is taken as the one corresponding to the as cast cubic arrangement since the film does not contract in the xy plane. The ratio between these two distances indicates a contraction of almost 77%.
Although the interpore distances are similar for all thermal treatments and compositions, the values are always smaller and more homogeneous among different molar Ce ratios for films prepared using T1 treatment (Fig. 2D). This is consistent with a kinetically controlled process, where compositional differences are countermanded by temperature induced rapid kinetics for all metallic centers. It is interesting to note that although it has been suggested that in contrast to KLE, the Pluronics copolymer family is not sufficiently thermally stable to withstand this kind of thermal treatment,25 high quality pore ordering is observed for all compositions.
Table 1 lists several structural parameters obtained by EEP as the pore and neck size, and the adsorbed volume (% Vad), the interplane distances obtained by 2D-SAXS, and composition measured by EDS. All films show highly accessible porous volumes between 31 and 35%. The pore and neck diameter are about 6 and 4 nm respectively and vary little with composition. Films prepared using longer treatments involving exposure to a controlled relative humidity of 50% (T2 and T3) show higher porous volume, close to 50%. Pore and neck diameters are also larger in these cases, around 10 and 6 nm, and having a broader size distribution (Fig. S5†). Final compositions determined using EDS agree very well with the molar ratios used to prepare the precursor solutions.
x | dporea/nm | dnecka/nm | d10b/nm | % Vporc | Ce/(Zr + Ce)d |
---|---|---|---|---|---|
a Pore and neck sizes as measured by EEP.b (10) interplane distances obtained from the low-angle incidence (4°) 2D-SAXS patterns.c Porous volume as measured by EEP.d Cerium molar ratio measured by EDS. | |||||
0.1 | 6.6 | 4.0 | 13.1 | 35 | 0.110 ± 0.007 |
0.2 | 6.0 | 4.2 | 13.4 | 34 | 0.20 ± 0.01 |
0.3 | 5.0 | 3.2 | 13.2 | 34 | 0.294 ± 0.003 |
0.4 | 5.2 | 3.2 | 13.2 | 31 | 0.39 ± 0.02 |
0.5 | 5.6 | 3.8 | 13.2 | 33 | 0.48 ± 0.01 |
An Imm structure was observed for all the compositions and aging times studied. 2D-SAXS patterns were completely equivalent for all aging times (Fig. S6†), the only difference being a slight increase in the inter-planar distance for longer aged sols. Similar experiments performed using pure zirconia sols aged for longer than 72 h showed that the obtained films only present short range order. We believe that during aging, larger zirconium–cerium clusters form and grow, up to the point where stable structures are formed. The nature and size of these clusters depends on the concentration of metal ions, complexing agents, water and acids. The clusters initially grow, forming thicker walls that result in slightly larger inter-planar distances. The presence of cerium, with lower charge than zirconium, changes the nature of these clusters, producing smaller stable clusters that can be better accommodated around the micelles during the EISA process than those of pure zirconium.
The crystallite size, as estimated using the Debye–Scherrer equation, is presented for all samples in Fig. 5D. For all temperatures the crystallite size was smaller for higher cerium content materials. In films treated at 350 °C, the crystallite size was independent of composition for cerium molar ratios equal to and greater than 30%. After heating at 550 °C, changes in the crystallite size of films with cerium molar ratios equal to and less than 0.3 was observed. For films not containing Ce and those with a Ce molar ratio of 0.1 the onset of crystallization was observed. The typical crystallite sizes were around 14 nm, while the crystallite size of films with Ce molar ratio of 0.2 and 0.3 increase from 8 to 10 nm and from 3 to 5 nm respectively. Interestingly, the crystallite size of films with higher ceria content did not change at all on heating. Although this dependence on cerium content has been reported previously, it has been observed here that the inclusion of cerium favors the formation of small crystallites around 350 °C and these do no evolve even after heating at 650 °C.25
FE-SEM images of the films surfaces confirmed that the films maintained porosity even after prolonged treatment at 650 °C (Fig. 6). It seems that the films with lower ceria proportion preserve the mesopore order, while those of higher ceria contents partially lose it. Indeed, after 180 min at 650 °C in air, GISAXS diffraction patterns of cerium-poor films show strong diffraction of the (10) reflection, while those of cerium-rich samples barely showed any periodicity.
Fig. 7 shows the porosity of films before and after the treatment at 550 °C. The adsorption isotherms of samples with x = 0.1 (Fig. 7A) and x = 0.2 (not shown) changed from type IV with H2 hysteresis loops, characteristic of pores connected via constrictions, to type IV with H1 loops, characteristic of cylindrical or slit-like pores. The onset of adsorption and desorption branches was also shifted to higher pressures, suggesting a pore size increase (Fig. 7B). This change in the isotherm shape is well known in nanocrystalline mesoporous materials and is likely due to contraction of the films that produces pore fusion on the planes perpendicular to the substrate which in turn results in slit-shaped pores and a grid-like texture on the surface.39,40 When x > 0.2, this change is no longer observed although a small decrease in adsorption volume due to contraction can be noted (Fig. 7C and D).
Fig. 8 GIXRD of Zr1−xCexO2 treated at different temperatures. (A) T = 350 °C; (B) T = 650 °C 30 min; (C) T = 650 °C 3 h. |
The reflections present in the XRD patterns and the associated cell parameters are independent of flash treatment, indicating that no phase segregation occurs.
The changes in crystalline domain size for different treatments and composition also provide valuable information on the effect of temperature. When the Ce content of the film is high, the crystalline domain size remains the same and small (∼5 nm) for both tested temperatures. On the contrary, when the cerium content is low, crystallinity is not observed until the samples are treated at 550 °C, whereupon the crystalline domain sizes are at least three times larger. SAED experiments (see Fig. S7†) reveal that films with low Ce contents are barely crystalline after treatment at 350 °C, showing only weak diffuse halos. In contrast, the SAED of films heated to 550 °C show well defined rings with bright spots. The presence of well defined spots suggests that large crystallites exist in the sample. On the contrary, SAED of samples with equal proportion of Zr and Ce exhibit wide homogeneous rings, indicating that the material is composed of multiple small crystalline domains. Indeed, HRTEM images (Fig. 9) confirm that films with low Ce content have a very low degree of crystallization before heating at 550 °C, whereas after this thermal treatment large crystalline domains are observed. Images of films with equal ratios of Ce and Zr show small crystalline domains throughout the sample for both thermal treatments. The fact that properly oriented crystalline planes are found throughout the image confirms that many crystallites with multiple orientations exist within the field of view.
Fig. 9 HR-TEM of Zr0.9Ce0.1O2 films treated at 350 °C (A) and 550 °C (B and C) and of Zr0.5Ce0.5O2 films treated at 350 °C (D) and 550 °C (E and F). |
It can be hypothesized that from certain Ce content, stable clusters of defined Ce molar ratio form and that these dictate the behavior of the films. The stability of these clusters would explain the inert nature of the sols (vide supra), the higher initial crystallinity of Ce-rich films and the fact that further crystallization is inhibited. It is also possible that Ce preferentially migrates to the surface of the crystallites, stabilizing the interface. In these cases, small inhomogeneities in the composition could exist at the nm scale. The higher ionic mobility in the crystallite interface could favour material migration, leading to larger morphological changes during heat treatments.
UV-Vis spectra of all film compositions showed a band with a maximum at a wavelength between 270 and 290 nm, whose intensity increases with ceria content (Fig. 10A). Moreover, absorbance is linearly correlated (R2 = 0.9991) with the ceria content (Fig. 10B). For all compositions, this band was overlapped with a spectrum equivalent to that of a pure zirconia film (x = 0). The appearance of the ∼280 nm band and its linear increase with Ce content indicates that its origin is due to electronic transitions involving Ce centers. Indeed, it has been reported that this band can be assigned to Ce4+ ← O2− charge transfer transitions.41,42
The spectroscopic ellipsometry signal was modelled using a Cauchy–Lorentz relationship43 to describe the films refractive index (see ESI†). This dispersion relationship describes a dielectric material (Cauchy) with absorption at defined wavelengths. The different λmax obtained from UV-Vis spectroscopy were used as seeds to start the iterative modeling process. As shown in Fig. 10C, the extinction coefficient k follows the same trend observed by UV-Vis, which is a good indication that the ellipsometric model used for this system is robust. As k and n are bound variables that define the complex refractive index, after the iteration process both values are obtained. Considering that the MPTF is a mixture of Zr1−xCexO2 and the air contained in the pores, knowing the porosity, and using the Bruggeman effective medium approximation,44 it is possible to obtain the refractive index of the walls nwalls for each of the compositions studied (Fig. 10D). The reported refractive index for pure ceria thin films are in the range of 2.40–2.56, and previously reported results for zirconia thin films indicate that n550 = 2.1.45 Considering that sol–gel materials always present some degree of microporosity, which is not taken into account in the adsorbed volume found by EEP, the obtained refractive indexes here are in all cases lower than those reported for thin films when the material is obtained as a dense oxide. Nevertheless, the trend is the expected, i.e., n632 is higher when the films have higher ceria content.
Zirconia structures present a marked absorption in the UV range (5.3 to 5.7 eV, depending on the technique used), which corresponds to direct or indirect band gaps that are very similar in energy.46 In order to evaluate the effect of Ce(IV) doping on the energetics of the mesoporous film framework, we analyzed the absorption spectra in this high energy band gap region. The spectra were fit to the Tauc relationship for a direct band-gap,47 applied to both UV-Vis absorption and spectroscopic ellipsometry (SE) data. Eg values obtained from linear fitting in the high energy region are gathered in Table 2. An excellent coincidence is observed between the absorption and SE for the pure zirconia phase; the addition of Ce(IV) seems to have a complex impact in the energy gap of these materials. In recent work, it was observed that addition of Ce(IV) to zirconia leads to a monotonous shift of the band gap to lower energies (see Table 2).
Composition (xCe) | Eg/eV (UV-Vis) | Eg/eV (SE) | Eg/eV (ref. 48) |
---|---|---|---|
0.0 | 5.60 | 5.62 | 4.92 |
0.1 | 5.88 | 5.64 | 4.80 |
0.2 | 5.83 | 5.63 | 4.68 |
0.3 | 5.81 | 5.63 | 4.57 |
0.4 | 5.80 | 5.54 | 4.45 |
0.5 | 5.73 | 5.51 | 4.33 |
In the mesoporous and nanocrystalline thin film systems investigated here, the values of the direct zirconia Eg increase slightly (if measured by UV-Vis), or remain almost constant (SE) for cerium contents below 30%. Above these Ce(IV) contents, a decrease in the band gap is observed, in agreement with previous work.48 The band gap behaviour of the Zr-rich samples can be ascribed to an additional effect. In our systems, the presence of Ce ions in the oxides results in a significant decrease in the crystallite size (see Fig. 5), which can justify the Eg shift to higher energies due to confinement. Above 20–30% cerium substitution, the doping effect of the cation seems to prevail above the crystallite effect. In addition, the crystallite sizes in the case of our nanocrystalline and mesoporous mixed Zr–Ce oxides are in the range of 5–15 nm, which could explain the higher band gap energies of these mesoporous mixed oxides relative to the ca. 25 nm thick films epitaxially oriented, reported in ref. 48.
Footnote |
† Electronic supplementary information (ESI) available. See DOI: 10.1039/c7ra03647g |
This journal is © The Royal Society of Chemistry 2017 |