Issue 9, 2017

Simulated photoelectron intensities at the aqueous solution–air interface for flat and cylindrical (microjet) geometries

Abstract

Ion spatial distributions at the aqueous–air/vacuum interface are accessible by energy-dependent X-ray photoelectron spectroscopy (XPS). Here we quantify the difference between a flat surface and a cylindrical microjet in terms of the energy-dependent information depth of the XPS experiment and in terms of the simulated photoelectron intensities using solutions of pure water and of 1 mol L−1 NaI as examples.

Graphical abstract: Simulated photoelectron intensities at the aqueous solution–air interface for flat and cylindrical (microjet) geometries

Supplementary files

Article information

Article type
Communication
Submitted
03 নভে. 2016
Accepted
27 জানু. 2017
First published
30 জানু. 2017

Phys. Chem. Chem. Phys., 2017,19, 6330-6333

Simulated photoelectron intensities at the aqueous solution–air interface for flat and cylindrical (microjet) geometries

G. Olivieri, K. M. Parry, C. J. Powell, D. J. Tobias and M. A. Brown, Phys. Chem. Chem. Phys., 2017, 19, 6330 DOI: 10.1039/C6CP07539H

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.

Social activity

Spotlight

Advertisements