Ryoji
Okamoto
,
Koki
Yamasaki
and
Naruo
Sasaki
*
Department of Engineering Science, Graduate School of Informatics and Engineering, The University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo 182-8585, Japan. E-mail: naruo.sasaki@uec.ac.jp
First published on 18th September 2018
We developed a new potential model to simulate the adhesive characteristics of the peeling process of an armchair-type graphene sheet from a frictionless graphite substrate surface. First the transition of the shape of the graphene sheet and the vertical force curve during the peeling process obtained by this model successfully reproduced those obtained by our previous model. The computation time by this potential model is reduced to 1/6400 compared to that by our previous model. Next this potential model was extended to include the effective stiffness of atomic force microscopy (AFM) which consists of the stiffness of the cantilever, tip and contact region. A characteristic step structure of the vertical force curve is obtained by the extended model. Our approach opens new directions for multiscale physics of the peeling process of a π-conjugated sheet from atomic-scale to micrometer-scale, and interpretation of force-spectroscopy observed by AFM.
We have so far performed numerical and experimental studies of the atomic-scale peeling and adhesion mechanics of a monolayer graphene sheet adsorbed onto a graphite surface. The peeling process of the graphene sheet was numerically studied based on the molecular relaxation technique using structural optimization.4–7 The peeling process of both a monolayer graphene sheet and a multilayer graphene plate with a thickness of several mm was also studied by using atomic-force microscopy (AFM) measurement.8 Based on the comparison between simulation and experiment, frictional and adhesive features during the surface contact were revealed.8 However, in the previous simulation the following problems are yet to be solved: (1) it is difficult to separate the pure effect of adhesion from that of friction during the peeling process. (2) Direct comparison of the simulated vertical force curve with the experimental force curve is difficult. (3) Computation time becomes larger as the graphene size increases. Therefore, in Section 2, in order to solve the above three problems, a new potential model to describe the adhesive characteristics during the peeling process of the graphene sheet was developed, and simulated results were compared with those obtained by our previous model. In Section 3, the present model is extended to simulate the vertical force curve of AFM.
Then this model shown in Fig. 1(a) is simplified using a structural symmetry of the armchair-type graphene sheet in order to reduce computation time. First, as illustrated in Fig. 1(b), the rectangular graphene sheet is modeled by a parallel spring comprising NW zigzag carbon chains, each of which consists of NL atoms. When each zigzag chain is projected onto the xz plane, it can be regarded as a serial spring as illustrated in Fig. 1(c). Here, in order to focus only on the adhesion characteristics and reduce the computation time, the substrate surface of the rigid graphene sheet is modeled by an infinite frictionless continuum sheet. Thus the problem is ascribed to the peeling process of a parallel spring comprising NW atom-spring chains, each of which consists of NL atoms as shown in Fig. 1(d). Here it is assumed that NW equivalent atom-spring chains are lifted simultaneously from the substrate surface just in phase during the peeling process.
The total energy Vtotal of the system comprising NW parallel atom-spring chains and a continuum surface is described by the sum of the following potential functions, vstrGr, vbendGr and vintGr–S as follows,
![]() | (1) |
Here the rectangular graphene sheet comprising 310 carbon atoms used in our previous simulation4–7 corresponds to parameters NW = 10 and NL = 31 (1 ≤ i ≤ NL).
First vstrGr represents the stretching energy between the nearest neighboring carbon atoms i and j of the graphene sheet within the xz plane. vstrGr is written as a function of the distance between i and j, rij (Fig. 1(d)), within the xz plane as follows,
![]() | (2) |
000 carbon atoms along the x direction and calculating the second derivatives of the total elastic energy based on the Tersoff potential.9
Next vbendGr represents the bending energy between the neighboring carbon atoms i, j and k of the graphene sheet within the xz plane. vbendGr is written as a function of the angle among i, j and k, θijk (Fig. 1(d)), within the xz plane as follows,
![]() | (3) |
Finally vintGr–S is an interaction energy acting between the graphene sheet and the infinite frictionless continuum sheet as mentioned above. Therefore vintGr–S is calculated by the integration of the Lennard-Jones (LJ) potential function, vLJ(ri) = 4ε[(σ/ri)12 − (σ/ri)6] over the continuum sheet. Here ri means the distance between the i-th carbon atom of the graphene sheet and the arbitrary position within the continuum sheet. Thus vintGr–S is obtained as
![]() | (4) |
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| Fig. 2 Transition of the shape of the armchair graphene sheet during the peeling process from A to I within the xz plane obtained by (a) the present model and (b) the previous model.4–7 Δz is a peeling distance from the initial position. (a) and (b) are in very good agreement with each other for each Δz. | ||
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| Fig. 3 The vertical force FZ, acting on the lifting edge, plotted as a function of Δz during the peeling process obtained by (a) the present model and (b) the previous model.4–7 (a) and (b) are in very good agreement with each other except for atomic corrugation at surface- and line-contact regions. | ||
First the graphene sheet is located parallel to the substrate surface and it takes surface contact with the surface (Fig. 2(a)A) for Fz = 0 nN (Fig. 3(a)A). Just after it is lifted (Fig. 2(a)B), the vertical force takes the maximum attractive force |Fz| = 1.19 nN (Fig. 3(a)B). After that, as the peeling proceeds, the surface contact area gradually decreases (Fig. 2(a)B–D) and Fz increases (Fig. 3(a)B–D).
For the lifting position Δz = 3.12 nm, the surface contact breaks and the line contact appears (Fig. 2(a)E). Similar to our previous simulations, the line contact is defined as follows: (1) Repulsive interaction force acts on the atoms on the outermost right edge. (2) Attractive interaction force acts on the second atoms from the outermost right edge. These two conditions are satisfied at Δz = 3.11nm, but not at Δz = 3.12 nm, where the transition from the surface contact to the line contact occurs. For the line contact, as the peeling proceeds, the curved shape of the graphene sheet (Fig. 2(a)E and F) gradually turns into the line shape (Fig. 2(a)G). The attractive force |Fz| decreases to nearly zero (Fig. 3(a)E and F) and increases a little again (Fig. 3(a)G).
Then at Δz = 3.80 nm, the condition of the line contact is not satisfied any longer, and the line contact breaks (Fig. 2(a)H). As the graphene sheet is lifted further (Fig. 2(a)I), the attractive force |Fz| increases (Fig. 3(a)H and I) to take a maximum value (Fig. 3(a)I), and then it decreases to zero, which results in the complete peeling of the graphene sheet from the substrate surface.
The peeling process obtained by the present atom-spring potential model is compared with that obtained by our previous model using Tersoff potential and modified LJ potential.4–7 The transition of the shape of the graphene sheet obtained by the present atom-spring model (Fig. 2(a)A–I) completely reproduces that obtained by our previous model (Fig. 2(b)A–I). The lifting position of the transition from the surface- to the line-contact region E deviates quite a little by Δ|Δz| = 0.01 nm. Similarly, the vertical force curve obtained by the present model (Fig. 3(a)) is in good agreement with that obtained by our previous model (Fig. 3(b)) except for the atomic-scale corrugation appearing during the surface contact region (Fig. 3(b)B–D) and the line contact region (Fig. 3(b)E–G). This is due to the effect of modeling whether friction is included or not. Since our present model includes no effect of friction, the computation time is reduced to 1/6400 compared with that of our previous simulation. Thus it is clarified that our potential model is suitable for describing the adhesion characteristics of the peeling process with small computation time.
| T ≈ 2NL × ΔT = 2NL × NL × (tstr + tbend + tint). | (5) |
| Told ≈ 3N × N × (Ncovtcov + NLJtLJ). | (6) |
![]() | (7) |
In addition, decrease of the number of arithmetic operations and that of I/O with the file can contribute to the reduction of the computation time. The bottleneck of the real computation time T ∝ NL2 is clearly a number of the mass point of the present model, NL, which can be decreased by a coarse-grained method adopted often for the case of the polymeric materials.
![]() | (8) |
![]() | (9) |
Thus the total energy Vtotal of the extended system is obtained as
![]() | (10) |
Parameters used for the simulation are chosen as follows: First keff = 3 N m−1, the typical order of the magnitude of the cantilever spring constant of the contact AFM, is determined as the slope of the experimental Δz–FZ curve8 just before the maximum attractive force |FZ| appears during the peeling process. Then the graphene size, NL and NW, and the contact area, Neff, are chosen by reproducing the following quantities observed by AFM measurement:8 (1) the maximum attractive force |FZ|, (2) FZ just before the surface contact breaks, and (3) the distance between the maximum attractive position and pull off position. As a result, NL = 671, NW = 8.5 × 102 and Neff = 6, are determined. These parameters correspond to the submicrometer-size graphene sheet with a length of 85 nm and a width of 186 nm.
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| Fig. 6 Transition of the shape of the armchair graphene sheet during the peeling process from A to F within the xz plane obtained by the extended model. | ||
The method we have proposed is universal and can be applied to the study of adhesion properties of any nanostructure on any substrate. Therefore the effective potential can be determined only if the total energy can be obtained as a function of the characteristic deformation variables, whichever classical-, tight binding- or quantum mechanical/chemical method you use. Thus, in our new method, any model and calculation method will do. Therefore the present method can be applied even to the case of a polymeric material with many atomic species.
In the present simulation a bare-edge graphene sheet is adopted. However, since chemical bonding of the graphene edge gives marked chemical interaction with the substrate, preliminary simulation has been performed for the hydrogen(H-) terminated graphene sheet using AIREBO potential. The vertical peeling force curve for the H-terminated graphene sheet is quite similar to Fig. 3(b) for the bare-edge graphene sheet. Furthermore, the maximum adhesion forces for the H-terminated and bare-edge graphene sheets are only by several percents different from each other. Thus the peeling process of the bare-edge graphene is qualitatively similar to that of the H-terminated graphene sheet particularly for the surface contact region. Such chemical bonding effect of the graphene edge is now being studied and will be systematically discussed in the near future.
Then this potential model is extended to include the effective stiffness of AFM comprising the stiffness of the cantilever, tip and contact region. The characteristic step structure of the vertical force curve is obtained by the extended model. In the previous experimental studies, it was reported that submicrometer-scale multiple step structures appear in the force curve for the 50 nm thick graphite flake.8 The interpretation of such submicrometer-scale force spectroscopy has been so far difficult. However the new potential model developed in this work is expected as a time-consuming simulator of the peeling process of such a submicrometer-scale multilayer graphene sheet. By using this extended model, direct comparison with atomic-force microscopy (AFM) measurement becomes possible. Thus our approach opens new directions for multiscale physics of the peeling process of the π-conjugated sheet from atomic-scale to micrometer-scale, and interpretation of force-spectroscopy observed by AFM.
Footnote |
| † Electronic supplementary information (ESI) available: Movies of a simulation of the peeling of a graphene sheet (Fig. 2(a) and 6). See DOI: 10.1039/c8qm00267c |
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