Savio J. A.
Moniz
ab,
Raul
Quesada-Cabrera
a,
Christopher S.
Blackman
*a,
Junwang
Tang
b,
Paul
Southern
c,
Paul M.
Weaver
d and
Claire J.
Carmalt
a
aMaterials Chemistry Centre, Department of Chemistry, University College London, 20 Gordon Street, London, WC1H 0AJ, UK. E-mail: c.blackman@ucl.ac.uk
bDepartment of Chemical Engineering, University College London, Torrington Place, London, WC1E 7JE, UK
cUCL Healthcare Biomagnetics Laboratories, 21 Albemarle Street, London, W1S 4BS, UK
dNational Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK
First published on 20th December 2013
A novel method for preparation of BiFeO3 films via a simple solution-based CVD method is reported using for the first time a single-source heterobimetallic precursor [CpFe(CO)2BiCl2]. BiFeO3 films display ferroelectric and ferromagnetic ordering at room temperature and possess direct band-gaps between 2.0 and 2.2 eV. Photocatalytic testing for water oxidation revealed high activities under UVA (365 nm) and simulated solar irradiation, superior to that exhibited by a commercial standard (Pilkington Activ® TiO2 film) resulting in an apparent quantum yield of ∼24%.
Chemical Vapour Deposition (CVD) has many potential advantages for deposition of BiFeO3 thin films including excellent substrate coverage, low-cost, ease of scale-up, control over thickness and morphology and high throughput capabilities, however the growth of phase-pure BiFeO3 films using chemical deposition techniques is challenging.10–12 It has been suggested that single-source heterometallic precursors could be exploited in order to improve stoichiometry control in multicomponent materials.12,13 However no examples for BiFeO3 thin films appear in the literature despite the availability of a number of bimetallic bismuth-iron containing complexes, i.e. [Bi2(Hsal)6·M(acac)3] (M = Al, V, Cr, Fe, Co)14 and [Bi2M(hfac)8] (M = Mn, Fe, Co, Ni, Cu, Zn)15 which could serve as potential precursors. Here, we describe the growth of BiFeO3 films onto a variety of substrates via a simple, low-cost solution based aerosol assisted (AA)CVD process utilizing the single-source precursor [CpFe(CO)2BiCl2] (Cp = cyclopendienyl, C5H5). AACVD is advantageous as it does not rely upon the use of highly volatile precursors, essential for typically high molecular weight heterometallic cluster compounds.16 Post-deposition heat treatment of as-deposited films resulted in pure BiFeO3 at 700 °C, confirmed via XRD, low temperature Raman and XPS spectroscopy. BiFeO3 films displayed the expected ferroelectric and ferromagnetic behavior and possessed direct band-gaps of ∼2.1 eV and we have demonstrated the films to be highly active photocatalysts for water oxidation under simulated solar irradiation. This new synthetic methodology enables large area thin film deposition, and hence is relevant for high volume applications such as solar driven water oxidation or organic pollutant degradation for water treatment.
Annealing temp. °C | Phase(s) obtained via XRD | At% Bi:Fe (from WDX) | Av. film thickness/nm | Band-gap/eV | At% Cl contamination (from WDX) |
---|---|---|---|---|---|
300 (as deposited) | Bi24Fe2O39 | 74:23 | 1700 | n/a | 3 |
400 | Bi24Fe2O39 + Bi2Fe4O9 | 60:38 | 1580 | n/a | 2 |
500 | BiFeO3 + Bi2Fe4O9 | 58:41 | 1110 | 2.0 | <1 |
600 | BiFeO3 + Bi2Fe4O9 | 53:47 | 680 | 2.2 | 0 |
700 | BiFeO3 | 51:49 | 320 | 2.1 | 0 |
Post-deposition annealing at increasing temperature led to a decrease in film thickness and relative loss of bismuth (to iron), most likely as bismuth or bismuth oxide,24 and progressive conversion of Bi24Fe2O39 to Bi2Fe4O9 and subsequently to BiFeO3 in agreement with the phase diagram constructed by Scott25 and Lu.26 Raising the annealing temperature to 700 °C caused the Bi:Fe ratio to become near unity (Bi 51 at%, Fe 49 at%) and the appearance of the films changed from dark orange (as-deposited) to bright orange. At 700 °C BiFeO3 was the only phase present via XRD [Fig. 1(b), a = b = 5.588(4) Å, c = 13.913 (6) Å, space group R3c, bulk BiFeO3a = b = 5.57414 (4) Å, c = 13.85882 (12) Å, PDF = 014-0181].27 Raman analysis further confirmed the assignment of phase pure BiFeO3 (ESI, Fig. S2†). Chlorine contamination from the precursor was initially high for the as-deposited film and for those annealed at 400 °C (2.5 and 1.6 at% respectively), however this contamination decreased dramatically as a function of annealing temperature and by 600 °C was below the detection limit of WDX.
XPS of a film annealed at 700 °C showed the presence of iron in the +3 oxidation state [Fe 2p3/2, 711.3 eV (Fig. S3, ESI†)] with the expected Fe3+ satellite peak observed at 718.9 eV.12 Oxygen under stoichiometry, leading to a co-existence of Fe2+ and Fe3+ species, leads to broadening of the Fe 2p3/2 peak to lower energies but this was not observed in our samples. A single Bi 4f7/2 ionisation at 159.4 eV was observed, characteristic of bismuth in the +3 oxidation state, as expected for BiFeO3.23 No chlorine contamination was detected via XPS; carbon was observed on the surface but decreased upon etching indicating it to be surface contamination. Analysis of the Bi 4f, Fe 2p and O 1s (B.E. of O 1s = 530.2 eV) peak areas after etching indicated the presence of the three components in an approximate 1:1:3 ratio, commensurate with BiFeO3.
As-deposited films (300 °C) possessed a globular morphology, with average particle diameters of 100 nm (ESI, Fig. S4†). Heat treatment at higher temperatures led to coalescence of particles (ESI, Fig. S5†), whilst at 700 °C (Fig. 2(a)) the sintering of the particles led to films becoming rougher and less uniform; AFM (Fig. 2(c and d)) showed the films to be comprised of larger aggregates with a rough texture (root mean squared roughness (rms) = 62 nm) in agreement with SEM. Hence films synthesised by this route are likely to possess high surface areas for enhanced catalytic activity.
Fig. 2 (a) A typical top-down SEM image (b) side-on SEM image, (c) a 5 μm field size AFM image and (d) the corresponding 3D AFM image of the BiFeO3 film formed after annealing at 700 °C. |
Films of BiFeO3, grown by deposition directly onto 1 cm2 Pt/SiO2/Si wafers via AACVD followed by annealing at 700 °C, displayed a maximum polarisation of 8.7 μC cm−2, providing an effective relative permittivity of almost 800 (ESI, Fig. S6†). The maximum polarisation is smaller than that for single crystal or epitaxial film bismuth ferrite (around 50 μC cm−2),28 but higher than those obtained for BiFeO3 films grown via sol–gel processing (Pr = 1.8 μC cm−2)29 or PLD (Pr = 0.83 μC cm−2).30 Measurement of the magnetic properties of a 320 nm thick film (ESI, Fig. S7†) revealed that the M–H hysteresis loops recorded at 5 K and 300 K were similar to those reported previously28 (after subtracting the diamagnetic contribution from the substrate), i.e. these BiFeO3 films show weak ferromagnetic behaviour with well-saturated hysteresis loops at both temperatures. Upon raising the temperature to 300 K the coercivity was measured as 135 Oe and −115 Oe with an expected decrease in saturation magnetisation to 8.9 emu cm−3. The coercivity is lower than that observed for a 70 nm thick BiFeO3 film grown via PLD (200 Oe)31 although a decrease in magnetisation as a function of increasing film thickness was observed, from 150 emu cm−3 for a 70 nm thick film to 5 emu cm−3 for a 400 nm thick film, consistent with our measurement of film thickness (∼320 nm). Spin-glass behaviour was also observed from M–T measurements (ESI†).
A typical transmission spectrum of a film containing BiFeO3 as the only crystalline phase (ESI, Fig. S8†) shows over 70% transmittance in the 800–2500 nm range with the cut-off from the glass substrate coming into effect below 380 nm. The band-gaps of the films were calculated using Tauc plots (see Fig. S9, ESI†).32 Extrapolating the linear part of the plot to the x-axis for a phase-pure sample resulted in an intercept of approximately 2.1 eV, in good agreement with experimentally derived band-gap values for BiFeO3; films with smaller band-gaps (2.0 eV) contained impurity Bi2Fe4O9 and are in line with the expected decrease in band-gap of Bi2Fe4O9 compared to BiFeO3.33,34
For photoelectrochemical (PEC) measurements BiFeO3 was grown on FTO coated glass substrates. In order to estimate the relative levels of the conduction and valence bands of BiFeO3 electrical impedance measurements were carried out from which the flat-band potential (Efb) was measured. Fig. 3(a) displays the Mott–Schottky plot for a BiFeO3 film deposited onto FTO coated glass. For n-type semiconductors the flat-band potential (Efb) is considered to be located just under the conduction band, hence Efb of BiFeO3 was estimated to be −0.31 V (vs. Ag/AgCl) or + 0.18 V (vs. RHE),35,36 which is similar to values previously estimated from atomic electronegativities.37 Based upon this value and that determined for the band-gap of BiFeO3 (2.1 eV), a band diagram (Fig. 3(b)) was constructed, indicating BiFeO3 has significant overpotential for photocatalytic water oxidation.
The photoanodic activity of BiFeO3 was investigated using PEC measurements and also via oxygen evolution using a sacrificial electron acceptor solution. Fig. 4 shows the chronoamperometry measurement obtained from a BiFeO3 photoelectrode under 1 Sun (100 mW cm−2) AM 1.5G illumination. There is a steady increase in photocurrent with increasing potential and the photocurrent at 1.0 V vs. Ag/AgCl was appreciable (ca. 0.1 mA cm−2 (103 μA cm−2)). This value is similar to that obtained by Yu et al.38 for BiFeO3 films deposited via PLD onto platinised silicon substrates (∼90 μA cm−2 at 1.0 V vs. Ag/AgCl, 400 W Xe lamp) but substantially higher than the current density reported for hydrothermally synthesised BiFeO3 nanocube electrodes in pure water (5.2 μA cm−2 at 1.0 V vs. SCE, 500 W Hg lamp)39 and higher than BFO/SRO/STO films grown via sputtering (10 μA at 0.64 V vs. Ag/AgCl).40
In order to verify the water oxidation activity, tests for oxygen evolution from a Na2S2O8/NaOH sacrificial solution were carried out using an MPD cell (see ESI† for more details) and compared to a commercial standard photocatalyst (Pilkington Activ® glass).41 The overall photocatalytic reaction is given by eqn (1).
2S2O82− + 2H2O → 4SO42− + 4H+ + O2 | (1) |
Fig. 5 shows the typical output of the MPD cell during photo-generation of oxygen on BiFeO3 films under full-arc Xe-lamp irradiation (150 W) with the corresponding amounts of oxygen produced during the first 10 h irradiation shown in Fig. 5(b). The output reading shows an increase in voltage during an initial illumination period followed by a plateau around 0.05 V, indicating steady oxygen production during prolonged irradiation (above 20 h). A small drop in the signal when turning on the Xe lamp, attributed to an interruption of the electrical supply, was observed however this did not affect the observed rate. Signal drift was also observed after prolonged use of the MPD cell, as illustrated by the blank test carried out on uncoated glass, however signal drop was noted after switching off the light source demonstrating the oxygen evolution was a photocatalytic effect. In addition no change in voltage, i.e. no oxygen evolution, was observed in the absence of illumination. The oxygen rates and % O2 yields obtained during UVA irradiation of BiFeO3 and Activ® glass films are given in Table 2.
Rate of O2 evolution (μmol h−1) | O2 yield (%, 365 nm) | ||
---|---|---|---|
Solar lamp | UVA | ||
BiFeO3 | 0.33 | 0.023 | 24.4 |
TiO2 (Activ) | 0.26 | 0.012 | 4.8 |
The % O2 yield of the process has been determined according to eqn (2).
% O2 yield = (molecules formed/incident photons) × 4 (electrons) × 100% | (2) |
An average O2 yield of 24.4% (365 nm) was obtained for BiFeO3 (in the absence of co-catalyst) which represents a near 10-fold increase over optimised B-doped TiO2 films investigated under identical conditions.42 The O2 yield of the Activ® reference was ∼5% at 365 nm. It should be noted that the BiFeO3 films tested were significantly thicker (∼300 nm) than that reported for the TiO2 layer in Activ® glass (∼15 nm). XPS and X-ray diffraction patterns of the films conducted after photocatalytic testing revealed no change in composition or phase indicating that these BiFeO3 films are robust under the basic conditions of the test and do not undergo photocorrosion, which was supported by the continued measurement of oxygen evolution on prolonged irradiation and subsequent tests which proved the effect was reproducible. Visible-light tests were also carried out using UV cut-off filters under similar experimental conditions however no increase in voltage could be distinguished above the signal drift of the MPD cell. This is perhaps not surprising given the photocatalytic activity of BiFeO3 powders for oxygen evolution (from a FeCl3 solution) using visible light irradiation (500 W Hg lamp, λ > 420 nm) is less than 0.2 μmol h−1,39 and hence we are currently investigating more suitable methods for evaluating the visible light activity of BiFeO3 thin films. The high photocatalytic activity for water oxidation displayed by our BiFeO3 films may not be solely due to the high surface area of thin films; it has recently been reported that ferroelectric domains in BiFeO3 enhance charge-carrier separation through photocatalytic decomposition of AgNO3, resulting in selective Ag reduction on the surface and simultaneous oxygen evolution under visible light irradiation.43,44
Footnote |
† Electronic supplementary information (ESI) available: Further experimental details, DSC–TGA pattern of [{Cp(CO)2Fe}BiCl2], Raman spectrum of a pure BiFeO3 film recorded at −195 °C, XPS spectrum of the Fe 2p region of a BiFeO3 thin film after etching, top-down SEM images of Bi24Fe2O39 film deposited on glass at 300 °C, top-down SEM images of the films annealed between 400 and 650 °C, P–E hysteresis loop for a pure BiFeO3 film on Pt/SiO2/Si substrate, M–H and ZFC–FC curves for BiFeO3 film, UV-vis spectrum of a pure BiFeO3 film, corresponding Tauc plot for a BiFeO3 film. See DOI: 10.1039/c3ta14824f |
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