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A high impact peer reviewed journal publishing experimental and theoretical work across the breadth of nanoscience and nanotechnology


Impact of oxygen exchange reaction at the ohmic interface in Ta2O5-based ReRAM devices

Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
JARA-Fundamentals in Future Information Technology, Germany
E-mail: w.kim@fz-juelich.de
Institute of Materials in Electrical Engineering and Information Technology II, RWTH Aachen University, 52074 Aachen, Germany
Engineering Department, University of Cambridge, Cambridge CB2 1PZ, UK
Nanoscale, 2016,8, 17774-17781

DOI: 10.1039/C6NR03810G
Received 11 May 2016, Accepted 07 Aug 2016
First published online 15 Aug 2016
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