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A high impact peer reviewed journal publishing experimental and theoretical work across the breadth of nanoscience and nanotechnology


Impact of oxygen exchange reaction at the ohmic interface in Ta2O5-based ReRAM devices

Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
JARA-Fundamentals in Future Information Technology, Germany
Institute of Materials in Electrical Engineering and Information Technology II, RWTH Aachen University, 52074 Aachen, Germany
Engineering Department, University of Cambridge, Cambridge CB2 1PZ, UK
Nanoscale, 2016,8, 17774-17781

DOI: 10.1039/C6NR03810G
Received 11 May 2016, Accepted 07 Aug 2016
First published online 15 Aug 2016
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