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Issue 1, 2010
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Following interfacial kinetics in real time using broadband evanescent wave cavity-enhanced absorption spectroscopy: a comparison of light-emitting diodes and supercontinuum sources

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Abstract

A white light-emitting diode (LED) with emission between 420 and 700 nm and a supercontinuum (SC) source with emission between 450 and 2500 nm have been compared for use in evanescent wave broadband cavity-enhanced absorption spectroscopy (EW-BB-CEAS). The method is calibrated using a dye with known absorbance. While the LED is more economic as an excitation source, the SC source is superior both in terms of baseline noise (noise equivalent absorbances lower than 10−5 compared to 10−4 absorbance units (a.u.)) and accuracy of the measurement; these baseline noise levels are comparable to evanescent wave cavity ringdown spectroscopy (EW-CRDS) studies while the accessible spectral region of EW-BB-CEAS is much larger (420–750 nm in this study, compared to several tens of nanometres for EW-CRDS). The improvements afforded by the use of an SC source in combination with a high sensitivity detector are demonstrated in the broadband detection of electrogenerated Ir(IV) complexes in a thin-layer electrochemical cell arrangement. Excellent signal to noise is achieved with 10 µs signal accumulation times at a repetition rate of 600 Hz, easily fast enough to follow, in real time, solution kinetics and interfacial processes.

Graphical abstract: Following interfacial kinetics in real time using broadband evanescent wave cavity-enhanced absorption spectroscopy: a comparison of light-emitting diodes and supercontinuum sources

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Publication details

The article was received on 12 Aug 2009, accepted on 13 Nov 2009 and first published on 24 Nov 2009


Article type: Paper
DOI: 10.1039/B916712A
Citation: Analyst, 2010,135, 133-139
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    Following interfacial kinetics in real time using broadband evanescent wave cavity-enhanced absorption spectroscopy: a comparison of light-emitting diodes and supercontinuum sources

    L. van der Sneppen, G. Hancock, C. Kaminski, T. Laurila, S. R. Mackenzie, S. R. T. Neil, R. Peverall, G. A. D. Ritchie, M. Schnippering and P. R. Unwin, Analyst, 2010, 135, 133
    DOI: 10.1039/B916712A

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