Issue 4, 2024

3D simulation of conductive nanofilaments in multilayer h-BN memristors via a circuit breaker approach

Abstract

A 3D simulation of conductive nanofilaments (CNFs) in multilayer hexagonal-BN memristors is performed. To do so, a simulation tool based on circuit breakers is developed including for the first time a 3D resistive network. The circuit breakers employed can be modeled with two, three and four resistance states; in addition, a series resistance and a module to account for quantum effects, by means of the quantum point contact model, are also included. Finally, to describe real dielectric situations, regions with a high defect density are modeled with a great variety of geometrical shapes to consider their influence in the resistive switching (RS) process. The simulator has been tuned with measurements of h-BN memristive devices, fabricated with chemical-vapour-deposition grown h-BN layers, which were electrically and physically characterized. We show the formation of CNFs that produce filamentary charge conduction in our devices. Moreover, the simulation tool is employed to describe partial filament rupture in reset processes and show the low dependence of the set voltage on the device area, which is seen experimentally.

Graphical abstract: 3D simulation of conductive nanofilaments in multilayer h-BN memristors via a circuit breaker approach

Article information

Article type
Communication
Submitted
03 11月 2023
Accepted
01 12月 2023
First published
02 12月 2023
This article is Open Access
Creative Commons BY-NC license

Mater. Horiz., 2024,11, 949-957

3D simulation of conductive nanofilaments in multilayer h-BN memristors via a circuit breaker approach

D. Maldonado, A. Cantudo, F. M. Gómez-Campos, Y. Yuan, Y. Shen, W. Zheng, M. Lanza and J. B. Roldán, Mater. Horiz., 2024, 11, 949 DOI: 10.1039/D3MH01834B

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