Issue 10, 2023

The development of neutron reflectometry as a probe of the nanoscale structure of polymer thin film systems – founded on the pioneering work of Professor Thomas P. Russell

Abstract

Among Professor Russell's numerous, original, and significant contributions to polymer science are those in which he helped pioneer the application of neutron reflectometry to the study of thin film systems. For this groundbreaking work, along with his support of neutron scattering methods in general, he was awarded the 2020 Clifford G. Shull Prize by the Neutron Scattering Society of America, named after and in honor of the Nobel Prize laureate. This article highlights some of the first applications of neutron reflectometry to probe the nanoscale structure of polymer thin film systems that Professor Russell and his colleagues pioneered. A concise account of the subsequent evolution of even more powerful phase-sensitive reflectometry techniques, following the success of their early work, is then presented. In addition to a general description of this current methodology, several particularly relevant and illustrative examples are given.

Graphical abstract: The development of neutron reflectometry as a probe of the nanoscale structure of polymer thin film systems – founded on the pioneering work of Professor Thomas P. Russell

Article information

Article type
Review Article
Submitted
03 12月 2022
Accepted
26 1月 2023
First published
17 2月 2023
This article is Open Access
Creative Commons BY-NC license

Nanoscale, 2023,15, 4725-4737

The development of neutron reflectometry as a probe of the nanoscale structure of polymer thin film systems – founded on the pioneering work of Professor Thomas P. Russell

C. F. Majkrzak, Nanoscale, 2023, 15, 4725 DOI: 10.1039/D2NR06756K

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