Issue 5, 2017
From the journal:

Journal of Analytical Atomic Spectrometry

Standardless semi-quantitative analysis by PIXE

T. Rodríguez,ab   S. Limandri,ab   S. Suárez,c   I. Ortega-Feliud  and  J. Trincavelli ORCID logo *ab  

* Corresponding authors

a Instituto de Física Enrique Gaviola, Ciudad Universitaria, Córdoba, Argentinian Republic

b Facultad de Matemática, Astronomía y Física, Universidad Nacional de Córdoba, Ciudad Universitaria, Córdoba, Argentinian Republic
E-mail: trincavelli@famaf.unc.edu.ar

c Instituto Balseiro, Universidad Nacional de Cuyo, Bustillo 9500, Río Negro, San Carlos de Bariloche, Argentinian Republic

d Centro Nacional de Aceleradores (Universidad de Sevilla-CSIC-Junta de Andalucía), Avda. Thomas A. Edison 7, Seville, Spain

Abstract

A method based on the refinement of atomic and experimental parameters developed for the description of PIXE spectra is presented and applied to standardless semi-quantitative PIXE analysis. This method was implemented in the sofware PAMPA (Parameter Assessment Method for PIXE Analysis) and consists in minimizing the quadratic differences between an experimental spectrum and an analytical function proposed to describe it. The first results of PAMPA are presented for the quantification of synthetic and mineral, thin and bulk samples, and they are compared with the results obtained with a commercial software.

Graphical abstract: Standardless semi-quantitative analysis by PIXE

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Article information

DOI
https://doi.org/10.1039/C7JA00068E
Article type
Paper
Submitted
21 2月 2017
Accepted
11 4月 2017
First published
12 4月 2017

J. Anal. At. Spectrom., 2017,32, 1020-1030

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Standardless semi-quantitative analysis by PIXE

T. Rodríguez, S. Limandri, S. Suárez, I. Ortega-Feliu and J. Trincavelli, J. Anal. At. Spectrom., 2017, 32, 1020 DOI: 10.1039/C7JA00068E

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