Lite Version|Standard version

To gain access to this content please
Log in with your free Royal Society of Chemistry publishing personal account.
Log in via your home Institution.
Log in with your member or subscriber username and password.
Download

A promising thermoelectric figure of merit, zT, of ∼1.3 at 725 K was obtained in high quality crystalline ingots of Ge1−xBixTe. The substitution of Bi3+ in a Ge2+ sublattice of GeTe significantly reduces the excess hole concentration due to the aliovalent donor dopant nature of Bi3+. Reduction in carrier density optimizes electrical conductivity, and subsequently enhances the Seebeck coefficient in Ge1−xBixTe. More importantly, a low lattice thermal conductivity of ∼1.1 W m−1 K−1 for Ge0.90Bi0.10Te was achieved, which is due to the collective phonon scattering from meso-structured grain boundaries, nano-structured precipitates, nano-scale defect layers, and solid solution point defects. We have obtained a reasonably high mechanical stability for the Ge1−xBixTe samples. The measured Vickers microhardness value of the high performance sample is ∼165 HV, which is comparatively higher than that of state-of-the-art thermoelectric materials, such as PbTe, Bi2Te3, and Cu2Se.

Graphical abstract: Reduction of thermal conductivity through nanostructuring enhances the thermoelectric figure of merit in Ge1−xBixTe

Page: ^ Top