Issue 3, 2017

Chiral nanostructure in polymers under different deposition conditions observed using atomic force microscopy of monolayers: poly(phenylacetylene)s as a case study

Abstract

Dynamic poly(phenylacetylene)s (PPAs) adopt helical structures with different elongation or helical senses depending on the types of pendants. Hence, a good knowledge of the parameters that define their structures becomes a key factor in the understanding of their properties and functions. Herein, the techniques used for the study of the secondary structure of PPAs using atomic-force microscopy (AFM) are presented, with special attention directed towards the methods used for the preparation of monolayers, and their consequences in the quality of the AFM images. Thus, monolayers formed by drop casting, spin coating followed by crystallization or annealing, Langmuir–Blodgett and Langmuir–Schaefer methods, onto highly oriented pyrolytic graphite (HOPG) or mica, are described, together with the AFM images and the resulting helical structure obtained for different PPAs. Furthermore, some conclusions are drawn both on the adequacy of the different techniques for the formation of monolayers and on the solid supports utilized to elucidate the secondary structure of different PPAs.

Graphical abstract: Chiral nanostructure in polymers under different deposition conditions observed using atomic force microscopy of monolayers: poly(phenylacetylene)s as a case study

Article information

Article type
Feature Article
Submitted
06 Maw 2016
Accepted
31 Nhl 2016
First published
31 Nhl 2016

Chem. Commun., 2017,53, 481-492

Chiral nanostructure in polymers under different deposition conditions observed using atomic force microscopy of monolayers: poly(phenylacetylene)s as a case study

F. Freire, E. Quiñoá and R. Riguera, Chem. Commun., 2017, 53, 481 DOI: 10.1039/C6CC05598B

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.

Social activity

Spotlight

Advertisements