Volume 225, 2021
From the journal:

Faraday Discussions

Advanced characterisation techniques: multi-scale, in situ, and time-resolved: general discussion

Lee Brammer,   Andrew D. Burrows, ORCID logo   Samantha Yu-ling Chong, ORCID logo   Gavin Craig, ORCID logo   Jack Evans,   Omar Farha,   David Farrusseng,   Michael Fischer, ORCID logo   Andrew Goodwin,   Zhehao Huang,   Ben Johnson,   Stefan Kaskel,   Susumu Kitagawa,   Christophe Lavenn,   Alfred Y. Lee, ORCID logo   Jet-Sing M. Lee,   Ryotaro Matsuda,   Anthony E. Phillips, ORCID logo   Daniel N. Rainer, ORCID logo   Matthew R. Ryder, ORCID logo   Rochus Schmid, ORCID logo   Mohana Shivanna, ORCID logo   Christopher Sumby,   Marco Taddei,   Lui Terry,   Valeska P. Ting, ORCID logo   Monique A. van der Veen ORCID logo  and  Norton G. West ORCID logo  

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Advanced characterisation techniques: multi-scale, in situ, and time-resolved: general discussion

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DOI
https://doi.org/10.1039/D0FD90032J
Article type
Discussion
First published
22 ม.ค. 2564

Faraday Discuss., 2021,225, 152-167

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Advanced characterisation techniques: multi-scale, in situ, and time-resolved: general discussion

L. Brammer, A. D. Burrows, S. Y. Chong, G. Craig, J. Evans, O. Farha, D. Farrusseng, M. Fischer, A. Goodwin, Z. Huang, B. Johnson, S. Kaskel, S. Kitagawa, C. Lavenn, A. Y. Lee, J. M. Lee, R. Matsuda, A. E. Phillips, D. N. Rainer, M. R. Ryder, R. Schmid, M. Shivanna, C. Sumby, M. Taddei, L. Terry, V. P. Ting, M. A. van der Veen and N. G. West, Faraday Discuss., 2021, 225, 152 DOI: 10.1039/D0FD90032J

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