Foundation of correlation ellipsometry

Abstract

An experimental strategy for the detection of fluctuation dynamics at interfaces based on a combination of photon correlation spectroscopy (PCS) with a nulling ellipsometry scheme is investigated theoretically. The intensity description of ellipsometry measurements is generalized to PCS time correlation functions. The nulling ellipsometry procedure is applied for every lag time t of the correlation functions, to extract the dynamics connected to the coherent signal which contains the interface dynamics. The classical ellipsometry parameters Δ and tanΨ are generalized to functions and tan _Q(t). A suitable Siegert relation is derived and employed to show that either field correlation functions or intensity correlation functions after baseline subtraction can be used as the starting point for the nulling ellipsometry procedure.