Haoran
Yu
a,
Liang
Cao
a,
Jiajia
Wang
b,
Jian
Guo
a,
Ji
Zhang
b and
Shan-Tao
Zhang
*a
aNational Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210023, China. E-mail: stzhang@nju.edu.cn
bSchool of Materials Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
First published on 10th July 2025
Pb(Ni1/3Nb2/3)O3-PbZrO3-PbTiO3 (PNN-PZ-PT) is one of the typical relaxor-PT piezoelectric systems. In order to further improve its Curie temperature (Tc) and piezoelectric properties, nominal Pb(Mg1/3Nb2/3)O3 (PMN) is introduced into 2mol% Sm-doped 0.36PNN-0.28PZ-0.36PT to form a (0.36 − x)PNN-xPMN-0.28PZ-0.36PT:0.02Sm (x = 0–0.24) quaternary solid solution. The phase, microstructure, domain structure, and electrical properties of the solid solution ceramics were investigated systematically. All the samples exhibit a single phase perovskite structure and are situated around the rhombohedral-tetragonal morphotropic phase boundary. With increasing x, the Tc increases gradually, while the piezoelectric coefficient d33 increases initially and decreases subsequently, reaching a peak value of 725 pC N−1 at around x = 0.15. In particular, this optimal composition illustrates high performance with Tc = 176 °C, planar electromechanical coupling factor kp = 0.63, remanent polarization Pr = 30 μC cm−2, and coercive field Ec = 8.9 kV cm−1. This study illustrates the viability of incorporating PMN into PNN-PZ-PT to optimize the comprehensive electrical properties, potentially offering a valuable guide for developing high performance relaxor-PT materials.
Specifically, the ternary solid solutions of Pb(Ni1/3Nb2/3)O3-PbZrO3-PbTiO3 (PNN-PZ-PT) and Pb(Mg1/3Nb2/3)O3-PbZrO3-PbTiO3 (PMN-PZ-PT) are two representative examples of relaxor-PT systems and have demonstrated unique research value. For the PNN-PZ-PT ternary system, high piezoelectric properties with d33–1200 pC N−1 have been reported by carefully controlling the composition and rare earth (RE) doping; however, the PNN-PZ-PT system possesses shortcomings of low Tc down to 105 °C. This means that in spite of its high d33, the low Tc constrains the thermal stability, and thus enables wide practical applications.7–11 In contrast, the PMN-PZ-PT ternary system maintains relatively stable electromechanical output across a broad temperature range due to its high Tc; however, the PMN-PZ-PT system shows low d33 as compared with its PNN-PZ-PT counterpart.12–16 In recent years, introducing an additional component to construct multi-component solid solutions has become a key strategy for enhancing the piezoelectric performance of relaxor-PT systems; therefore, it is possible to combine the merits of PNN-PZ-PT and PMN-PZ-PT by forming a PNN-PMN-PZ-PT quaternary solid solution, aiming at further optimized or balanced electrical properties and thermal stability. It should be noted that PNN-PZ-PT ternary systems have better general properties, such as higher d33, Tc and electromechanical coupling factor kp than PNN-PT binary systems at the morphotropic phase boundary compositions.9,12 Therefore, the ternary systems of PNN-PZ-PT are chosen as the end member to construct a quaternary system of PNN-PMN-PZ-PT.
The question is how to construct an appropriate PNN-PMN-PZ-PT quaternary solid solution system. It is well-established that composition engineering near the morphotropic phase boundary (MPB) constitutes an efficient strategy for achieving superior ferroelectric and piezoelectric performance, owing to the coexistence of multiple phases enabling enhanced domain wall mobility.1,19,20 As for the PNN-PZ-PT ternary solid solution system, a rhombohedral-tetragonal MPB occurs near 0.36PT-0.28PZ-0.36PT.9,21 Besides, doping with rare earth elements like La3+ and Sm3+, which replace Pb2+ at the perovskite A-site, has been demonstrated to enhance piezoelectricity and suppress dielectric loss by facilitating domain wall motion.11,12,22 Based on the above description, to obtain piezoelectric ceramics with optimized or balanced electric performance, we start from a 2mol% Sm-doped 0.36PNN-0.28PZ-0.36PT ternary solid solution, and progressively introduce PMN to construct a (0.36 − x)PNN-xPMN-0.28PZ-0.36PT:0.02Sm (x = 0–0.24) quaternary solid solution. By synthesizing the piezoelectric ceramics, we have systematically investigated the evolution of the phase, microstructure, domain, and electrical properties as a function of composition. The optimal electrical properties are achieved at x = 0.15 with Tc of 176 °C, d33 of 725 pC N−1, electromechanical coupling factor kp of 0.63, remanent polarization Pr of 30 μC cm−2, and coercive field Ec of 8.9 kV cm−1.
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Fig. 1 (a) The XRD patterns of the (0.36 − x)PNN-xPMN-0.28PZ-0.36PT:0.02Sm ceramic powders (x = 0–0.24). (b) The corresponding local zoomed-in XRD around 2θ = 45°. |
Fig. 2 displays the typical SEM microstructural micrographs of all ceramics after polishing and thermal etching, and the insets illustrate the corresponding grain size distributions. As can be observed from the figures, all of the ceramics possess a dense microstructure without cracks or voids. The average grain size (AGS) of each ceramic, which was calculated by counting more than 100 grains, decreases monotonously from 2.80 μm for x = 0 to 1.40 μm for x = 0.24 with the increase in x value. This phenomenon may be attributed to the inhibition of grain boundary migration during sintering by the introduction of PMN content.24 Moreover, such a reduction in grain size will affect the macroscopic properties, as will be discussed below.
In order to better understand the impact of introducing the PMN component on the domain structure of the (0.36 − x)PNN-xPMN-0.28PZ-0.36PT:0.02Sm system, the typical PFM height, in-plane amplitude, and in-plane phase images within an area of 10 × 10 μm2 of the x = 0 and x = 0.15 piezoelectric ceramics were comparatively investigated and are illustrated in Fig. 3. Both ceramics exhibit the emergence of large striped domains and irregular labyrinth-shaped domains, corresponding to tetragonal and rhombohedral phase structures, respectively.8,25 This observation confirms that the samples are located near the MPB where the rhombohedral and tetragonal phases coexist, which actually aligns with the XRD patterns mentioned above. Additionally, it is seen that with the introduction of the PMN component, the domain size significantly decreases, correlating with the reduced grain size discussed above.26,27 A smaller domain, which is usually accompanied by lower energy barriers, means a higher density of the domain wall and suggests a flattening of the Gibbs free energy profile.28 Consequently, it is reasonable to expect that the piezoelectric performance of the x = 0.15 ceramics will show an enhancement compared with the x = 0 ceramics, which is the case, as will be shown in the following.
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Fig. 3 The typical PFM height, in-plane amplitude, and in-plane phase images of the (0.36 − x)PNN-xPMN-0.28PZ-0.36PT:0.02Sm ceramics. (a–c) x = 0, (d–f) x = 0.15. |
Fig. 4 displays the temperature-dependent dielectric constant εr and dielectric loss tanδ of the (0.36 − x)PNN-xPMN-0.28PZ-0.36PT:0.02Sm ceramics. It is noteworthy that the dielectric loss at 1 kHz and 25 °C initially decreases and then increases, reaching a minimum value of 2.75% at x = 0.15. As observed from Fig. 4, all samples exhibit typical diffuse dielectric peaks. To quantitatively investigate the relaxation behavior of the piezoceramics, the relaxor degree γ is calculated via the modified Curie–Weiss law using the formula
,29 where εm and Tm are the maximum dielectric constant and the corresponding temperature and ε is adopted in the range of T > Tm, and C is the Curie coefficient. Generally, the value of γ is between 1 and 2, and γ = 1 and γ = 2 represents the ideal normal and relaxor ferroelectrics, respectively. Fig. 5 shows the composition-dependent average grain size, Tc determined at 1 kHz, and relaxor degree γ of all the piezoceramics. One can see from Fig. 5 that the Tc of the (0.36 − x)PNN-xPMN-0.28PZ-0.36PT:0.02Sm ceramics exhibits a gradual increasing trend with increasing x value, ascending from 156 °C at x = 0 to 198 °C at x = 0.24. This result indicates the feasibility of achieving excellent thermal stability through PMN component regulation in PNN-PZ-PT systems. Considering that the PNN-PZ-PT ternary system demonstrates lower Tc than the PMN-PZ-PT ternary system,9,20,30 it is reasonable that the gradual substitution of PNN with PMN enhances the PNN-PMN-PZ-PT quaternary system's Curie temperature. Meanwhile, as the x value increases, the average grain size gradually decreases, which is completely opposite to the increasing trend of Curie temperature. Besides, the relaxor degree γ of all samples remains a high value but within a narrow range between 1.8 and 1.9, indicating that all the prepared piezoceramics are relaxor ferroelectrics. Piezoelectric ceramics with high relaxor degree exhibit relatively larger d33 and slender P–E hysteresis loops due to the response of numerous highly responsive polar nanoregions (PNRs). As shown in Fig. 5, the relaxor degree shows a maximum value at x = 0.15 with γ = 1.89, where the maximum piezoelectric coefficient is probably achieved. This result aligns with the piezoelectric properties presented below.
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Fig. 5 The composition-dependent average grain size, Tc and relaxor degree γ of the (0.36 − x)PNN-xPMN-0.28PZ-0.36PT:0.02Sm ceramics. |
The room temperature ferroelectric P–E loops and J–E curves of the (0.36 − x)PNN-xPMN-0.28PZ-0.36PT:0.02Sm piezoelectric ceramics measured at 30 kV cm−1 are plotted in Fig. 6(a)–(i). It can be observed that all of the ceramics exhibit a saturated slender P–E loop and double peak J–E curve, indicating that all the ceramics possess ferroelectric nature. To more intuitively characterize the compositional dependence of ferroelectricity, Fig. 7 shows the maximum polarization Pm, remanent polarization Pr and coercive electric field Ec as a function of x value. One can see that the Ec monotonically increases with rising x value, from 8.1 kV cm−1 at x = 0 to 9.6 kV cm−1 at x = 0.24, which is primarily attributed to the gradual reduction in grain size, as shown in Fig. 2, which leads to higher grain boundary density that hinders domain wall motion.31 Notably, the Ec remains nearly unchanged at x = 0.12 and x = 0.15, consistent with the stable grain size observed in Fig. 2(e and f). In addition, both Pm and Pr initially increase and then decrease with increasing x value, reaching peak values of Pm = 40.8 μC cm−2 and Pr = 31.5 μC cm−2 at x = 0.12. However, at x = 0.21, the Pm and Pr unexpectedly show a slight increase instead of a continuous decrease. This anomaly may be attributed to the fact that the composition begins to deviate from the MPB region and shifts toward a rhombohedral phase structure, as indicated by the XRD shown in Fig. 1. While the rhombohedral phase has eight possible polarization directions, compared to six directions in the tetragonal phase, the deviation from MPB to the rhombohedral phase structure may enhance the density of switchable dipoles, thus leading to an increase in the Pm and Pr values.32
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Fig. 7 The composition-dependent Pr, Pm and Ec of the (0.36 − x)PNN-xPMN-0.28PZ-0.36PT:0.02Sm ceramics. |
Fig. 8 shows the composition-dependent d33 and kp of the (0.36 − x)PNN-xPMN-0.28PZ-0.36PT:0.02Sm ceramics measured at room temperature. With increasing x value, the d33 first increases and then decreases, reaching a peak value of d33 = 725 pC N−1 at x = 0.15. This increase of d33 at first is attributed to the introduction of the PMN into the PNN-PZT system inducing a reduction in grain size and thus an increase in domain wall density. However, when the PMN component further increases, the contribution from grain size reduction reaches a threshold, and at the same time, the phase of the ceramics tends to deviate from the MPB region toward the rhombohedral side at x = 0.21, leading to a decline in piezoelectric performance. These results are consistent with the above phase and ferroelectric property analyses. Additionally, the kp exhibits a gradual rising trend with increasing x, but the kp value is limited in a very narrow range of 0.60–0.64. In general, the optimal piezoelectric property with d33 = 725 pC N−1 and kp = 0.63 is achieved at x = 0.15, better than the previously reported similar composition of 0.36PNN-0.24PZ-0.40PT piezoceramic with d33 = 545 pC N−1 and kp = 0.54.9
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