Issue 70, 2018

Trends in the valence band electronic structures of mixed uranium oxides

Abstract

The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f–O 2p charge transfer excitations can be used to test the validity of theoretical approximations.

Graphical abstract: Trends in the valence band electronic structures of mixed uranium oxides

Supplementary files

Article information

Article type
Communication
Submitted
06 júl 2018
Accepted
07 aug 2018
First published
08 aug 2018

Chem. Commun., 2018,54, 9757-9760

Trends in the valence band electronic structures of mixed uranium oxides

K. O. Kvashnina, P. M. Kowalski, S. M. Butorin, G. Leinders, J. Pakarinen, R. Bès, H. Li and M. Verwerft, Chem. Commun., 2018, 54, 9757 DOI: 10.1039/C8CC05464A

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