Thick-junction perovskite X-ray detectors: processing and optoelectronic considerations

Abstract

Metal halide perovskites have attracted increasing attention due to their strong stopping power, defect tolerance, large mobility lifetime product, tunable bandgap and simple single-crystal growth via low-cost solution processes, particularly for ionizing radiation detection. Over the past few years, semiconductor-type X-ray detectors based on a variety of perovskites have been developed, showing impressive progress in achieving high sensitivity and low detection limits. In this study, based on the requirement of material properties for high-performance X-ray detectors, we review various materials used for direct detection and summarize the processing techniques and optoelectronic considerations of thick-junction perovskite X-ray detectors. This review also highlights the key challenges facing perovskite X-ray detectors towards real applications and discusses the opportunities, which are promising to explore and may require more research activities.