Issue 53, 2017

Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

Abstract

Tip-enhanced Raman scattering (TERS) can be used to image plasmon-enhanced local electric field variations with extremely high spatial resolution under ambient conditions. This is illustrated through TERS images recorded using a silver atomic force microscope tip coated with strategically selected molecular reporters and used to image a sputtered silver film.

Graphical abstract: Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

Supplementary files

Article information

Article type
Communication
Submitted
05 апр 2017
Accepted
28 апр 2017
First published
05 май 2017

Chem. Commun., 2017,53, 7310-7313

Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

A. Bhattarai and P. Z. El-Khoury, Chem. Commun., 2017, 53, 7310 DOI: 10.1039/C7CC02593A

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.

Social activity

Spotlight

Advertisements