XFELs: cutting edge X-ray light for chemical and material sciences
Abstract
A graphical abstract is available for this content
- This article is part of the themed collection: XFELs: cutting edge X-ray light for chemical and material sciences
* Corresponding authors
a
Institute for Catalysis, Hokkaido University, Sapporo 001-0021, Hokkaido, Japan
E-mail:
askr@cat.hokudai.ac.jp
b
PULSE Institute, SLAC National Accelerator Laboratory, Stanford University, Stanford, California, USA
E-mail:
kgaffney@slac.stanford.edu
c
Paul Scherrer Institute, 5232 Villigen-PSI, Switzerland
E-mail:
chris.milne@psi.ch
d
RIKEN SPring-8 Center, Kouto 1-1-1 Sayo, Hyogo 679-5148, Japan
E-mail:
yabashi@spring8.or.jp
A graphical abstract is available for this content
K. Asakura, K. J. Gaffney, C. Milne and M. Yabashi, Phys. Chem. Chem. Phys., 2020, 22, 2612 DOI: 10.1039/C9CP90304F
To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.
If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.
If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.
Read more about how to correctly acknowledge RSC content.
Fetching data from CrossRef.
This may take some time to load.
Loading related content