Niccolò Michieli†
a,
Roberto Pilot†b,
Valentina Russoa,
Carlo Sciana,
Francesco Todescatob,
Raffaella Signorinib,
Stefano Agnolib,
Tiziana Cesca*a,
Renato Boziob and
Giovanni Mattei*a
aPhysics and Astronomy Department, University of Padova, via Marzolo 8, I-35131 Padova, Italy. E-mail: tiziana.cesca@unipd.it; giovanni.mattei@unipd.it
bDepartment of Chemical Sciences and INSTM Research Unit, University of Padova, via Marzolo 1, I-35131 Padova, Italy
First published on 23rd December 2016
Silver nanostructures are widely employed for Surface Enhanced Raman Scattering (SERS) characterizations owing to their excellent properties of field confinement in plasmonic resonances. However, the strong tendency to oxidation at room temperature of these substrates may represent a major limitation to their performances. In the present work, we investigated in detail the effects of oxidation on the SERS response of a peculiar kind of Ag nanostructured substrates, i.e., bi-dimensional ordered arrangements of Ag nanoprisms synthesized by nanosphere lithography. Particularly, wavelength-scanned SERS measurements were performed on Ag nanoprism arrays with a different level of oxidation to determine the SERS enhancement curves as a function of the excitation wavelength around the dipolar plasmonic resonance of the arrays. The experimental results were compared with those obtained by finite elements method simulations. With this approach, we were able to decouple the effects of spectral shift and decrease of the maximum value of the SERS enhancement observed for the different oxidation conditions. The results could be interpreted taking into account the inhomogeneities of the electromagnetic field distribution around the Ag nanostructures, as demonstrated by the simulations.
X-ray photoemission spectroscopy (XPS) data were taken on a VG ESCALAB MKII spectrometer using the Mg anode of a conventional non-monochromatized X-ray source (Kα = 1253.6 eV) and with the analyzer pass energy set to 20 eV. The measurements were taken at room temperature both in normal and grazing emission (55° off from the surface normal). The calibration of the binding energy (BE) scale was determined using the Au 4f XPS peak as reference. Before the measurements the samples have been left degassing in ultra high vacuum conditions overnight.
To describe the effect of oxidation, the model was modified adding a conformal layer (3 nm thick) of a mixture of silver oxide and benzenethiol on the surface of the silver nanoprisms, whose metallic volume was consequently reduced. The refractive index of the layer was set to the average value between the refractive index of silver oxide (n = 2.5)28,29 and that of BT (n = 1.59). The side length of the modeled nanoprisms was also slightly reduced to L = 140 nm and the tip radius increased to 3 nm, to account for the shape modifications due to oxidation.
SERS spectra and enhancement factors (EFSERS) were measured in macro-Raman configuration, with a laser spot size of about 3 mm × 80 μm at the sample position. Such spot size is much larger than the one typically used in micro-Raman configuration (which is of the order of a few microns in diameter). The macro-Raman configuration was chosen in order to illuminate an area on the sample similar to the one involved in the measurement of the absorbance spectra. Doing so, in both experiments a very large number of randomly oriented nanoprisms domains are illuminated and possible polarization effects are averaged out. SERS enhancement factors were estimated following the standard procedure outlined by Le Ru,4 by making use of the following relation:
(1) |
Fig. 2 Absorbance spectra of samples S1-nOx (a), S2-mOx (b) and S3-sOx (c) before (dashed lines) and after (solid lines) functionalization with benzenethiol. |
Fig. 2 shows the absorbance spectra of the differently oxidized NPAs recorded before (dashed lines) and after (solid lines) functionalization with benzenethiol. Panels (a), (b) and (c) refer to samples S1-nOx, S2-mOx and S3-sOx, respectively. The spectral position of the absorbance maxima measured before and after functionalization, and the corresponding wavelength shifts (ΔλSPR), are summarized in Table 1. Concerning the samples not yet functionalized (dashed curves), the data show a blue-shift of about 55 nm of the absorbance peak of sample S3-sOx (strongly oxidized by thermal treatment in air) with respect to samples S1-nOx and S2-mOx. This behavior can be understood taking into account that counteracting effects may occur in this sample. From one side the formation of an oxide layer on the surface of the nanoprisms is expected to red-shift the surface plasmon resonance due to the increase of the dielectric function, but on the other hand the reduced volume of metallic silver (due to surface oxidation) together with the reshaping of the nanoprisms, and in turn the diminished interaction between the nanoprisms, produce a blue-shift of the SPR peak. The latter effects resulted to be the dominant ones in this sample.
Samples | Absorbance | ws-SERS | |||||
---|---|---|---|---|---|---|---|
Before λSPRmax (nm) | After λSPRmax (nm) | ΔλSPR (nm) | EFSERS × 106 | λSERSmax (nm) | ΔλSERS (nm) | EFSERS (@700 nm) × 106 | |
S1-nOx | 686 | 723 | +37 | 4.5 ± 0.9 | 702 | −21 | 4.5 ± 0.9 |
S2-mOx | 683 | 748 | +65 | 1.8 ± 0.2 | 723 | −25 | 1.6 ± 0.2 |
S3-sOx | 629 | 690 | +61 | 2.1 ± 0.2 | 677 | −13 | 2.0 ± 0.2 |
After functionalization with benzenethiol all the samples showed red-shifted absorbance spectra (solid curves), and such an effect was more pronounced (by about a factor of 2) on the oxidized samples with respect to the not-oxidized one. These data indicate that benzenethiol effectively binds to the oxidized surface as it does to the metal surface. This finding is confirmed also in several studies in the literature. As an example, in ref. 31 Himmelhaus and co-workers investigated by X-ray Photoelectron Spectroscopy (XPS) the interaction of aliphatic thiols in ethanol solution with polycrystalline silver substrates possessing a native layer of oxide. The authors demonstrated that the aliphatic thiols can reduce the silver oxide leading to the formation of chemisorbed alkanethiolate. By studying the adsorbed amount as a function of the oxygen coverage on the surface by varying the exposure time of fresh silver substrates to air prior to functionalization, they concluded that the higher is the amount of oxygen initially present, the higher is the adsorbed amount of thiol. Furthermore, in ref. 32 and 33 Laibinis and co-authors proved that the immersion of a silver film with a thin layer of oxide in an alkylthiol solution leads to the almost complete displacement/reduction of oxygen and the formation of a self-assembled monolayer.
Fig. 3a shows a comparison between the Raman spectrum of liquid benzenethiol (red line) and of sample S1-nOx functionalized with BT (blue line). The spectra were recorded with laser excitation at λL = 710 nm, under the same experimental conditions. The laser power on the sample was 5 mW, the integration time 10 s and each spectrum was the average of 10 acquisitions. In order to calculate the SERS enhancement factor (EFSERS), we referred to the Δω = 999 cm−1 band. In Fig. 3b–d the ws-SERS data for the three differently oxidized samples, S1-nOx, S2-mOx and S3-sOx, are reported together with the corresponding experimental absorbance spectra: the gray dots are the experimental EFSERS values and the orange line is the Lorentzian fit to the EFSERS data. The wavelengths at which the maximum EFSERS is measured (λSERSmax) and the corresponding value for the three samples are reported in Table 1. To allow for a comparison of the SERS response of the samples at the same wavelength, in the last column of Table 1 we have also reported, for the three samples, the values of EFSERS measured at 700 nm, i.e., at the wavelength at which the SERS enhancement of the not-oxidized sample is maximum. ΔλSERS indicates the spectral difference between the maximum in the EFSERS profiles and the absorbance peak of the functionalized samples. The data show a blue-shift of the EFSERS profile with respect to the absorbance spectrum for all the three investigated samples. This behavior can be understood considering that the SERS enhancement factor is proportional to the product E2(λL)E2(λR), where λR = (1/λL − Δω)−1 is the Raman shifted emission wavelength, and not merely to E4(λL). Since λR > λL, the EFSERS peak occurs at a shorter wavelength if plotted against λL. This effect is well known and has been demonstrated experimentally in ref. 8 and 11.
Concerning the role of oxidization, first of all by comparing the results of sample S2-mOx (Fig. 3c) with those of sample S1-nOx (Fig. 3b), it emerges that the atmospheric oxidation gives rise to a spectral shift of the EFSERS profile with respect to the absorbance spectrum as in the not-oxidized sample (S1-nOx), but the maximum SERS enhancement factor results reduced by a factor of 2.5. Sample S3-sOx instead, with respect to S1-nOx, exhibits a smaller blue-shift of the EFSERS profile, but a reduction of the maximum enhancement factor similar to sample S2-mOx (by a factor of 2.5). To understand the observed difference in the maximum EFSERS between fresh and oxidized samples, the effect of the presence of an oxide layer on the following factors has to be taken into account: (i) in calculating the experimental EFSERS we assumed the same surface density for BT in all the samples, but the affinity of benzenethiol to metal and oxide in principle could be different; (ii) the strength of the chemical enhancement, as defined in ref. 1, may be different when the molecule is bound to the metal rather than to the oxide layer; (iii) the electromagnetic enhancement decreases steeply with the distance from the plasmonic material, therefore it can be affected by the possible presence of a dielectric layer acting as a spacer; (iv) the oxidation process slightly modifies the morphology of the substrates, as shown in Fig. 1c–e, and thus it can alter distribution and intensity of the electric field. Since these factors are not all in the direction of inducing a decrease of the SERS signal, their overall effect may cause no major drops in the enhancement factor but a more limited reduction, as experimentally observed. Therefore, in order to completely unveil the role of the different parameters on the SERS response, a deep analysis of the electrodynamic effects was performed by finite elements method (FEM) simulations.
FEM simulations were used to compute the local-field distributions and the NPA far-field properties. It is worth noting that for the simulated geometries, whose parameters were chosen on the basis of the FE-SEM and AFM characterizations, the spectral position of the maximum of the calculated absorbance is coincident with that of the simulated absorption. This confirms that we can use the experimentally measured absorbance maximum as representative of the experimental absorption maximum of the samples. The SERS enhancement factor (EFSERS) was calculated by using the local-field distribution inside the volume of the analyte layer (BT) both for excitation and Raman shifted emission frequencies. A sketch of the local-field distribution at the wavelength of the maximum of the simulated absorbance spectrum of sample S1-nOx is given in Fig. 4. The figure shows that intense hot-spots of the electromagnetic field are formed at the nanoprisms tips, further enhanced by the near-field coupling among the nanotriangles, with an enhancement of the modulus of the local electric field (normalized to the incident field, E0) up to a factor 1000.
Inside the active layer the local SERS enhancement factor has been computed as a function of the local electric field E(r,ω):
(2) |
(3) |
The computed SERS enhancement factor is thus dependent on two parameters: the incident light frequency, ωL, and the Raman shift, Δω. The simulations were carried out considering the experimentally probed Raman shift of benzenethiol, Δω = 999 cm−1. In Fig. 5a the EFSERS spectrum of sample S1-nOx (not-oxidized), computed using eqn (3), is reported (red curve, left-hand scale) and compared to its simulated absorbance spectrum (orange curve, right-hand scale). Concerning the EFSERS profile, as previously discussed the maximum of the SERS enhancement curve is expected to be shifted towards higher energies (i.e., shorter wavelengths) with respect to the absorbance peak and this is indeed confirmed by the simulations. Furthermore, by comparing the results of the simulations to the experimental ones of sample S1-nOx (Fig. 3b), the first thing to note is the very good agreement between the measured and calculated values of the maximum EFSERS, which is close to 5 × 106 in both cases. The spectral position of the simulated EFSERS peak results instead slightly blue-shifted with respect to the experimental one. This behavior can be explained taking into account the great inhomogeneity of the electric-field distribution within the NPA surface (see Fig. 4b). In nanostructures like the nanoprisms investigated in the present work, in which there are small regions with high curvature (i.e., the nanoprism tips), the maximum local electric-field at the tips in general does not occur at the same wavelength as in the whole nanoprism. Particularly, in the present case, close to the tips the maximum field enhancement takes place at shorter wavelengths. Moreover, from one hand the high-curvature regions produce the hottest spots in the electric-field but, on the other hand, the small extent of these regions reduces their integrated contribution in the average of the field over the total volume of the nanoprism. Absorbance is a linear property and it is sensitive to the average electric-field in the NPAs rather than the hottest spots, whereas the hot-spots dominate in the average of higher powers of the field-enhancement, as it is for the SERS enhancement. As a consequence, the highest EFSERS occurs where the convolution of the incident and the Raman shifted curves of the square of the enhancement factor (where the hot-spot regions have more weight), averaged over the volume of the BT layer (〈(E/E0)2〉), is maximum rather than where the convolution of the absorbance curves is maximum. Since, as shown in Fig. 5a (blue curve), the simulated spectrum of 〈(E/E0)2〉 is maximum at shorter wavelengths with respect to the absorbance one, this accounts for the larger blueshift of the EFSERS maximum resulting from the simulations. As regards the experimental results, instead, it is important to point out that the possible presence of defects in the samples may hinder the spectral decoupling of the maximum squared electric-field enhancement from the maximum absorbance and this could be the reason why the experimental EFSERS peak (702 nm) was found to be red-shifted with respect to the simulated one (688 nm) and close to the middle of the absorbance peaks evaluated at λL and λR (700 nm). Moreover, the presence of defects in the experimental sample could account also for the larger width of the experimental EFSERS curve with respect to the simulated one.
FEM simulations were carried out also to describe the effect of oxidation. In this case, the model has been modified assuming a conformal, 3 nm thick, layer representing a mixture of silver oxide and BT, as foreseen in an interaction scheme where the oxide is permeable to the binding of BT with metallic silver. The reduced sharpness of the nanoprisms observed in the oxidized sample was modeled by increasing the tip curvature radius to about 3 nm and reducing the prisms side length to L = 140 nm. The thickness of the oxide/BT layer was fixed at the value that reproduced in the simulations the spectral shift of the absorbance spectrum observed as a consequence of the oxidation process. In the attempt to provide a direct, experimental determination of the thickness of the oxide layer, XPS measurements were performed both on nanostructured samples as those investigated here (synthesized on Si substrates to minimize surface charging), and on continuous Ag films (as-deposited and strongly oxidized with the same procedure used for the nanoprism arrays, and also oxidized and functionalized with benzenethiols) to be used as a benchmark. Unfortunately, our attempts were stalled by some inherent technical limitations. As a matter of fact, the chemical shift of the Ag 3d photoemission line for Ag and Ag2O is very small, of about +0.3 to 0.4 eV,34,35 and therefore it is very hard to detect by using standard sources (i.e. without synchrotron radiation). The analysis of the O 1s photoemission line is equally complex: up to five types of different oxygen atoms can be observed on oxidized Ag surfaces (i.e. strongly and weakly bound, oxygen diluted in the bulk and related to different sources of intrinsic contamination) even on single crystals in ultra-high vacuum studies. All these difficulties are further enhanced for the nanostructured samples. Therefore, in the following we restricted the XPS analysis to the ideal, planar films. The body of our photoemission measurements indicate the presence of Ag in metal form (as determined by the position of the Ag 3d 5/2 maximum and Auger parameter) and no distinct oxide component that could be associated with Ag2O could be detected (see Fig. 6a). Similarly, from the analysis of the O 1s photoemission line it was not possible to clearly identify the presence of an oxide component (Fig. 6b). Moreover, comparative measurements did not outline any difference between grazing and normal emission acquisitions and between different samples (that is, the as-deposited sample vs. the sample oxidized at 70 °C in air). On the other hand, by means of photoemission we were able to easily verify the presence of the thiol on the oxidized and thiolated surface revealed by the S 2p peak whose position at 162.0 eV is typical of surface thiolates (Ag–S–C, not reported). Therefore, the demonstrated inherent difficulties to detect Ag–O species in the samples by XPS characterization (which in principle is expected to be the elective technique for assessing Ag–O bonding) have prevented us to get a reliable measurement of the thickness of the oxide layers by angle resolved photoemission measurements and to decouple the role of shape changes from that of thermal oxidation. For this reason, our approach was to follow the oxidation process by FEM simulations of the change in the optical properties of the samples due to both morphological and dielectric modifications of the nanoprisms.
Fig. 6 Ag 3d spectra (a) and O 1s spectra (b) of silver films, both as-deposited and intentionally oxidized at 70 °C, 30 min in air. |
In the following we restricted the discussion to the comparison between experimental results and FEM simulations of the two “extreme” samples, S1-nOx (not-oxidized) and S3-sOx (strongly oxidized), which represent the most different configurations in terms of SERS response. As reported in Table 1, the effect of oxidation of the NPAs on the SERS response is two-fold: (i) the maximum experimental EFSERS measured in the oxidized samples is reduced by a factor ∼2.5 with respect to the fresh (not-oxidized) sample; (ii) in sample S3-sOx (strongly oxidized) the spectral position of the maximum experimental EFSERS is blue-shifted with respect to the corresponding absorbance peak (ΔλSERS) to a lesser extent than for samples S1-nOx and S2-mOx (13 nm for S3-sOx vs. 21 nm for S1-nOx). Both these features were recovered by the simulations, as shown in Fig. 5b. The reduction in the EFSERS is the result of two effects. From one side, the presence of a dielectric layer with higher refractive index (due to the presence of the oxide) helps in confining the field close to the nanostructures surface giving rise to an increase of the local electric field due to dielectric coupling. On the other side, the reduced sharpness of the metallic part of the nanostructure reduces the field enhancement in the hot-spot regions, thus taking to a decrease of the average local electric field, and to its more homogeneous distribution. From the simulations, a decrease of the EFSERS of a factor ∼2.7 is obtained which is in very good agreement with the factor ∼2.5 observed experimentally for the oxidized samples. The origin of the reduced blue-shift in the strongly oxidized sample (S3-sOx) is more subtle. As already pointed out for the not-oxidized sample S1-nOx, the blue-shift is caused by two factors, i.e., (i) the convolution of the resonances evaluated at the incident laser wavelength (λL) and at the Raman-shifted one (λR) and (ii) the enhanced contribution of the hot-spot regions due to the strong inhomogeneity in the field distribution. In the oxidized sample, the convolution effect is still present and works in the same way. Concerning the second factor, on the other hand, the simulations proved that the reduced sharpness and the presence of the oxide layer give rise to a more homogeneous field distribution. An estimate of the inhomogeneity of the field can be calculated using the normalized variance of the electric field inside the oxide/BT volume (angle brackets indicate the average over the oxide/BT layer volume):
(4) |
Computing the variance at the wavelength where the absorbance is maximum for each sample, we obtained: σfresh2(λmax) = 0.87 > σoxidized2(λmax) = 0.76, with a relative difference of about 15%. As a consequence of this, the EFSERS curve is blue-shifted with respect to the absorbance spectrum to a lesser extent in the strongly oxidized sample than in the not-oxidized one. Particularly, both the simulations and the experiment proved a reduction of the blue-shift in the oxidized sample of about half the blue-shift of the not-oxidized one: from the simulations (experiment) we obtained a blue-shift of −19 nm (−13 nm) for the oxidized sample (S3-sOx), with respect to −37 nm (−21 nm) for the not-oxidized one (S1-nOx). Moreover, the width of the EFSERS curve peak results slightly reduced in the simulations when the oxide is present. This is a further effect of the increased homogeneity in the local electric field distribution in this condition. Nonetheless, experimentally this behavior is not observed. Indeed, the width of the experimental EFSERS profile results larger for the oxidized sample than for the not-oxidized one (Fig. 3d and b). This could be explained considering two aspects: on one hand, the presence of defects in the experimental sample gives rise to a wider absorbance peak than the simulated one, which causes an enlargement of the EFSERS profile, as already noted for the not-oxidized sample; besides this, a possible not-uniform distribution of benzenethiol over the surface of the nanoprisms (which could also vary among the nanoprisms) has to be taken into account. Both these effects produce an inhomogeneous broadening of the EFSERS profile in the experimental sample, and thus an enlargement of the peak, which is absent in the simulated (perfect) case.
In summary, the main findings are:
(i) A spectral blue-shift of the SERS enhancement profiles with respect to the corresponding absorbance spectra is observed both experimentally and from FEM simulations.
(ii) The extent of the blue-shift is related to the oxidation process and resulted smaller in the strongly oxidized sample than in the not-oxidized one.
(iii) The simulations proved that the reduced nanoprism tip sharpness and the presence of the oxide layer give rise to a more homogeneous field distribution around each nanoprism, which in turn provides an explanation for the smaller blue-shift observed in the oxidized sample.
(iv) Concerning the absolute values of the SERS enhancement, a decrease of about a factor of 2.5 of the maximum SERS enhancement factor is measured for the oxidized samples, which is consistently proved by FEM simulations.
In conclusion, from a practical standpoint we can state that the tendency of silver towards oxidation does not preclude the use of Ag NPAs as platforms for SERS sensing with thiol-terminated molecules. Benzenethiol was found to effectively bind to the oxidized NPA surface as it does to the metallic NPAs: the EFSERS reduction demonstrated in the oxidized samples amounts only to a factor of 2.5 and therefore does not alter significantly the NPA performances required for applications.
Footnote |
† These authors contributed equally to this work. |
This journal is © The Royal Society of Chemistry 2017 |