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Probing the nature of charge carriers in one-dimensional conjugated polymers: a review of the theoretical models, experimental trends, and thermoelectric applications

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Multimethod Electrical Characterization of Thin Indium Tin Oxide Films: Structuring and Calibration Sample Development for Scanning Probe Microscopy

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Imaging beyond the surface region: Probing hidden materials via atomic force microscopy

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Sci. Adv., 2023, 9
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Eco‐Friendly Deposition of Catalyst‐Free Graphene on Diverse Substrates

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Quantitative Local Conductivity Imaging of Semiconductors Using Near-Field Optical Microscopy

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Scanning Microwave Microscopy for Biological Applications: Introducing the State of the Art and Inverted SMM

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IEEE Microwave, 2020, 21, 52
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Low power nanoscale S-FED based single ended sense amplifier applied in integrate and fire neuron circuit

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Nanoscale Probing of Electrical Memory Effects in van der Waals Layered PdSe2

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Nondestructive imaging of atomically thin nanostructures buried in silicon

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Sci. Adv., 2017, 3
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Calibrated Nanoscale Dopant Profiling and Capacitance of a High-Voltage Lateral MOS Transistor at 20 GHz Using Scanning Microwave Microscopy

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IEEE Trans. Nanotechnology, 2017, 16, 245
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Coaxial tips for a scanning microwave microscope and its calibration with dielectric references

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Real-Time Removal of Topographic Artifacts in Scanning Microwave Microscopy

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Broadband microwave absorption based on the configuration resonance of wires

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Calibration method for complex permittivity measurements using s-SNOM combining multiple probe tapping harmonics

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Fabrication of Ultra-Sharp Tips by Dynamic Chemical Etching Process for Scanning Near-Field Microwave Microscopy

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Optimization of Near-Field Image Capture With Millimeter-Wave Bow-Tie Probes

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A dynamic-difference approach to scan probe microwave reflectivity mapping of the nanoscale electronic properties of single-walled carbon nanotubes

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On-Site/In Situ Continuous Detecting ppb-Level Metal Ions in Drinking Water Using Block Loop-Gap Resonators and Machine Learning

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Resolving trapping effects by scanning microwave microscopy

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Nanoelectronic Characterization: Using Near-Field Microwave Microscopy for Nanotechnological Research

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Microwave Microscopy and Its Applications

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A numerical analysis of the short open load calibration robustness for capacitance measurements in scanning microwave microscopy

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Multi-Frequency Resonance Behaviour of a Si Fractal NEMS Resonator

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Measuring low doping level and short carrier lifetime in indium arsenide with a contactless terahertz technique at room temperature

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Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy using Scanning Microwave Microscopy

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Exploring the Capabilities of Scanning Microwave Microscopy to Characterize Semiconducting Polymers

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Rate-Dependent Evolution of Microstructure and Stress in Silicon Films Deposited by Electron Beam Evaporation

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Local characterization of mobile charge carriers by two electrical AFM modes: multi-harmonic EFM versus sMIM

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Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale

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Application of atomic force microscopy technology in doping characterization of semiconductor materials and devices

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Dominant factors and their action mechanisms on material removal rate in electrochemical mechanical polishing of 4H-SiC (0001) surface

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Towards quantification of doping in gallium arsenide nanostructures by low‐energy scanning electron microscopy and conductive atomic force microscopy

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Terahertz nanoscopy: Advances, challenges, and the road ahead

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An Advanced Impedance Calibration Method for Nanoscale Microwave Imaging at Broad Frequency Range

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Scanning microwave microscopy technique for nanoscale characterization of magnetic materials

C.H. Joseph, G.M. Sardi, S.S. Tuca, G. Gramse, A. Lucibello, E. Proietti, F. Kienberger and R. Marcelli

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Multiresonance Measurement Method for Microwave Microscopy

Roman Joffe, Reuven Shavit and Eugene Kamenetskii

IEEE Trans. Instrum. Meas., 2017, 66, 2174
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Interferometer Scanning Microwave Microscopy: Performance Evaluation

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IEEE Trans. Nanotechnology, 2017, 16, 991
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Solution-Processed 2D PbS Nanoplates with Residual Cu2S Exhibiting Low Resistivity and High Infrared Responsivity

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Chem. Mater., 2016, 28, 9132
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White Paper: Nanoscale impedance and permittivity properties at microwave frequencies using SMM

Ferry Kienberger and Georg Gramse

MRS Bull., 2017, 42, 180
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Electrostatic tip effects in scanning probe microscopy of nanostructures

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Nanotechnology, 2021, 32, 195710
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Advanced atomic force microscopies and their applications in two-dimensional materials: a review

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Mater. Futures, 2022, 1, 032302
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Determining the resolution of scanning microwave impedance microscopy using atomic-precision buried donor structures

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Applied Surface Science, 2017, 423, 1097
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Local electrical characterization of two-dimensional materials with functional atomic force microscopy

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Front. Phys., 2019, 14
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Investigating modification on electronic properties of bilayer MoS2 field-effect transistor by low-temperature oxygen plasma treatment

Jiangtao Wang, Jinyao Dong, Yao Xue, Xiaohong Yan and Quan Wang

Applied Surface Science, 2019, 495, 143486
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Inverted scanning microwave microscope for in vitro imaging and characterization of biological cells

Marco Farina, Xin Jin, Gianluca Fabi, Eleonora Pavoni, Andrea di Donato, Davide Mencarelli, Antonio Morini, Francesco Piacenza, Richard Al Hadi, Yan Zhao, Yaqing Ning, Tiziana Pietrangelo, Xuanhong Cheng and James C. M. Hwang

Applied Physics Letters, 2019, 114
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